SCIENTIFIC ABSTRACT FIRKOVICH, T.V. - FIRSANOVA, A.N.

• Document Type: CREST
• Collection: Scientific Abstracts
• Document Number (FOIA) /ESDN (CREST): CIA-RDP86-00513R000413220012-6
• Release Decision: RIF
• Original Classification: S
• Document Page Count: 100
• Document Creation Date: November 2, 2016
• Document Release Date: June 13, 2000
• Sequence Number: 12
• Publication Date: December 31, 1967
• Content Type: SCIENTIFIC ABSTRACT

KUZMAK, Ye.M.; YEFREMOVAv X.P.;,f;M
,
I I.,
Heat-resistanod of drill bit edgeo reinforced by a hard alloy.
ketalloved. i term. obr. met. no,12t46-48 D'63- (MIRA 17t2)
1. Moskovskiy institut neftekhimicheskoy i gazovoy promyshlennosti.
I- - -
*,, - 1T -~
~'. I., - .- -

M
KUZMAK, Ye.M.; YEFREMOVAO K.P.; FIRKOVICH, T.V.; TUMUN, Yu.S.
EngineerinR fundamentals of the hard-allcy reinforcement of
rollers. Izv. vyso uchebe zave; neft' i gaz 6 n0.7:107-113
163. OMIRA 17:8)
1. Moskavskiy inatitut neftekhimicheskoy i gazovoy prowjsh-
lennosti imeni akademika I.M. Gubkina.

L 4D- 72-65 M~ I /F-WrI (j)/EWt(im)Jt,,Ad( C(t),
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Pae-2/Peb/Pi-4 IJP (c) GiT
~Tc it IEn P/,.,5?,~8/64/ooo/(,i7/oo25/oo33
501-11543,
ALMOR: Firkmski, _RA_fyirkm-ki R.)
TITIZ: Effect of a j~herid---pressure ati the atwrent de=ity of m!
pa--t cles-and m the ratio of this density to the total particle-current density
of
_A=Lr,~Ve r
Z lj~~; njj~ Se_
,,a
SOLTME -Loft Aeto e KaUk, Mtematyamo
przyro&d(:ze,, i Lo* 17s, 25~-33
MPTC TWS; Tie effecti of-the Za:itIvIa~at=)i3rhexe on the dovelo-pment. of extenz:Lve
~~cl----rs has been st~Aied. The apparatus is an Frra
v of T2 M.G. 2ounte
7k---4--t mg Particle set consisting of 96 detection e1
ements; maldng it, pos-
and record data on mu-mesons vith a thr%~s~!(-Id energ,r ar 0.9 Gevy
P der-i y, atmospheric pressure, variation crf pr~sf!xe W1,11 Ln
71r~-.r e-T COSMC-ray Oursms azia pamicie mensit-,r oi tne
& tl:.,e
soft Compoaent;, and variation in the ratio of penetmtIr4
t part i c I-e density of a cosmic-ray burst. The experiz-vmt-al (lats- coUected
An
to 1)62 am divided into 38 groups differing Ln wessure V I mm Hg, w2d
-1 ceffe~,.r- of' --.ae penetrating
the recording rates the barculetr
atel. The bar=P',er coefff~clent
Card 1/2

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miaed as OR * "(5-4- 4- -1 - i)%- -- - - -- -3 0 .-M
Per~w. 91-- ere-um no dem 6a the baxwetric -eZ~
feet for the pinetrating particle cuUmeat except for -.he quaUtative informtioa
given by T.E. Cranshav et al. (Phil. Mag. 32, 811, 1958). "Me aut'lor thanks
Docent Drt"aWk Zawqftki fbr~ the many discussions an(I valuable ecements pex-
t-ainln6 to thf-;'.-tur~y, Dr. tMsusz Serzy Gewin for theIx discus-
I-n thip ana Czen,~ LIA--arA Sndmer Vjcd-zt!!~I~rz Stefma-

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EML.

