SRI DATA ON CHINESE PHOTODIODE EXPERIMENT

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Collection: 
Document Number (FOIA) /ESDN (CREST): 
CIA-RDP96-00792R000300280001-4
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RIPPUB
Original Classification: 
K
Document Page Count: 
22
Document Creation Date: 
November 4, 2016
Document Release Date: 
April 6, 2000
Sequence Number: 
1
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Publication Date: 
November 22, 1981
Content Type: 
HW
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PDF icon CIA-RDP96-00792R000300280001-4.pdf1.3 MB
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Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 agoT DicrcA .04) CANuesp A v70 d 0 OP leee"Plir Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 SG1E Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 TAB t-c Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 47N? tWb Tbe Qtran6e Ihenomuna of raranormal lunotions of ? tut linman ,Dooy Affecting on a rhotosensitive liode by Zheng Tian Man Lin,Luo otin,olu Jun,Chen auo Choi (Yunnan University) Li Hong Yi (luban University) Ahltria.1 The etrange phenomena produced on u photoseneitive diode held in tne palm of a child with paromormal function ore report in this poper.The Characteristic-Curve Tracer indicates thot by concentrot- ing their mind upon their palms,or "working",the children with parouormal function can emit unknown rodiation,which can induce ob- normal cnange in the photosensitive diode and alter the charocter- istic curve thereof.Tne chief feotures of toch cnanget are as follows: 1.A negative emf ie produced even when the photosensitive diode ie covered with a piece of black poper. 2.The back resistance is conspicuously reduced and the leokoge current increaeed surprisingly. .0.The cloted loop of the reverse choracterietic curve which ie due to tri t defects of the dipole is subject to phase chonget during tut "working". '4.inere is nu apparent difference in the above mentioned phenomena during the course of the experiment whetter 4 piece of olack paper is ploceo between the diode and the palm or not. 5.The charocteristic curve is restored to its normol state when the child stop r hie or her "working". After mogrifying the poronormal change with o.rudiometer omplifier, the output potential variations are displayed with an X-Y record. It is found thut the unknown radiation ie closeby relpted to the paranormal function.The following importont features ore onserved. 1.The children with paranorlal function produce nolotive readings on tne rodioneter in comarison witn the positive reodings obtained wnen light rodiotion is received. 2.Tbeoe ore diffetrebces of 2-u order of magnitude in the potentiol chonges producea between normol clikgren and those tilted withlporo- normal functions.ThOlotter are 10=11Y1whereor the former are 10-1C!' .;o.The results obtoined when the &lifted children ore "working" nnd when they are not "working" with the diode are conspicuously differ-. ent.Tne values are zero when tuey are not "wol.King". 4.11/nel, the gifted cnildren were in the course of recorgnizing hiocen letterspor practising telepotby or knotne curves on tne recorder are clusely rulateu to tnose ditprayeo in toe course of "working" with the diode,rising from the beginning of "working" and oropping to tele zero level at tne trICI Ur, "working". 5.1inen the gifted children were matching the recoroing ppparatus, the rerulting reoaings were nigher.It stems thot tnere ol;pet?red L;r1 action of conscious fecawuct. Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 osTnei.e are great oifferencer in tne graptic recordiuo tor oilierent individiair among tne gifteo chiioren. 7.1n comparing mearurement on the A-Y recoruer for mind CenceullatiOn upou lute paLme oetween praCtitionere of ChineEe martiLA arta Lino tut baitec vhildrenstne children ahoweu eigher meaeurcaeu?a ou weruze,although u few martiul urta prac- titioners aiso scoreo high. lue aoore rtslte indicate taut tue photoseuertive alone is L Suitt:Luta oevice tor mez.,suread oujectively toe iofor- mtion eoitl?u 4,4 cLildron with parunormal futivtone. pauiished in *bai.ure Journal" 4.6.(1661) Approved For Release 2000/08/11: CIA7RDP96-00792R000300280001-4 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 TAB r t OL\ y?-- Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 - 1".? 