SCIENTIFIC ABSTRACT SKLEAREVICI, I.A. - SHKLYAREVSKIY, I.N.

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SCIENTIFIC ABSTRACT
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SnE,~'IE-qTICI) I.A. [Shkl-yarevich, I,Ao] Application of high vacuun for the intensification of agglomeration process. Analele metalurgie 16 no.3:15-18 ii-S 162, SHKLYARE-VICH I.A. "Equipment of sintering plants for ferrous metallurgy" by A.E.Seleznev. Reviewed by I.A. Shkliarevich. Stall 22 no.10.-889-890 0162. (MIRA15:10) 1. Vsesoyuznyy nauchno-issledovateilskiy i proyektnyy institat ;nakhanicheskoy obrabotki poleznykh iskopayamykh. (Sintering-'quipm(3nt and supplies) (Selezne, A.E.) SHKLYAREVICH, I.A. Intensifying the 8intering process. Met. i gornorud. prom. no.2: 16-18 Mx-Ap 165. (MIRA 18: 5) SHKLY~%.1;LVSKIY, r.l~.; !.1jjj-SU-.VSj,7jy, V.K.; GOLOY:~POVA, V.I. 4 11 ~ 1,1ide-aperture interference of light. Opt. i spektr. 17 no-5: 765-770 t,,, 64. (IMIRA 17:12) SHKLYAB-P,lIr,)T- M., assistent Malignant theco-follienloma. Zdrav.Belor. 4 no-3:63 Mr 158. (KIRA 13:7) 1. Iz akushersko-ginekologichaskoy kliniki (zaveduyushchiy Icafedroy - doteent I.S. Legenchenko) Minskogo instituta uso- vershenstvovaniya vrachey. (GRAERATIVE ORGANS, FWLU3--TUMORS) BCDIJLM', V.P., prof.-. SHIMALREVSKAYA, Ye.V., kand. mied. nauk; YERCf4MH1V1T,, G.A., Topical diagnosis of pulmt~narv. echinococc;osis. Uch. 2ap. Stavr. goo. wed. Inst. M77-187 16.1 (MUFA 17,-7) 1. Kafedra cb-zh~theq khimir~gli ZaV. v7J. 3--dti!"n) 51.av- Is' viediu:inzi:ogn -jizstiti~~,-~ zt:51uzhanrryy dey-a- -c)gc, T ropc- A tell nauki. pro". V.G. BUdylin). USb/Geophysics - Irrigation Jun 52 Specialists "Chronicles: Conference on the Problem Con- cA cerning Methods for Irrigation of Agricul- A. 1. Shklyarevskiy tural Cultivation" "Gidrotekh i Melio" No 6) PP 75-80, During 12 - 14 Mar 52, in Moscow, the Hydro- technics and Amelioration See of the All-Union Acad of Ngri Sci imeni Lenin held a plenum, with participation of agricultural and hydro- logical administrators, directors, arid main Aff,r ~nomi~qts of MTS (machine-tractor stations), besides presidents of kolkhozs in irrigated districts of Kuybyshev.and Saratov Oblasts. Discussed were problems of,utilizing irri- gated lands under conditions met beyond the Volga and in other new regions being irrigated. Reports were beard from 22 lecturers: "I.A. K~iRkemich, substitute f or .. Minister of USSR; Prof V.A. Shaumyan, substitute for the d13~6ct-df_d:F_ -c-i ent ific part of All-Union Sci Rep-Inst of Hydrotechnics and 'I.P. r a " " yshev Oblast Water.. y, hea , Kuyb yle i-con;-I.A. Isakoy, Chief Agronomist, Georgiyev Tq_i Dorokhiqj ;` L: res, ~haritjonQv,' Chief Agronomist, Saratov Oblast j!.a '6hief A---- --- ~dAd~ktxi;-Prokhorov",, gronomist, Saratov A-INIQQ+. T~fps: PC~Eh_&i~3-~,~,pres "Komsomolets" Kolkbo YershovV Pres, UXbYi ~M_0_4~jAst E!?~ec Comltt~~e~; je._C`~etrov, Cand Agr Sci, -All-Union Rg Insj_ _Hydx~tjchnics and Ame~l~63~tion; Yegorshilov, En9r; N.P. Samsonov, Sr Sci Assoc., A1 I _-jJnj on Se~ f HY-drotechi.cs, and Amelioration;, Nesteroy,,, Pr "Zar.)ra" Kolkhoz; V.G. Kornev; _-_ es, Sr Sci Assoc of Ukrainian Exptl Sta;.etc., ASTAPOV, Sergey Vasillyevich, professor; SPENGLNR, Valentina Vasillyevna. SEKLYAREVSKIY.-A.I., redaktor; MRSYPKINA, Z.D., tekhnicheskiy - - eVM-T,- dr-,---,RTMXNSOVA, S.L., takhnicheskiy redaktor [Prevention and control of salinity and sqamping in irrigated lands) Preduprezhdenie i bor'ba s zasoleaiem. i zabolachivaniem oroshaemykh zemell . Koslcva, Gos. izd-vo salkhoz. lit-ry, 1956. 158 p. (KMA 9:12) (Salinity) (swamps) t OFFEUGENDEN, Samuil Rafailovich,kandLt tekbnicheskikh nauk; PANADIADI, A.D., kandidat sellskokhozya3rstvennyk:h nank; TROMBACREV, S.Po,inzhener, Edeceasedj; YARUSHIN, M.I., inzhener; KUKEIN"PSKlY , H-D-kandidat sellskokhozyaystvennykh nauk; KAGAN, G.S., inzhener; NIKOLAYEV,I.G., inzhener; TRUBACHEVA, Ye.G., kullturt,ekhnik; ~~' AUT A.I. redaktor; FEDOTOVA, A.F., tekhnichosl:iy- redaktor -A~ LOperation of irrl,~:ation and drainagn s7stemal Ekspluatataiia gidro- meliorativnykh sistem. Pod red.S.R. Offengendena. Moskva, Gos.izd- vo sellkhoz.lit-ry, 1956. 535 P. (Ml--RA 10-6) (Irrigation) (Drainaze) AUT, HOP: Q /-I I., Eng-neer "~V/99-59-1-8/13 TITLE: The KbtEtyksk~yaIrrJ-ation SyStem is in Operation (Kotaykskaya 0 skaya orositeltnaya sistema vstupila v stroy dey- stvuyushchikh) PERIODICAL: Gidrotekhnika i melioratsiya, 1959, Nr 1, pp 33-37 (USSR) ABSTRACT: The author describes how, under very difficult con- ditions, Armenian workers in a short time built the Kotaykskaya irrigation system. This system will irrigate 7,500 hectares, serviced by 116 km of per- manent canals. A total of 23,000 cu m of concrete and 700 tons of metal structure were used in the construction. In November 1958, the Arzni-Shamiramskaya irrigation system with EL 17 km long canal was put into operation. There are 8 photographs. Card 1/11 30(i) sov/99-59-7-10/10 AUTHORS: L_a;)`doks'=iYs -K.L'. , and -3h`:-1lyarevS`:1-__J-,-, A. _7. , E'ngineers TITLE, In the 3cientific and Technical Council of the Ministry of Agriculture of the USSR (V nauchno-tekhnicheskom sovete ministerstva sel'Skoro SSSR) PERIODICAL: Gidrotekhnika i meliorats-iya, 1Q,19, Nr -64 pp 60 (USSR) ABSTRACT: The article is concerned with a meeting of the