FIRKOWICZ, S.
Production of electron tubes in Poland.
P. 100 (WIADOMOSCI ELEKTROTECHNICZNE) (Warsaw, Poland) Vol. 17, no-4, Apr. 1957
SO: Monthly Index of East European Accessions (EEAI) LC Vol. 7, No. 5. 1958. .

FIRKOWICZ, S.
Remarks on the al3owed load of the oxide c4ttbode. Bul Ac
Pol Tech 8 no.11/12:655-W 160.
1. Przemyslowy Instytut Elektroniki, Warazawa. Vorgelegt, von
J.Groszkowski.

FIRKNICII,
it contribution to the analysis of the allowed load of oxide cathodes.
Bul Ac Pol Tech 8 no.11/12:661-665 160.
1. PrzeDlyslowy Instytut Elektronikai, Warnzawt. Vorgelegt von J.
rjroszkowski.

FIRR ,
ymon
Statistica quality control of electron valves. Przegl elektroniki
2 no-4:293-308 Ag.r6l
1. Przemyslowy ImstytUt Elektroniki

FIRKOWICZ., Szymon.
Statistical control of the.deficiancies of a party of.electronic
equipmnt., acceptance sampling b7 alternative-method. Przegl
elektroniki 2 no.7:456-472 161.
1. -PrzemWelowy Inatytut.Slaktroniki.
(Mactronic.apparatua and appliances)

36713
C' "-00/002/034/096
3) D2~91YD;01
AUTHOR: Firkowicz, S.
TITL.T,,-',: The effect of choice of alkaline earth carbonates on
the emissive properties of oxide-coated cathodes
PERIODICAL: -Referativnyy zhurnal, Avtomatika i radioelektronika,
no. 2, 1962, abstract 2-3-5e (Bu--I. Acad. polon. sci.,
Ser. sci. techn., 1961, 9, no, 1, 39-43)
TEXT: Results are given of an experimental investigation into the
effect of chemical composition and of the form of barium, stron-
tium and calcium carbonate crystals on the emission current of,
oxide-coated cathodes. 4 types of coating, deposited according to
the same process on the cathode of a standard cylindrical diode
were investigated. 1) (Ba, Sr)CO 3 50:50% by weight, deposited from
nitrate solutions by reaction with Na 2C0 3' 10H20 (whisker crystals
having average length 5.95 and 4.7 microns). 2) The carbonate ae-
Card 1/5

S11 94/62/000/002/034/096
The effect of choice ... D201/D301
posited by reaction with NH 4HCO3 (spherical crystals with the ave-
rage grain diameter 3.0/u). 3) (Ba, Sr, Ca)CO. with the weight ra-
.3
tio of components 47:43:10, deposited by reaction with N ' HCO
q4 3
(spherical crystals with average diameter 3.0/U). The number of
samples tested in every series was 74, 64, 100 and 57 respectively.
The emission current was measured at a fixed heating power of
+ 0.5,ulf, corresponding to the temperature of 5230K. The diode an-
3de voltage was 5 V (to avoid the effect of ion currents). The am-
bient temperature error correcting factcr was calculated from
e e(To ) El +.D(20 - To)]
where To Lthe ambient temperature peasured to + 0.500; Ie (T 0)
emission current at TO; D - logarithmic derivative of emission
Card 2/ 5

8/194/62/000/002/034/096
2he effect of choice ... D201/D301
current
D L I e = (W5 To
Ie 8TO KTK Tx
in which l/K 11600 degrees/volt; the 'work func.tion determined
experimentally from measure=ent of emission current I and I at
I e e
two heating power levels (P H 200/uW and PH 150 uVI). From
T t Tto T I I
C.10K K K n Ie 5 K
T T 1 4 T
K K e K
T 5230K and T" 4870K and hence
K K
Card 3/5