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PfiP-IAWIAt?ftt 444AVAER-itinVRIM. ft1311fiPtilWril, fri-RA**AFME1 ftegPMIIVitilifi-TA'SYCMiti?L. iMP..4/1173935M*fr3ilit, *Mitts kEIPtiZA 113 "Alc*A*444POtivfnia, tiNtAIP.;f?), 4 (1981)348 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 TAB Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 THE STRANGE PHENOMENON OF PARANORMAL FUNCTIONS OF THE HUMAN BODY EFFECTING ON A PHOTOSENSITIVE DIODE: ANALYSIS AND RECOMMENDATIONS FOR FURTHER STUDY Experimental Procedure Based upon the abstract provided, original figure captions and the following experimental procedures and apparatus appear to have been utilized for the first set of experiments: ? A photodiode with a sensitivity of 10-7 watts cm-2 in a bandwidth of 190-1100 nm was used. From Sze (Figure 24 on attachments) we expect this to be a silicon device. ? The photodiode was contained in a "well" of some sort surrounded by a "protection ring" and covered with black paper. At present the thermal and electrical properties of this encapsulation are unknown. ? A characteristic curve tracer (Model JT-1) was used to reverse bias the diode and measure its voltage- current response under various conditions. ? The curve tracer was set up so that the voltage axis was .5 V per dimension and the current .01 mA/div. Diode breakdown (the "knee" of the curve) was -6V with a 1 Kn current limiting resistor. Each subject then held the photodiode assembly in their palm and attempted to influence the device. Successful experiments were marked by change in the I/V characteristic from that typical of a diode to one more like a resistor with some parallel capacitance as seen in Figure 2b. In fabri- cating prototype diodes this type of curve is seen quite often when the "blocking" contact fails or the diode is partially shorted by conductive surface states. Physics of Semiconductor Devices, S. M. Sze. Figure number used in original Chinese text. 1 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 A second set of experiments was carried out with apparently the same type of photodiode: ? The output of the diode has been amplified by a "radiometer" amplifier. It is not clear whether the diode is reverse biased or used as a solar cell with only the carrier diffusion length as an active volume. ? With "normal" children the amplified output was 10-5-10-6 W/cm2. ? With "exceptional" children bursts of signal (noise?) were observed up to 10-2-10-3 W/cm2 over periods of several minutes. Analysis The results of both sets of experiments are open to several explana- tions due to the ambiguous nature of the experimental procedure. ? The change in I/V characteristic could be due to simple heating of the diode. Attachments one and two both show how leakage current varies with temperature. A 10?C rise above ambient could be expected from a hand-held device, resulting in a larger leakage current. In addition, the breakdown knee will sometimes move toward lower voltages as the temperature rises resulting in noise or breakdown bursts. Finally, surface states which are not seen at room temperature may become active at higher temperatures resulting in the hysteresis seen in the "exceptional" I/V characteristics. ? If the diode and its container are not adequately electrically shielded, the effect of holding the assembly in one's hand would be to add components of stray resistance and capacitance to the output signal. This effect would be similar to that shown in Figure 2b. Anyone who has worked with electrometers is familiar with this effect. The usual cure is to use BNC connectors and coaxial cable. ? Finally, the infrared radiation associated with a black body at skin temperature (310K maximum) might cause some of the signals seen in the second set of experiments. In particular, a warmer than room temperature diode could 2 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 be operating in an already high leakage condition whereby extra input (static charge, IR radiation) might initiate carrier avalanche--yielding large noise bursts. Attached are several pages of figures and calculations which demonstrate that the sensitivity of the detector lies clearly in the IR region. Furthermore, application of the Stefan-Boltzmann law demonstrates that 5 x 10-3 W/cm2 may be available from a black body of 10% efficiency. However the peak of the distribution falls at about 9-10 p. At this wavelength neither a silicon or germanium diode is very efficient. This result suggests one of the two preceding mechanisms as a more likely candidate. 3 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 Approved For Release 2000/08/11: CIA-RDP96-00792R0003002890/144 >L6q-biya f-; -C (S779-71.4) \ CA9S-e P ePj fa_ /fri s4ee,ci Di 73 CtS /6""A` Y A Ty BQ9 Vot 4.AuL 1,14,J h ------ e-o" TCS7FAA3 pte 5-447 /lc /o tiv/ieer- 3S. X/09 S-e'fr;-1-/ X/0 Le.,144 5.)-14 itiej- W/ati zi ccid1)_. = /0 Gm 2- 10 ecifi Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 /0 w CV' 111 Aleproyed For Releale 2990/171/11-i_CI4AM6.1079g:R009300p0 U2 0.5 Ser TrtjA." ?As16? Optoelectronic Devices 00 110-Ne RUBY ARGON GaAs He-Ne YAG iN 0.4 0.6 i 0.8 1 1.2 He-Ne i 4 i 1.4 1.6 WAVELENGTH (MICRONS) Fig. 24 f 7Z Effective quantum efficiency (hole-electron pairs/photon) versus wavelength for Ge 73-Srphotodetectors. (After Melchior and Lynch, Ref. 39.) Ipo(w) (a) 7-2 LR Fig. 25 (a) Equivalent circuit and (b) noise equivalent circuit of a photodiode, where R Is the series resistance and C is the junction capacitance. (After DiDomenico and Svelto, Ref. 35.) 