Scien- tific and Technical Council of the Ministry of Agri- culture of the USSR held_ during the period 12 - 15 January 1959. and devoted to full mechenization of Cotton cultivation and harvesting. The reetin- was attended b-- specialists -in cotton g-r-oviing of Uzbe- histan, Turl=eniya, Aze:-baydzhan, Kazakhstan, and Tadzhikistan, by research ~:,,.,o-rkers of 'he co'-ton-produ- cinc-, republics, bir reprasentatives of the -olants mak~n- cotton-tillins machinery, by scientific workers ~ ~' I O.L the Vsesoyuznaya akademiya sellsko'l~-hozyaystvennykh Card 1/5 nauk imeni Lenina (All-Union Academy of A-gricultural SOV/99-59-3-10/10 In the Scienrific and Technical. Council of -,,he L,~-Jn~~ry of Agri- cult-.ure of the -U'SSR imonj- Lcz!in), and b,,/ specialists of the or- economy, hydraulic Th,,,- was -ilso attended by i,epre sent a tiveo, of the Crosudarstve,iiiyy nol-ichno-tekh- nicheskiy komitot 6oveta L-Iiiii-4strov SSSR ~State Scienti- fi.1- ,--nd Te~,hni~,al Commill-tee of the Elinisters! Council o.--P the USSR), t~iose of the Uzbek and Kirgiz SSR; the Gosplan USSM, t;he Minist-erstllvo sellskogo khozyaystva SSSR (lainistry of Agric-liture of the USSR), and the ministries of agriculture and water economy of the r:ott.on--Droducing repullic~s. The meet-ing was opened by G.A. Bor-kcv, Deputy 111inister of Agriculture of the 'USSR, vihose s',- 'ort' speech was followed by reports made by tl~e 'folloviing perso-val-ities: 1) T.G. Zinin, Deputy Di--ector of the U7,be'L~-s~:.-,Tnauch-Tio-i-ssledovatel'skiy insti-tut mekhanizats-ii -i e1ek-L:ri'Likatsii sel'skogo 1,hozyaystva (Uzbek ReSE~arCll Institute for the Lllecha- rjLzation and Electrificat-ion oF' Agriculture); 2) V.A. Card 2/5 Tyup.',:o,. of the Srednea-,-,iatuskaya EIS (Central Asian SOY199-59-3-10110 -P A crri- i ri i e n t 1' --- i c -n n r: Ti e c !in- i cI ^- f tu", ein-i-t Y Of culture of the USSR LI.Y3, Topada. Chief Engineer of the Pakhta- Aral sovkhoz; 4) IT,,, 3iekirov, of the "Bayaut Nr 4" sovkhoz. Tashkent Oblast TIelesh'Ko , Director of the Z)redneaziatskaya mashino--spytatellna a stan- L 4 ts~ya Central Asian N"ach-1-ne Testing Station 6) B.Ye. Arkhangel'skd.-y-- Chief Designer of the Li- pet-sIr-'-1y traktuorny-j zavod (Lipetsk Tractor Plant); 7) Ye-A. Sarkisyants, Chief Designer of the Vladi- mirsk.iy traktorny-y zavod ~Vladmimir Tractor Plant); 8) N.I. Popov, Ciiief .3pecialist of the Nauchno- tekhnicheskiy komitet Soveta ministrov Uzbekskoy SSR (Scientific and Techn2-cal Committee of the Ministers' Counci-I of the Uzbek SSR); 9) Ye.V. Radkevich, Chief Designer of the SKB for Cotton of the Tashl--ent Sov- narkhoz); 10) B,P, Firsov, Deputy Chief inspector for Cotton of the 1,.'SKh SSSR; i1) -A.N. Askochenskiy, Aca- de.riician and Secretar,y of the Otdeleniye -I-idrotekhni- k---' i melioratsii VASK--il-TIL (Hydraulic En-ineerin- and Mielioration Departmen,- of VASKhTNIL -~ K. P:. -S' Card 3/4 J., 12 hub- 59- 3 - 10/10 In then Scierit-i 'Lic- and Tec'hnical Cour-c il of uhe ;,`Lni.~- ry of A-ri- culture of the USSR ladze.. Deputy Cl-ief of G1avvod-'k:ho-- 1IS-7-h USSR; 13) N. 11, T-~ul~o~,, 3enior :.1) C 4enti 'i c V-Jorker of VITIIGilliiii 14) L.D. S-Ionov, 1,71IUill'~. 25) M.F. Euldkov,, Fer-ans- ,,i stantslya Fer a Testing Stiation)i kaya opytna-7 an- 3- c Go!3pla--. 3SSR, 17) N.I. Fershtat, Depui~.y -of Agriculture of the Uzbek SSR; 18) A~A. Troits-lkiy, De-j--v Minister of Agricultu:,~'e of the Tadzhik SSR, 110) Tv,.A. M 'atvoyev, GosNIIGVF-, 20) N.I. Kostyuk, r.!SKh of r..'ate Kirgiz SSR; 21) S.ra. Shakh- muryadyan, VIM; 22i LT. Khalilov, MSKh of the Azer- baydzhan SSR4 2-.3) K.A. Gularyan, ArmTNjIIZ; 24) A.A. Karimov, GNTTk of the Sovet TTinistrov Uzbekskoy SSR 11111inisters Col-uncil of the Uzbek SSR); 25) N.I. Depta, Tashkent sovrarkhoz; 26) M.N. Anan;yev, Giprovodkhoz; 27) I.P. Panow, Tashsel'mash, 28) Ivanov, GOSNITI; and 29) V,A. Kaufman, G-11avnoye upra-uleniye melechani- z--tsii i elek-trofika;1--ii t'SKh SSSR ( Central Adr-ini- stra-cion of the Lieclianization and Electrofication Card 4/5 of the i,!SKh USSP)~ Aroorip, the organizations only so~jqq.. r.-9-3-10/10 In the Scientific and Technical Council of the ?,,in-. -~-U:-ry of Agri- cultiure of the USSR mentioned in the above reports yet not listed above are the following: 1) Vs,,esoyuznyy nauchr-o-issledo- vatel'skiy institut gidrotekhniki i melioratsii imeni A.N. Kostyakova (All-Union Research Institute of Hydraulic Engineering and Lielioration. imeni A.N. Kostyakov) ; 2) Gidroproyekt; and 3) VNIIStroydormash. Card 5/5 SHKLYAREVSM, A.I., inzh. Kotalksk irrigation system went into operation. Gidr. i mel. 11 no.1:33-37 da '59. (MIRA 12:1) (Armenia-Irrigation) SHKLYAREVSKIYI A,I._ Plenum of the Section for Hydraulic Engineering and Soil Improve- ment at ehe Lenin All-Union Acadeqf of Agrucultural Sciences. Gidr. i mel. 14 no.4:57-63 Ap 162. (~IIRA 15:5) (Irrigation) (Drainage) BODULIN, V.P., prof.; SIMLYARETSKAYA, Ye.V., kand. med. nauk Topical diagnosis of hydatids of the lungs. Uch. zap. Stavr. gos. med. inst. 12:~05 163. (MIRA 17:9) 1. Kafedra obshchey khirurgii (zav. prof. Yu.S. Gilevich) Stavropol'skogo gosudarstvennogo meditsinskogo instituta. 