S/194/62/000/002/034/096
The effect of choice ... D20'1/D301
0 = 1,41 (log Le _ 01039)
e
The measurements have shown a normal statistical distribution of
the logarithm of emission current in every series. Quanti-tative
evaluation of differences in emisEbn current of various series was
carried out statistically by means-of Student's t-criterion. For a
55 difference level (t = 1.96), the di.-E*ference between separate se,
ries is appreciable, the emission current increasinc with smaller
carbonate crystals. Spheroidal crystals were deposited by ammonium
carbonate, as compared with the whisker-type crystals deposited by
sodium carbonate. The trio2ibonate (Ba,Sr,Ca)CO3with the weight ra-
tio 47:30:10 produces a considerably greater emission current than.
that obtained with the dicarbonate (Ba,Sr)CO3 in the weight ratio
50:50. The spread in the value of emission current depends in each
Card 4/5

S/194.1/62/000/002/034/C)96
The effect of choice D201/D301
series on the form of carbonateu and is independent of both the di-
mensions and chemical composition. This spread decreases when the
shape of crystals approaches that of a spheroid. The conclusions as
to the uniformity of the emission current may be extended over to
the electrical and thermal conductivity of oxide coatings. 3 re-
ferences. / Abstracter's note: Complete translation.2
Card 5/5

f, )4&0
/,3,)170
AUTHOR: Pirkowicz,
TITLE: Evaluation
upon frequency
changes of
B/194/62/000/005/096/157
D230/D308
S.
of the rel"ability of electron tubes based
'L
of damage being equivalent to relative
characteristics
PERIODICAL: Referativnyy zhumal. Avtomatika i radioelektronikat
no. 5, 1962, 11-12, 5zh78 (Bull. Acad. polon~ sc*i.
Ser. sci. techn., 1961t 9, no. 10, ~71-575)
TEUT: A method of calculating the reliability 0f electronic valves
is given; it is based on the observed parameter -changes with res-
pect to their initial value and, to the frequency of failures equi-
valent to these changes. The equivalent failure frequency of a sin-
gle valve characteristic determining the lower limit of the region
of changes observed in practicep is found from the condition of
working stability of a random selection of valves. A graph of the
failure frequency versus region of changes of the valve character- V/r,
istic obtained in practice is given. General failure frequency is
defined as the sum total of failure frequencies of all valve cha-
Gard 1/2

S/194/62/000/005/096/157
Evaluation of the reliability ... D230/D308 ..
racteristics. Formulas for the reliability interval [Abstractor's
note: Meaning of I'doveritelInyy interval" not cleari are given in
which, for a given probability, the number of valve failures is ./61
found. [Abstractor's note: Complete translationi.
f
Card 2/2

FLMOWIG~0-9[5 -~
u
Sputtering of oxide-ooat~d cathodes in oaocwa tubes as reil~lt
Of-the,ourrent passing through the emitting loyer. Archiw '
elektrotech 10 no,Z505-533 161,

*,0 a (/3,3/, /00// //1,/)
AUTHOR: Firkowicz, Sz.
30573
P/019/61/'010/003/006/008
D265/.9505
TITLE: Contribution to the statistical analysis of the qua-
lity of electron tubes
PERIODICAL: A.rchiwum elektrotechniki, v. 10, no. 3, 1961, 783-787
TEXT: The author considers the quality of electron tubes as the
product of the probability of the lack of damage Ra and the condi-
tional probabilities of keeping the electrical parameters within
the required tolerances Rxil Rx2' ..I, R xi* In order to establish
the probability R the distribution functions of the parameter X
are taken as the Rhode current - Is, and the slope of its characte-
ristics - Ra. A test is described for the quantity n = '103 of the
electron tube BP80 working under normal conditions. During the time
ti the values of Sa and Ia were taken for each tube under test for
constant grid polarization. As random variables for the statistical
analysis the quantities of Sa(t and log Ia(t were assumed and
Card 1/2

