DAILY SNAP - IRE DEVELOPS AUTOMATION FOR INSPECTING SEMICONDUCTORS

• Document Type: CREST
• Collection: STARGATE
• Document Number (FOIA) /ESDN (CREST): CIA-RDP96-00792R000500490003-7
• Release Decision: RIFPUB
• Original Classification: K
• Document Page Count: 1
• Document Creation Date: November 4, 2016
• Document Release Date: September 1, 2000
• Sequence Number: 3
• Publication Date: January 13, 1987
• Content Type: MAGAZINE

/yl -/,AD
ase 2001/03/07 : CIA-RDP96-00792R000500490003-7
Daili
Sovie r s Abstracts Publication
FOREIGN TECHNOLOGY DIVISION
Author: Savel'yev, A.
Title; DF.VF.LQpS _AZTTn'aATION FOR
NI CTING,BEMjCOND17C2 RS i
~Y.IMIriR
Primary source: Leninskoye znamya,
December 17, 1986, No. 286 (20306),
p. 1, col. 2
Extract: The precision and reli-
ability of elements of electronic
devices and systems play a decisive
role in determining their perform-
ance. Processes that take place in
semiconductors, however, are such
that making and inspecting semicon-
ductors require very sharp electron-
ic 'eyes' and a very shrewd elec-
tronic 'brain.'
A group of scien:ists and design-
ers of the US R Academy of Sciences'
Institute of gineering and
Ectron* cfi_.....(IRE) tinder the direc-
tion of academician
and Doctor of Physical-Mathematical
Sciences A. G. Zhdan, head of a
laboratory, has developed _
}'stemr.r; lete..;p-rocess.-_
i ,,g_ of experiment 1lata from s r.Q.,agg
of eroic,s.. (de-
fects) on 'semiconductor--dielec-
tric' boundaries (ASPOED), and also
an automated complex for inspecting
and diagnosing electronic materials
and products using e.ectrophysical
methods.
What benefits do ..hese develop-
ments offer?
THE ASPOED system seemingly
'filters out' useful data from the
mass of information from experi-
ments, and with it the accuracy of
(continued next column)
Approved For Release 2001/03/07
determining cha,acteristics of de-
fects increases by more than 10
times. This greztly increases the
understanding of the nature of de-
fects, and as a practical benefit
it makes it possible to develop new
instruments for more reliable con-
trol of processes for production of
microelec-tronic devices.
The automated complex will help
to determine and control character-
istics of semiconductor materials,-
devices andmicrostructures using
various electrophysical methods
which traditionally are used in
semiconductor physics research.
This complex is needed today by
many research. laboratories, and
especially by industry laboratories.
It will help to improve substantially
the control of processes and to
identify causes of defects. The com-
plex has been-made ready for series
production, and the rest is up to
interested clients.
Author: Mokhorov, E., correspondent
(Kaluga)
Title: AUTO ELECTRONICS ORGANIZATIONS
SEEKING WAYS THROUGH BUREAUCRACY
Primary source: Sotsialisticheskaya
industriya, December 30, 1986, No.
299 (5290), p. 1, cols. 1-3
Extract: In the near future, micro-
processor-based devices which exist
now only in the form of a single
prototype will control the ignition
systems of passenger cars and trucks
: CIA-l4 DPI% &i192K6ob5bOM?6003-7