24(5)121(7) AUTHOR: Shklyarevskiy, G. M. SOV/556-36-5_29/76 TITLE: Single-Particle Mechanism in Photonuclear Reactions (Odnochasticbnyy mekhanizm v fotoyadernykh reaktsiyakh) PERIODICAL: Zhurnal eksperimentallnoy i teoreticheskoy fiziki, 1959, Vol 36, Nr 5, PP 1492-1496 (usn) ABSTRACT: In the introduction the problem as well as a number of earlier papers are discussed in short. It is pointed out that there exist experimental facts which do not fit into the framework of the two-particle model (the existence of photoprotons with energies that are nearly equal to the maximum energy 4-n the 'r-spectrum, shifting of the m,-zimum of angular distribution. towards the angular range of 20-500, and direct obser,;-ation of ( y-p)- and ( rn)-reactions at high photon energies). Therefore, the direct single-particle mechanism, especially in the range of gigantic resonance, is'of g::eat interest. To investi,,rate it for nuclear photo-reactio-as athigh enerEies of the emitted nucleons ( 3`1120 Mev) on the baais of the shell model is the ain to be achieved by the present paper. Satisfying the momentum conservation law warrants also consideration of the momentum of Card 1/3 the nucleon bound in the nucleus, and, at the same timej Single-Particle Mechanism In Photonuclear Reactions sov/56-36-5-29/76 makes it possible to explain.the forward shift of the angular distribution like in the case of the,atomic photoeffect. The author bases uDon the following assumptions: The nucleus in the ground state is assumed to consist of nucleons moving independ- ently in a centrally-symmetric potential field; the state of p each.nucleon is asslamed to be characterized by the orbital momehtum 1, its projection m, and the binding energy El SP:En and magnetic moment of the nucleon ara neglected, which amounts to a neglect of spin-orbit splitting. In consequence of the neglect of nuc','.-(,,n intezaction, only "hole" excitations of the residual nucleus are possible; the energy of these excitations is contained. in thE binding ene:rgj of the nucleon. The description of the interadt.-;ons in the final state is carried out by means of the optical nuclear model. Calculations are carried out in momentum appro-CImation. Basing or. the operator of the interactionbe-;ween nucleus and electro- magnetic field, expressions are derived for the matrix eleT_-.~rt 21r 2 in the reaction cross sect4on. formula dd =-3r- IMI ~ (E) Card 2/3 Theoretical and experimental results are compared. Single-Particle Mlechanism in Photonuclear Reactions SOV/56-36-5-29/76 it is shown that interaction in the final state can be de- scribed by the optical model and that 2 effects, above all, occur: 1.) The existence of.an imaginary part in the potential leads to a reduction of the cross section of the direct photo process at the expense of the development of intranuclear cascades and (or) the occurrence of' excited states of the type of a compound nucleus. 2.) The nucleon after photon absorption is elastically scattered on the real part of the potential, which leads to a certain "smearing-Iout" of the angular distribution. The author finally thanks Professor L.A.,Sliv and Professor I. M. Shmushkevich for their valuable comments. There are 1 figure and 13 references, 2 of which are Soviet. ASSOCIATION: Fiziko-tekhnicheskiy institut Akademii nauk SS.SR (Physico-Technical Institute of the Academy of Sciences, USSR) SUBMITTED: November 20,. 1958 Card 313 8 1., 4 0 "7 S/056/60/039/004/0251/048 BOO6/B063 AUTHOR; Shklyarevskiy-,-G. M. 19 TITLE,~ Theory of Photonuclear Reactions of Light Nuclei With Emission of Deuterons FERIODICAL: Zhurnal eksperimentallnoy i teoreticheskoy fiziki, 1960, Vol. 39, No. 400), PP. 1031 - 1038 TEXT: In the present paper, the author gives a theory of thewd-reaction of light nuclei within the framework of the independent-pair model in small-correlator approximation. This model takes into account both the general self-consistent field and the pair interaction leading to nucleonic motion correlations. The wave function in this model is formulated as follows: T = 1~a 1( i )1,2(2) .. .. ~, n(n)j(1 +Q,j). where ~?ai(i=192..n) is the single-particle wave function, andl,,j the correlators. At distance of the order of the mean nucleon distances in the nucleus, holds in t!7- TI-e mechanism Card I/A I 8hh07 Theory of Photonuclear Reactions of Light S1056160103910041025,1046 Nuclei With Emission of Deuterons B006/BO63 excitation of the product nucleus as a result of quick variation of the self-consistent field of the nucleus during em'-ssion of a pair of nucleons is considered, and the excitation probability in the region of the continuous spectrum is calculated for the case of independent particles. It is shown that correct values for the ~-d cross sections of light nuclei and also for the shapes of energy spectra and angular distributions can be obtained by employing published values of the para- meters involved in the theory, The results obtained are compared with experimental data on C 12 and Be9 nuclei. Data on the a rdIcy ~,p ratio were given by V. P. Chizhov and L. A. Kullchitskiy.