11
30) 3
P Oly6f 010/003/006/008
Contribution to the statistical ... D265 D305
their normal distributions were checked by calculating the statist-
ics X2according to Pearson's relationship. The experimental and
calculated results are tabulated and proved to show the logarith-
mic distribution for the anode current and normal distribution for
the slope of the characteristics of the electron tube. To confirm
these results another test was made for conditions more severe than
the normal, i.e. for the anode voltage increased from 170 V to 250
V. In this case the normal distribution of Sa(ti) during time ti
was also observed. There are 3 tables and 3 Soviet-bloc references.
ASSOCIATION: PrzemysYowy instytut elektroniki (The Industrial In-
stitute of Electronics)
SUBMITTED: pebruary 6, 1961
Card 2/2

P/053162/000100i/001/001
1004/1204
AUTHOR: Firkowicz, Szymon
TITLE: Experimental estimation of an unknown probability
PERIODICAL: Przcglqd elektroniki, no. 1, 1962, 37-45
TEXT: Methods of estimation of.an unknown probability of a random event in a population are discussed on
the basis of the observed probability of such an event in n independent experiments, treated as a random sample
of this population. General principles of estimation of unknown parameters in a population are stated, and
it shown that the best estimate of a random event is its frequency, as observed experimentally. Methods of
establishing confidence limits for an unknown probability are thoroughly discussed. Several examples arc
given based on the practice of electronic production.
ASSOCIATION: Przemyslowy Instytut Elektroniki (Industrial Electronics Institute)
Card 1/1

-S/275/63/000/002,1002/032-
D405/U301
AU-ITIOR: FiOCOWICZ .3.
TITIS: statistical es, imatc, of lifeti!, e of ampli:fier tubes,
t
Reiferativny _-zhurnal, E lektronika i eye p-rimiarteniye:'
26, abstract 2A135 (11race Przemysl.
no. 21 19631
inst. elektron., v. 3, no. 1, 1962, 49-68 Uol.:
summaries in Lng, and Pus.))
TEXT: The standcird-- method: of e stin, at-Lug -the -lif c time of
tuIbcs, adopted in the electron-tube industry of Poland, leads to
disagreements between producers and consumers owinSr to the. quality
estimate. This method, which' is based on the :division of tubes
into serviceable and defective, reduces to lifetime-testing ofa,
lot of 10 -tubes; . after'.a. given period oll! time the number of defec-;
tivc tuber, rhould not-exceed 2. An analysis oE the method shows
that a statistical method,of estimating the guaranteed lifetime on
the basis of the concept of:tube failure would be more cacrect; the,
-guarante.ed-life-t-ime- rL as- the time of service under,the~_givenl
card 1/2~

3/275/63/000/9021/002/032
Statiotical. estimate ... D405/0301

FIRKOWICZ, Szymon
Reliatility and quality evaluation of electronic devices. Frzegl elektronilci
3 no.3:118-119 Mr'162
RL
iiamMRII MONK RIC ION- ~'j' iC`.

FMOWICZ, Szymon
The uniform quality evalwLtion of electronic element3. Przegl elektroniki
3 no-3:149-150 Mr 162
1. Przemyslowy Instytut Elektrpiki, Warszawa.
i

FIFT(NICZ, Szymon
On the parrisnible current Icad of cxide cathcdes. Przegl elektraniki
3 no. 5i277-279. Yq 162
1. Przeirynlcwy Instytut Fl ektrcniki, Vlar3zawa.

FMOWICZ, SZYMOM
Control testing of special quality tubes, Przegl elektroniki 3
no.9:535-539 S 162i
1. przemyslowy Instytut Elektromilcij, Warszawa*

FIRKOWICZ, Szymon
- ---
Principles of statistical evaluation of the reliability, of
vacuum tubes. Przegl elektroniki 3 no.10:605-618 0 162.
1. Przemyslowy Instytut Elektroniki, Warszeya.