4 Photodetectors available power for the photo = ?8 lipD(0))1 It is interesting to compare E For a typical photodiode with a photoconductor with the sat available power from the phot from the photoconductor. The signal-to-noise perforn- equivalent noise circuit shown noise source due to the seriei source. The signal-to-noise ral ? 41 Comparing Eq. (44) with Eq. at high-level detection where SNR is comparable; at low-lev however, the SNR of the phu B. The p-l-n Photodiode depletion-layer photodetector, (the intrinsic layer) can be tai frequency response. A typical Fig. 26(a). Absorption of ligh pairs. Pairs produced in the de will eventually be separated by external circuit as carriers drif Under steady-state conditioz biased depletion layer is given where Jd. is the drift current region and idiff is the diffusior side the depletion layer in the t reverse-biased junction. We E assumptions that the thermal g surface n layer is much thinn, electron generation rate is giv( _ roved For Release 2000/08/11: CIA-RDP96-00792R0003002800-01-4 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 DETECTORS AND DETECTOR SYSTEMS SILICON CHARGED-PARTICLE DETECTORS characteristics. The detector changes include in- creased noise and changes in voltage drop across the load resistor, which require adjustments to the applied bias voltage, which in turn change the electric-field strength. Thus carrier trapping and increased detector noise are degrading to energy resolution. Resolution degradation appears as a broadening of the response for a monoenergetic source. With increasing doses of neutrons, charged particles, or fission frag- ments, the low-energy side of the response peak may begin to show a definite secondary peak. Continued irradiation results in further broadening, until, in ex- treme cases, the multiple peaks may merge com- pletely. Electron bombardment tends to increase leak- age current, resulting in excess detector noise, which broadens response peaks. Some of these damage ef- fects may undergo a degree of annealing, but there is always a significant residual deterioration after a suffi- cient dose has been accumulated. Partially depleted detectors are more susceptible than are fully depleted devices to deterioration from radia- tion damage. Radiation damage for different types of detectors are compared in Table 2, which gives the dose for various particles to significantly deteriorate the detectors. OPERATING TEMPERATURE As a rule of thumb, increasing the operating tempera- ture of a charged-particle detectols.a_iisatelealsags current to incrose b a factor of 3 for eqch 10?Q.rise, fauTtin in a noise width ingLease ptagProirnatelY.lJ 1_5sypriQTTEipper temperature limit is deter- mined by the maximum acceptable noise or by the ultimate breakdown of the detector (usually between 45 and 55?C). The effects of high-temperature break- down are permanent and are not covered by the war- ranty terms. An additional effect is the shift in detector bias caused by the higher leakage current. This leak- age current increases the voltage drop across the se- ries bias resistor, thus lowering the bias voltage across the detector. When high-temperature operation is necessary, a constant sensitive depth is maintained over the entire operating temperature range only if a totally depleted detector is used with sufficient overbias to compensate for the drop across the series bias resistor, which should be as small as possible (usually 1 to 3 nin is adequate). Decreasing the operating temperature of the detector reduces junction noise and leakage current. However, the capacitance of the device is a constant limiting parameter of the system noise. Another limitation to successful operation at low temperatures is the expan- sion coefficient of the detector's component parts. The expansion coefficient is similar for silicon and for lavite, the ring in which the silicon wafer is mounted, but is quite different for the bonding epoxy. Therefore at very low temperatures the epoxy may crack, causing exces- sive noise or loss of contact. The probability of low- temperature damage increases with detector size. For cooled operation, detectors fabricated with cryogenic epoxy may be special ordered from ORTEC. Another effect of decreasing the operating tempera- ture of a silicon detector is an increase of the average energy necessary to create an electron-hole pair, E. Due to a widening of the bandgap of silicon in the temperature range from 300 K to 80 K, e increases. from 3.62 eV to 3.72 eV. A result of this increase is an apparent shift in energy of a measured spectroscopic line. For instance, Fig. 8 shows the apparent peak shift of the 5.477-MeV 241Am alpha particle peak in the 4.2- K to 320-K temperature range measured with silicon charged-particle detectors. SHOCK AND VIBRATION Many ORTEC surface-barrier detectors have been subjected to the shock and vibration tests required for Table 2. Comparison of Radiation Damage In Silicon and Germanium Particle Detectors Type of Detector Radiation Damage (particles/cm2) Electrons Fast Neutrons Protons Alpha Particles Fission Fragments Surface barrier 1013 10'2 1019 109 109 Diffusion junction 10'3 1012 1019 109 109 Si(Li) 1012 10" 109-109 Ge(Li) 109-109 Approved For Release 2000/08/11: CIA-RDP96-00792R000300280001-4 27 COW' 11 I 11 TO Tit MCI a C?,? - Approved-ForRelpase-ki0G/98P14 CIA4RDP96.00-792R00030028000.1 -4- . 