-The experimental data are graphically compared with various theoretical curves. Fig. I shows dcl/d-Q= f(E d) calculated for transitions without a change of the nuclear configuration (Curve 1), for transitions taking account of single-particl~ excitations (Curve 2) and two-particle excitations (Curve 3) for C 12 with '&~C 12 ) = 15.2 Mev,4w(B 10 ) = 17.0 Mev, and E ;~Mjx = 80 Mev; Fig. 2 shows the same for Be9 withkw(Be9) - !6.2 Mev,Aw(Li ) = 18.9 Mev, end Card 2/3 Alto? Theory of Photonuclear S/056/60/039/004/025/048 Nuclei With Emission of Deuteroiis B006/BO63 E~,max - 90 Mev. Fig. 3 shows a comparison between the experimental and theoretical angular distributions of the reactions C 12 (7,d) and Be'(~d) normalized for 0 = 60'~ R = 1,5A1/3.10-13cm was assumed for all the calculations. The author thanks S, V. Maleyev. A. D. Piliya, and Professor L. A. Sliv for discussions and comments, and also V. P. Chizhov for a discussion of experimental data. Migdal, L. E. Pargamanik, and V. V. Ullyanov are mentioned, There are 3 figures and 16 references: 4 Soviet, 6 US, 2 British, 1 Swiss, and 3 German. ASSOCIATION: Leningradskiy fiziko-tekhnichesl:iy institut Akademii nauk SSSR (Leningrad Institute of Ph,sics and Technology of the Academy of Sciences, USSR) SUBMITTED: April 30, 1960 Card 3/3 SHKLYAREVSKIY. G.M. Nucleon correlations and photonucle&r reactions. Part 1: Photo- disintegration of He/+. Zhur.eksp.i teor.fiz. 41 no.1:234-238 JI 161. (MERA 14:7) 1. Leningradskiy fiziko-tekhnicheakiy institut All SSSR. (Photonuclear reactions) (Nucleonsj (Helium-Isotopes) SHUY-AREVSKil, G. M. Dissertntion defenied for the legree of Candliate of Physicomathematical Sciences i~~t the Physics imeni ?. H. Lebedev in 1962: "Correlations of N,tcleons, and Slimple Photonuclear Reactions." Vest. ALal. Nnuk SSSR. No. 4, Moscov.,, 19~'53, p--i-es 119-146 ACCESSION NR:' AP4019238 S/0056/64/046/002/0690/0694 AUTHOR: Shklyarevskiy, G. M. TITLE: Inelastic scattering of photons by a Coulomb field accom- panied by electron-positrOn pair production -SOURCE: Zhurnal eksper. i teor. fiz., %r. 46, no. 2, 1964, 690-694 TOPIC TAGS: Compton effect, inelastic photon scattering, scatter- ing by Coulomb field, electron positron pair production, Weizsacker- Williams method, proton polarizability, proton polarizability c.or- rection ABSTRACT: in this investigation the tons are assumed much larger than tha losses are assumed to be small. The by the Ileizsacker-William method in by Gribov et al. (ZhETF v. 41, 1839, Card 1/3 energies of the incident pbo- electron mass and the energy analysis of the scattering is its invariant formulation given, 1961). This scattering process ACCESSION NR: AP4019238 has not been treated in the literature before. It is shown that this process occurs in a lower order off perturbation theory than other processes involving the Compton effect on protons or other nuclei, and that at small angles it appreciably exceeds the correc- tion-to the Compton effect on a proton due to the polarizability of the nucleus. Furthermore, it exerts a decisive effect on the background which interferes with the measurement of the Conq.~ton- effect cross section in the small-angle region. The results are compared with some experimental data. The cross section of the dis- integration of a photon into two photons by interaction with the Coulomb field of the proton is two orders of magnitude smaller at all angles (except the largest ones) than the cross section of the investigated process. "I am grateful to 1. M.'Sbmushkovich and V. M. Shekhter for a discussion of tho work and for critical re- marks." Orig. art. hass 17 formulas, 1 figure# and I table. ASSOCIATION: Piziko-tekbnicheskiy inatitut im. A. P. loffe AN SSSR Card 2/3 ACCESSION NR: AP4019238 (Phksicotechnical Institute AN SSSR) SUBMITTED: 15JU163 DATE ACQ: 27Mar64 SUB CODE: PH NO REP SOVt 005 Card 3/3 ENCL.- 00 OTHM: 001 SHKLY,'J6,VSEI'Y Py-r.31T,icc Do!-s-rization of protons in ho -- I ydraTed- paramaLmetic salts by the method o~ miltiple rapid adiabatlc crcsslng of the forbidden line. Fiz. -1 (MTRA 1815) ,ver. tela 7 no.5il'031-1334 My 165. 1. Fi7iko-tekhnic'neskiy institut Imeni loffe AN SS.",R, Leningrad. _Y4 RP -Ph&" R&UGni at (2); 33 j R.usdanI..-(I) The ms&W fide mad. azid of the phase dL-poatintlity which tikis pl~wd j;b~a'Ughtja reAected fi)om - 9, dkk-ctzicjindt&l inlet ' bbtalned by selera::~-,: - an e 'UtL inde endent method U of th h f thm t * s -:4- j ns , c e a ze o x .q= p Measuie. - givan in the literatute u* shown to ba wrong, ments m given of the aperdea af pb&,w discedidnuity obtafiA when 4ht & raffeited from i~ airjA&-'lnj46j4M- (3) An indmedvo fornuft is dettv thlanan of thin fit= by an Lnwferel Intedemcce method Ls given far doti~ 18 r, F. m 2 2 :7 L 15986-60' EVIT (1) 1 SWT W/TIMP (e) IJP(a) WH ACC NR: AP6005475 SOURCE CODF: UR/0368/66/004/001/0065/0067 AUTHOR: Shklyarevskiy, I. Korneyeva, T. I.; Ryazanov, A. N. ORG: none TITLE: An interferometer method for determining the refractive indices of mica SOURCE: Zhurnal prikladnoy spektroskopii, v. 4, no. 1, 1966, 65-67 TOPIC TAGS: refractive index, mica, interferometer, spectrum ABSTRACT: A method is proposed for determining the dispersion of birefringence in silvered mica From a single Laterference pattern by measuring the wavelengths of the interference lines. The procedure is a modificat';on of a previously proposed method (I. N. Shklyarevskiy, Opt. i spektr., 6, 780, 1959), and may be used for measuring the dispersion of refractive indices 1j, and V~ of mica in the visible region of the spectrum. Equations are derived for determining -these indices and dispersion curves for the indices of refraction are given. The results agree satisfactorily with the tabulated values for the indices of refraction of Ural muscovite. Orig. art. has: 4 figures, 5 formulas. SUB CODE: 20/ SUBM DATE: 19.Apr65/ ORIG REF: 004/ OTH REF: 002 Card UDC; 535..417 1. 