FIRKOWICZ, Szymon
Contribution to a statistical evaluation of worldng stability, of
electron tubes. Przegi elektroniki 3 *o,.12:716-?21 D f62.
L Przeymelowy Instytut Elektronikij Warszmwa*

FIRKOWICZ.- .; NIEMODA) J.
Distribution of basic parameters in receiving tubes. A--chiw
elektrotech 11 no.2s285-297 162.
1. Przemyslowy ~nstytut Blektroniki, Warszawa.

AUTHOR:
TITLE:
P/019/62/011/004/003/010
D271/D308
Pirkowiez, Sz.
Statistical evaluation of the quality of electron
tubes
PERIODICAL: Archiwum Elektrotoohniki, v. 11, no. 4, 1962, 741-756
TEXT: Practical methods are discussed for evaluating the quality
of a batch on the basis of the percentage of sub-standard speci-
mens. The measure of quality of a batch is the probability that
at least one of the requirements will not be satisfied, called the
factor of demerit. Statistical analysis of a random sample permits
the evaluation of the demerit factor, i.e. to determine the confi-
dence interval (w', w") which will contain the demerit factor with
a confidence level 8: the theory of estimation is applied in the
analysis of sampling results. For alternative classification (each
item is either good or bad) Hanamaker's table'pf w', w" values is
reproduced for a lot (n) of 5 - 500; disqualified items number W
0 - 20 and the confidence level is one of 0.90. The top limit of
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P/01 62/011/004/003/010
Statistical evaluation of D271YD308
the confidence interval (w") is termed the guaranteed factor of
demerit and 2 is the guarantee level. Nomographs of w" as a func-
tion of n are given for various values of z. In handling some mea-
surable parame*ters (parameters-class;II) the alternative clasbifi-
cation-is not sufficiently precise.*The demerit factor is estima-
ted on the assumption that permissible values of parameters are
limited on one or both sides. In the case of upper value limita-
tion the confidence interval for the unknown demerit factor is:
W,
gW 5 Q(Y"),
9
w11(X) 0.5 --Q(Y~)
9 (12)
wheray is the normalized variable and 9(y is the value of the.'
9 9
Laplace integral. Numerical examples are given. The combination of
alternative classification and normal distribution of a class II
parameter is considered, as well as the evaluation of the batch on
~Card 2/3

Statistical evaluation of
P/01 62/011/004/003/010
D271YD308
the basis of several parameters. The average demerit factor of a
production batch can be evaluated on the basis of m independent
samples with n1, n21 .... nm specimens each, by treating all these
samples-as one random sample of a lot equal to the sum of lots of
individual samples; formulas are derived for the confidence inter-
val in this case. Evaluations of the demerit factor on the basis of
two samples of unequal lots and unequal numbers of rejects are
compared and conditions are specified for when the two demerit fac-
tors can be regarded as identical. There are 1 figure and 1 table.
ASSOCIATION: Przemys-kowy Instytut Elektroniki (Institute of Indus-
trial Electronics)
SUBMITTED: March 21, 1962
;Card 3/3_

Z/037/62/000/005-6/026/049
E140/E562
AUTHOR: Firkowicz-,-S
!TITL9: Maximum loading of oxide cathodes
PERIODICAL: 'C/eakoslovensk casopis pro fysiku)'_o-5-6, 1962,
605-608
TEXT: In high-current, pulsed operation of an oxide- cathode.j
Joule heating and the change in surface-layer donor concentratioii
must be taken into account. CritIcal ioading of the cathode may:
be taken as the maximum current at which it is still possible to-V
neglect changes of the physical properties of the emission layer's',-!,,
A relation was found, which agrees well 4ith the observed
influence of the properties of an oxide cathode on its allowed~
loading. There are 2 figures.
ASSOCIATION: Pramysiov/ 4stav elektroniky, Vars"ava
y
(Industrial Institute of Electronics, Warsaw)
Card. 1/1