1 . 111 111 ???????????? ? - a E: II ' -1.---' --. - .:: II 11 1 MIIRIUME 1 111111111F SMOISM MOM 11111 MAI JO 0' _ e . _ ? OninalliMUMPME MOIMMIAMMIU MMEMMINIMMEMM MMUMftwallegtv MMOMMEMIIMMEM 1,41MMOIMMEMS MEMIIIINUMINOMOMPI 1111 M. li 11111"111 111111110, i ' mr. INNINIP? II II ? MO IV- OR .t_____immir ___,..... MIMI ___--: ? ? MI?__ ____,___ .4 ? ' Pa ? , __. 10 , -- $ $ 1 1 ? ii .. _ _ '21111_ MN _ v- i---_-___--k, F- M , MO ? mos ??????????? ? 111111111111 ??? ???? 11111111' 1 H ? 4 ? 4 I 1111^ 11111111111?MOINIIIMMINGINIENSIIIIIIIII Eli .T:1:11r1s1-1411M1 [I ILINiii IMP V' 11121:4:[:151 1fl 43SYLSMS 14: I I I terl Chap. 39 Fig. 39,-17 sing "barged. (a) Show that the volume. (b) Show that ..atey integrating the Poynting _s equal to the rate at which the 2), energy density for all points within :he Poynting vector point of view, gh the wires but through the space we must first find B, which is the ring the charging process; see Fig. Nature and Propagation of Light CHAPTER 40 40-1 Light and the Electromagnetic Spectrum Light was shown by Maxwell to be a component of the electromagnetic spectrum of Fig. 40-1. All these waves are electromagnetic in nature and have the same speed c in free space. They differ in wavelength (and thus in frequency) only, which means that the sources that give rise to them and the instruments used to make measurements with them are rather different.* The electromagnetic spectrum has no definite upper or lower limit. The labeled regions in Fig. 40-1 represent frequency intervals within which a common body of experimental technique, such as common sources and com- mon detectors, exists. All such regions overlap. For example, we can pro- duce radiation of wavelength 10-3 meter either by microwave techniques (microwave oscillators) or by infrared techniques (incandescent sources). I 1P 102 104 106 Frequency, cycles/sec 10? 101? 1012 10 1016 111111111111 Power ?..1.Alcrovravet. tLbie 1011 101? 1022 tril x-rays Radio UTIrrviora ?..U1?n;Ta rays -- 1.11 11 I I I IIIIIIIILIII1 106 104 102 1 10-2 10-4 10-6 10-6 10-14 10-12 10-14 Wavelength, meters Fig. 40-1 The electromagnetic spectrum. Note that the wavelength and frequency scales are logarithmic. *For a report of electromagnetic waves with wavelengths as long as 1.9 X 107 miles the student should consult an article by James Heirtsler in the SCiallifIC American for March 1962. 993 `5. ???? ...,-,????????,`?????,-,???L ? " ? Approved.-For.Re-lease7.2000/4441 ? 994 NATURE AND PROPAGATION OF LIGHT Chap. 4( ? ? ? Fig. 40-2 The relative eye sensitivity of an assumed standard observer at different wave- lengths for normal levels of illumination. The shaded areas represent the (continuously graded) color sensations for normal vision. "Light" is defined here as radiation that can affect the eye. Figure 40-2, which shows the relative eye sensitivity of an assumed standard observer to radiations of various wavelengths, shows that the center of the visible region is about 5.55 X 10-7 meter. Light of this wavelength produces the sensa- tion of yellow-green.* In optics we often use the micron (abbr. ).4) the millimicron (abbr. mu), and the Angstrom (abbr. A) as units of wavelength. They are defined from 1 ? = 10 ?6 meter 1 mi= 10' meter 1 A =. 10-w meter. Thus the center of the visible region can be expressed as 0.555 A, 555 mu, or &550A. The limits of the visible spectrum are not well defined because the eye sensitivity curve approaches the fods asymptotically at both long and short wavelengths. If the limits are taken, arbitrarily, as the wavelengths at which the eye sensitivity has dropped to 1 of its m imum value these limits are about 4300 A and 6900 A less an a factor of two in wave engt The eye can tetectIrieyond these limits if it is intense enough. In many experiments in physics one can use photographic plates or light-sensi- tive electronic detectors in place of the human eye. ? See "Experiments in Color Vision" by Edwin H. Land, Scientific American, May 1959, and especially "Color and Perception: the Work of Edwin Land in the Light of Current Concepts" by M. H. Wilson and R. W. Brocklebank, Contemporary Physics, December 1961, for a fascinating discussion of the problems of perception and the distinc- tion between color as a characteristic of light and color as a perceived property of objects.