31535.-66 -3,4TO-) FQQ fTJ SOURCEt /2789/6 5-/-06-6/6G6/-607*3/oo8o7 ACC NRI A;F6005154 CODE: UR AUTINOR: KorobOv. M G - Shk_ My, V. G. eVB ORG: Central Aeroloiftal ObservqqTy (Tsentrallnaya aerologicheBkaya obdc~~vbioriya) Y udines by the st~~op TITLE: A study of the topography of the upper boundary of clo metric method V/ SOURCE: Tsentrallnaya aerologicheskaya observatoriya. Trudy, no. 66, 1965. Aerosinopti- chesldye i aerologicheskiye issledovaniya (Aerosynoptic and aerological research), 73-80 TOPIC TAGS: stereophotography, aerial photography, atmospheric cloud ABSTRACT, The stereophotog-rammetric method applied in geodesy is employed for the topo!~raphic study of the upper surface of clouds, using aerial photography. Disregarding the physicall f-uctors in the origin of the nonuniformities on the cloud surfaces, the method makes it possiiolc to determine tht'2 altitude of the clouds with sufficient accuracy. It is feasible to measure the height of cloud elements over other cloud elements by means of aerial photography:. Knowlc of the scale of the photographs makes it possible to determine the lengdb of the cloud. waves a-,~ well. Th(-- calculations performed in the article show that the correction device of the stereometer may satisfactorily serve only sme.11-scale aerial photographs. In conclusiori' an evaluation is made of the accuracv of the determination of the excesses of the cloud elements. obtained by the stereophoto.vrrammet~ic method. Orig. art6 has:'4 figures and 14 formulas. L SUB CODE: 04, 14 //SUBM DATE: none / ORIG REG: 004 / OTH REF: 001 Card 1/ 1 TrI.- of I f R~- it - SOV/137-58-12-24qio T ranolation from. Referativnyy zhurnal MetallUrglya, 1958, Nr 12, p 128 (USSR) AUTHORS Vintsel , G . Shklyarinsk.is, D. T,TLE On the Preparation of High-grade Manganese Plating by Electrolysis (K voprosu polucheniya kachesTvenrvkh pokryiiy pri elektroosazhdenil iiiargantsa) PERIOMCAL. Uch zap VO nyussk 1_111-1. Ser maten-i. , fiz, 1 khim n., 1957; Vol 7, pp 133- 137 A,BSTR.t~CT The electrolytic deposit-ion of Mn from -A sulfate electrolyte (El was Investigated A study was made of the effect of the ca!hode cd. the ternperature. pH of the solution, concent ration of Mnzi~ and additives on the current efficiency expressed in terms of the yield of metal and the quality of the coating (C'. A glass membrane was used in the electrolysis; Cu was used for the anode and graphite for the cathode. The optimum composition of the E and the parameters of the electrolysis were established The catholyte was (in g/literl: 'IvInSO4 2 I 4H20 250, (NH4)2SO4 I DO; the anolyte was (NH41-SO4 100; pH3 2 - 8 8; the E was stirred. High- grade C are produced Card I /Z within a narrow range of the cathode-cdIremperature curve 0,vithin SOV/137-58-12-24910 On the Preparation of High-grade Manganese Plating by Electrolysis the range of cathode cd = 8 - 23 amp/dm2 and 0. 5 - 200C); at any given temperature the corresponding cathode cd sho,ild be selected. A deviation in either sense re- sults in a sharp deterioration of the quality of C. The current efficiency increases with the increase in the cathode cd. The pH of the solution rises with the progress of electrolysis; at pH > 8-8 the quality of the deposits deteriorates and E should be acidulated with H2S04. A decrease in the concentration of Mn?-+ ions and Mn ions of a different valence exercises a negative effect on the quality of C and cur- rent efficiency. At 180 and cathode cd = 20 amp/dm?- the current efficiency is 21% when the concentration of MnS04 - 4H20 is 83 g/liter and 33.3% when it is 250 g/ liter Dendrites form on the edges and corners of the cathode as the growth in thickness of the deposit progresses. Addition of glycerol ( '40-50 g/liter) improves the quality of C, whereas addition of joiner's cyl--ie lowers it. A, L. Card ?_/Z SHKLYARNIX, V..mladshiy serzhant Training device for shooting from a tank. Voen-vest. 38 no.11: 80-82 X 158. (MIRA 11:12) (Tank warfare) N GALKIN, 0,; SHKLYAREVS.'Kly, I*W- ~*-kww&4*-,-Y,-W,.~.mw~~ . Change in thn optical constants of 'tin during transition into a state of superconductivity. Dep.All UM uo.6:445-447 #54. (YI-RA 9:9) I.Fizike-tekhnichniy- imstitut AN UMM i Kharkivslkiy derzha-vniy uni- veraitat. Predstaviv diysniy chlen MN MM K.D.Simellnikov. (Tix--Optical properties) J.N. An interference method of daterrahing the refraction of ~Uuld and solid bodies. 1. N. Shkiyarevskil and V. Ic oslavskil. Zhur. Tekh. Fis. 24 1387-91(1054),- semitransparent mirror reflects the jight of a point light source on a set of interferometric plates consisting of glass p;ates coated with Al. The plates are- held by a micrometer arrangement In such a way th:tt the spaces form wedges that are filled with the llq~ld to betestc~, Thereflectedli t. Is measured with& spectroscope. nzanbedetd.tothe4th of ddmal., Curves are presented showing x as a function the wave leugth for ZnS (Wedge eva;d. an the glass plate and aluminized), lodomethylene, ard a 2% s~ln. of an traphioxine-fuchsin dyed S. P.