ACCESSION NRs AP4015986 P/0021/63/000/032/WO/0465
AUTHORs Firkowicz. Szymon (Doctor, Engineer)
T7.1m: On Application Of the F distribution of Snedecor to reliability
problems
SOURCE: PrzegW elektrotechniewy, no. 12. 1963. 460-465
TOPIC TAGSt Snodecor F-distributions reliability. statistics, production
production homogeneity, dispersion ana2ysisq probab4l4typ stAwAard deviationg
statistical production analysis
ABSTRACT: In this article the author show the usefulness of the F-Alistribution
of Snedecor in solving problems of dispersion analysis, production homogeneity
control$ determination of the confidence interval for reliability and
comparison of ha2ards. Verification is given for the hypothesis that
incidence of hazards is Independent of time* The mathematical definitions of
reliability and intensit7 of failures are givene Orige art* hass
3 figures and 66 equations*'
2/2
Card
k

ACCESSION NR: AP4036W
ASSOGIATIONs Pfteuplm Institat ElektrordJd (Mmdustrial SUctronias
InsUtute)

smar= oo
DAZ ADQ: 03Feb64 Eum: oo

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SUB CODE: HH. 33 NO M sovg 001

OTHM
006

GRZESIAK, Kazimierz., dr inz,j_FIRKOWICZ, Szymon, dr inz.
RolleAlity evaluation by using time space transformaticin.
Prk;,gl elektroniki 4 no. 10/11%563 O-N 163.
Statistical methods for testing the homogeneity and
repetitiveness in mass production. Ibid.:569-586.
1. Osrodek Badawczy Sprzetu lacznosci, Warszawa
(for Grzesiak).
2. Przemyslovy Instytut Elektroniki., Warszawa (for
Firkowicz).

FIRKOWICZ, Szymon, dr inz.
~S~nedec~orts ~diatributlon do used 1n reliabil-ity inveeti-
gations. Przegl slektroniki 4 no. 10/11:568 O-N 163.
1. Przemysloi~iy Instytut Elektrorliki., Warszawa.

FIRKOWI 0 dr inz.; KOSMOWS-KA, Alina
Distribution of certain measurable attributes of low-
power electron tubes. Przegl elektroniki 4 no. 10/11:
635438 O-N 163,
1. Przemyslowy Instytut Elektroniki, Warszawa.

ACCESSION NRt AP4009261
P/0019/63 /012/004/0703/0724
AUTHOR: Grzesiak~ K.j Firkowiczp S.
-;~- ~.hN~G
TITIEt ReliabilitY.evaluation based on time space transformation
SO~RCZ: Archiwum elektrotechnikip v* 12, not, 4p 1963s, 703-72LL .
TOPIC TAGS: system reliability eviluation., time spacep time space trtmsforma-
tion., distribution function, longevity distribution function.. Rayleigh distribu-,-
tion, Weibull distribution.
ABSTRACT: Reliability evaluation is usually based on information concerning
the longevity distribution of the elements cawdtutWS the device under considera-'
tion., i.e. the form' of the distribution f unction and its parameters. This creates
the nebessity of devising a method which would permit a relatively simple and
fast preliminary verification of thehypothesis used for the fo= of t1m distribu-
tion function of ' element longevityas well as for a preliminary rough esti-
mate of the parameters of this function, based on experimental tindings. Authors
attempted to solve this problem by means of a unique representation. of an actual
Card

ACCESSION NR-. AP400926i.
longevity distribution by an exponential distribution in an imaginary "Ame space
'r M y(t).. which permits a representation of the given distribution function
.9 0 and the'
F(t; 91J, .0'60 -iandcm variable T (object's life) in another form of
distribution function 0( r I SX) with random variable r, the requisite condition
of this type of distribution function being
FO 01. ON)-G(T; 0,)=O
0