~' s a USSR / Optics K Abs J=% Referat. &%ur-Fizika, 1957, NO L, 10340 Author ERtnel'nikov, K.D.,.Shk1yarel(skiy., I.N.,, Skarobogatov, B.S. Inst Not Given Title Determiration of the OptiC31 of 3,~Ymartur;. Orig Pub: Uch. zap. Kharkovsk. un-ta, 1955, 6~, 13--.-i4o Abstract: The index of refractior.,At of thin Sezmanium filn~ -vas me~_Sured Ily the germanium =wedge method, coated in WLCUM OL gla55 Or On 5il-er. The average value , in the given region Df tYe ze-Jg,~ thickness vas ,4 A /: ' - - - I I k,- ) -where o-,tained from the equation,,7Z = ~ "k mi~:. -4!-k max, ,-k min and tkmax a--e the thicknesses of the vedge in th,- locations of the Mth imt-' rference min-kTrim aad maxi-mum f:)_r a giv~-._q wavelength. For A 590 r~A, the value 3f,- r, is inlezendent of all the way ip to t the order of 4 x 1C%-- cm. a:2~1 eauals 3.6 This shows that the st:nuctur-e of the fiLms In-=H Y.,ot _-hanwe wilh is 4.? and. 'hiclkne:~s . For X, = 690 ar~(~ 550 I.-he of Card l/ 21 z Category USSP/~-ptics Physical Optics Abs Jour Ref Zhur - Fizika, No 2~ 1957, No 4938 K-5 Author Shklyarevskly, .1,N., MJ.I~slavskiy, V.X.,Fakhomova, O.S., Ryazanov, A.N. Title interrerometric Method for Determining the Dispersion of Liquids in the Ultraviolet Region Orig Pub Uch. zap. Ehar'kcvsk. un-ta, 1955, 6, 147-150 Abstract The Iceviously described (Referat Zh. Fizika, 1955, 23123) interfero- metric method for determining the dijpersion of liquids and solids, based on the application of the lines of equal chromatic order, has been expanded to determine the dispersion of liquids in the ultraviolet region. The investigated liquid is introduced into a gap between aluminized quartz plates, which are attached to the slit of an ISP-22 quartz spectrograph. The thickness of the gap is regulated by means of screws. The resultant spectrogram is used to determine the wavelengths of many interference lines.-to determine their interference order, and knowing the thickness of the gap, to calculate the index of refraction for many wavelengths. The crder of the interference is determined by filling the gap half with card 1/2 VMKIN, B.I.;MILINER, A.S.; Rf)ZFMSVEYG, L.N.; Y.AYNJUWr, YA.B.,- EfOUBVICH, V.I.; SHKLY.AR7,VSKIY, I.N. Sections of Experimental, Theoretical, Faid General Physics at the Department of Physics and Mathematiesp 1.930-1955. Uch.zAp.XHGU 60:63-79 155. (MIRA 10:1) (Kharkov University-History) (Physics) "- /. t' t /k ~ SIMINIKOV.-K.D.; SED&AUTSKil), I.H.; KM, E. A. 173"" awwoomwFAW~ Interference of light in thin silver, foils. Uch.zap. KHGU. 64 no.6:127-134 '55. (NM A 10: 7) (Interference (Light)) (Metallic films--Optical properties) SIIIM'NIKOV, K.D.; SIIKLYAREVSKIY, I.N.; SKOROBOGATOV, B.S. Determination of the optical constaats of gormqnium. Uch.zap. KHGU 64 no.6:135-14o '55. (MLRA 10:7) (Germvinium-Optical properties) USSR/Optics Physical Optics. K-5 Abs Jour Referat Zhur - Fizilca, No 3, 15,57, 7698 Author S-inel'nikov, K.D., Shklyarewskiy, T-N., Lupashk.o, Ye~A. Title Optical Properties of Intermetallic ComDoLuids. Z*nc- Antimony CompoiLnd. Orig Pub Uch. zap. Khar'kovsk. tui-ta, 1.955, 64, i4i-144 Abstract The antimonoid of zinc (1) was obtained with S.A. Vek-shinskiy's metho-1 by simultaneous sXblimation of zinc and antimony on class in vacLnuii. A portion of the com- plex film corresponding to I was obtained by measixing the specific conduclivaty, which for I is 2.5 x lo-3 ohm-l cm 1. such Qortions have an increased transuaren- cy T and at thicknesses t ;~;;' 1,000 A they have a brown hue in transmitted light. The dependence of T on /\\ was measured with the SF-4 zDectroDhotometer in the 350 -- 110r) m ~e rnziI-ler of f-ilins of diffe- ,,t, in a larr rent t, and the absurD+_L:_--n c-Deffici.ent, t, X was calcula- ted Card 1/2 28 Abs jczu7 the - (T, /To) L (+ 1 se ' f A 13 t ' o ~ 'U P S i L'C) 11ka - - , nc t ie ta -,;he. Lj ' . h + ' "Y -- - -- ~. t_ _ cl: t-h f' the rail-7Q l'on 20 e tet-jper,,~~tt,, . I - i Card 2,i2 USSR/Optics PhyBical-Optics,' K-5 Abst Journalt Referat Zhur - Fjzjka, No 12, 1956, 35731 Author: Sinel'nikov, K. D., ShkIlyarevsk-ly, I. N.. Vlaaenk. N. A. ins titution: None Tftle: Optical Characteristics of Complex Yaterferenz-e Original Periodical: Zh. tekbn. ftziki, 1956, 26~ i1o 1, 96-1o1 Abstract: For the green region of the spectinm, complex interfer-anc~! ligh-J, filters were prepared, consisting of 3 reflecting layers and. 2 d-J- electric layers between them. The d-ielectric used was bar--'= fluorideY and the reflecting layers were silver. in some cases the third reflecting layer was a multilayer dielectric coating. The optical characteristics of 4qoh light filters were investigated using a matching method previously proposed (Uch. zap. Kh&r-kovsk. gos. un-ta., Tr. fiz. otd., 1955~, 6; 147). The. transmission band was recorded with a DFSJ~ spectrometer w-Lth a di�ffraction g-rating, having 600 lines/mm. it was shown that the-transmi-ssion band rf Card 11/2 USSR/Optics K-9 Abst JouzrDal: Referat Zhur - Fizika, No 12, 1956, 35731 Abstract: complex light 11*Ilters 1.3 5-10 times narrower than in sfmPle I-n+.-r- ference filters (30-100 A instead of 2oo.-.400 A and -the IIMMS- parency j_9 1.5-2 times better (30-6o% instead of 20-30%). The-use of a miiLtilayer dielectric coatin,3 instead cf a silver layer -Irdproves the quality of the filt-e,rs. P_ixthex impr-~-Ment the ovrft.cai characteristics lies al,~ng the path of re~pla--'jcg -,f all the s~.Iver lay-ars with multiple,-Iayi~Ir Car-I 2/2 SHKLYAREVSKIY, I.N. ~,, , Phase correlations on the dielectric-metal boundary. Zhar.tekh. fiz. 26 no.2:333-342 F 156. (MLRA 9:6) (Dielectrics--Optical properties)(14atals--Optical properties) 5,7~ T OF-M URBJ;= awl . OF TM LAYERS OF MC LTIrdM -AMCRYOEM SU 9 and n tekh rtz.,' V61, 26, Md. 656 SchiLIZ ird lichegmer (Absti. Contrary to the fir-dIngs 1762/io5t), ttie autbars have fourd thzt the ~re t v e jader.- of a (as used in mult layer ciaangB) Is thin ZAS fum qual r$j2. - I - . ' % to Uat of Zr.9 to bulk, whereas, the refraaive; tnetex arc Zte IUM depeads cn their tWOmess. rhe "fWIn&I.If4Ctor of - (porous) cryata (Ums, whoa a go re o. have'3-temilUe d wittt t +r" "At tow f0 inacimPt ve a, m the:refmcti'v6 PS its a I (ts'; - - sub tmc~ in its Fares M-Petuvely, Cryolfte 2' ' Whus % IU *e cryaWe an4 - ;d are th~ ira(:W - pores (q, + ih Ims b4c i n fdur4ia J"1664li w expeftment, Otfs flud .proves, 14 turni alit the UqW44 used (glycerol,- pkraffin 60, z4) Poo l; W~ d- 51-4-20/25 AUTHORS: Sinellnikov, K.D.,.Shkiyarevskiy, I.N. and Vlasenko, N.A. TITLE: Complex interference O*ptical -fjlt-~~-rs with improved charac- teristics. (Slo&1rmyW interferentsicnMye svetofilltry s uluchshennymi kharaKteristikam:L). PERIODICAL:110ptika i SDektroskoDiyall (Optics and Spectroscopy) Vol.2) No.4, pp-534-536 (U.S.S.R.) ABSTRACT: This note describes construction of several types of optical filters and is the continuation of earlier work by Sinellnikov et al. (Uchenye ze.piski Kharkovskogo gosudarst- ,o otdeleniya, Vol.6, vennogo Universiteta, Trudy fizicheskog 147, 1955; Zh. tekh. Fiz., Vol.26, 96, 1956). MlD1M2D2M3 filters (Mls are reflecting layers and D's dielectric layers) were prepared as follows: to an MlD1142filter (Dl of barium . fluoride) an M3 layer in the form of a glass plate was attach- ed and D2 was a wedge-shaped layer of air between M2 and M3- The filter was made "consistent" by illumination with white light,observation of-the resuLlting interference pattern via a spectroscope and appropriate adjustment of D2. No numerical values of the characteristics are given. M1DlM2D2M2D114l filters., with Dl of barium fluoride and D a layer of air, similar to those of A.Hermanaen (Nature,-i74, 216, 1954) Card 1/2 were prepared. With reflection coefficients Rl 83% and 51-4-20/25 Complex interference optical filters with improved charic- teristics. (cont.) R2 :-- 93% for M1 and M2 respectively, an overall transmis.sion of 30% was obtained with a pasts band,(centred on 5000,R) of only 45 A and "Contrast" of about 10-2. A method of prepar- ation Of-filtersp similar to that for Fabry-Perot etalons, is also described. Two high-quality glass flats were covered with the usual layers (silver Euld barium fluoride) by vacuum evaporation; they were the MlDjy2 systems. A wedge-shaped layer of air D2 was left between the two plates. Light from a monochromator (of wavelength of the maximum of the filter pass-band) was made parallel bit means of a lens focussed on the exit slit of the monochromator. This light was directed on to the filter. Iffinen 1) was wedge-shaped hundreds of inter- ference lines were visibie. When the two surfaces M2 became parallel the lines disappeared and the illumination became uniform. Then) keeping the plates parallel, they were adjusted by screws to give maximum uniform illumination state). There are 1 table and 6 references (4 0 ("consistent Slavic.) f which are ASSOCIATION: Kharkov State University.(Khar'kovskiy Gosudarstvennyy Universitet. 1'"'k SUBMITTED: September 15, 1956. ird 2Y2 AVAILABLE.- Idbrary of congress Dispersion of the Phase Change of Thin Aluminium Layers. 51-5-15/26 ively, and were obtained for a sample shown in Fig.la. The upper diffuse lines are due to Al-ZnS-air; the lower lines are due to Al-ZnS-Al, with iron lines (for calibration) superimposed on them. These lines are displaced towards short wavelengths by a value which. represents a negative phase change at the boundary ZnS-Al. The phase changeg denoted by *(ZnS-Al), is plotted against wavelength, X , in Fig.4 (the continuous curve represents the present authors' results, the broken curve- the results calculated from optical constants of Al measured by O'Bryan, Ref.5). III and IV in Fig-3 were obtained for a sample shown in Fig.lb,, The upper lines are due to Al-ZiiS-,,U (thin layer:-195 71). They are displaced towards longer wavelength which indicates that the phase change on reflection at a thin Al layer is less than at a thick layer. Fi,g.3, V was obtained for an even thinner Al layer (50 ISQ and the phase change was found to be still less than in III and,IV. On decrease of layer thickness to 50-80 A the displacement of the equal- chromatic-order lines was greater than in the absence of such layers. Presence of such layers on ZnS deterioriates Uard 2/3 the sharpness of these lines. With decrease of the layer Dispersion of the Phase Change of Thin .~,.luminium Layers. 51-5-15/26 thickness the phase change beco-.11es negative (Fig.5, where numbers at each curve denote layer thickness in angstroms). Fig.6, I, shows dependence of the phase change * on thick- ness t (in 11) for X = 5500 1. Curve II in Fig.6 is calculated from the optical constants for bulk Al given by 01 Bryan (5). At the top right-hand corner of Fig.6 two parallel dashes denote the value of * for bulk Al. The results in Fig.6 are taken by tile authors as an indication that the optical constants of thin Al films vary with thick- ness. This conclusion forms the basis of the authors' e�planation of the observed behaviour of Al films. The authors thank Prof. K.D. Sinell.nikov for ad-vice. There are 7 figures, 13 references, 8 of which are Slavic. I ASSOCIATION: Kharkov State University. (Kharlkovskiy Gosudarstvennyy Universitet) SUBMITTED: October 15, 1956. AVAILABLE:Librai7y of Congress. uard 3/3 Doiible refraction of fluoride films. 51-5-16/26 The absolute size of the particles, so long Pas it is smaller ,th, is not important. For many substances than light wavelenp the dimensions of microcrystallites and the distances be- tween them tLre considerably smaIler than visible light wave- length, and therefore in that region one would expect anisotropy of the film. Double refraction was, in fact, found by the authors in films of CaFo, BaF2, LiF, PbS9 V205 and other substances obtained b- deposition on a glass Y base in vacuum.On introducing such a film between two crossed nicols one can observe fairly strong transmission in the field of vision. This transmission is at maximum when the glass with film on it is so oriented that the dir- ection given by the cross section of the plane of the base ,.-tith the plane of incidence of the evaporated molecular beam is at an angle of 450 to the direction of polarisation of the -nicols. Wetting of the film by liquids of various refractive indices decreases the intensity of the transmitted light. The transmission becomes zero on wetting with a liquid whose refractive index is equal to the refractive index A, of the bulk substailce. Double refraction of the fluorlde films may be also studied by an interferometric method. On a glass plate a semi-transparent silver layer is Card 2/3 deposited. On silver a calcium fluoride layer in a form of a Double refraction of fluoride films. 51-5-16/26 symmetrical hill is deposited which is then covered by another semitransparent silver layer . In monochromatic light a system of double rings is observed (Fig.2)'. The equal chromatic order lines are split in a similar way. (Fig-3). The results show that ":he fluoride layers possess biaxial double refraction and that the -plane of the optical axes'coincides with the -plane of incidence of the molecular beam. The orientation of the refractive index ellipsoid relative to the layer of the filia depends on the angle of incidence of the molecular beams on to the base in the pro- cess of the deposition of the film. The magnitude of the double refraction also depends oil this angle of incidence. The results are shovm in Figs.6 - 10. There are 10 figures, and 11 references, of which 8 are Slavic. ASSOCLA,TION: Kha~kov State University (Zhar1kovskiy Gosudarstvennyy Universitet) SUBMITTED: October 15, 1956. AVAILABLE: Library of Congre'ss Card 3/3 51-5-1?/26 A Measurement of the Optical Constants of Tin by an Inter"erometric Method. and mica were used. ZnS was deposited in vacuum at 5 x 10-5mm I~g. Thin leaves of mica were all obtained from the same samnle. The sample was fixed in front of a Tolansky (Ae~.4)spectrograph.The interference fringes were photographed in reflected light. As a result of the phase- charge differences at the boundaries dielectric-silver and dielectric-studied metal, the interference bands due to the system Ag-D-M are displaced with respect to the bands due to the system Ag-D-Ag. The interferometric method C, described here is applicable o-nl- to those metals for which the refractive index jAA- and the absorption co- efficients )ULX are of the same orcLer when the reflection coef-ficient of the metal is not less than 50 t0'6,0%. At small coefficients of reflection the interference lines were recorded immediately after -he preparation of samples. Figs.2, 3 show interference for one of the sampies. Fig.2 corresponds to wavelengths 6500-4800 1 and Fig.3 to 5000 to 4100 The upper lines correspond to the Ag-ZnSAg part of the sample and t1ae lower lines to the -,kg-ZnS-Sn system. For Card 2/4 51-5-17/26 Measurement of the Optical Constants of Tin by an Interferometric Method. ,7here 7L = wavelength in IAA... T~ie results are given in the adjoining table and they yield a value of 2.5 conduction electrons per atom. Students L.Sukhacheva and E.Pavlova carried out the experimental work. The authors thank Prof. K.D. Sinelnikov for valuable advice and interest. There are 5 figures and 7 references, 4 of which are Slavic. ASSOCLA.TION: Kharkov Statue University (khjx&kovs1z7iy Gosudarstvennyy Universitet) SUBMITTED: October 15, 1956. AVAIL,~BLE: Library of Congress. Card 4/4 61-4-11/26 A New Modification of the Polarization Method of Measurement of the Optical Constants of Metals. for the refractive index PL and the absorption coefficient,im in terms of measurable quantities: angle of In ce 9D , azimuth of reduced (relative) polarization I and ph~ise difference between the p and s components after one reflection L . The apparatus used is shown in Fig.l. A monochromatic, parallel, linearly polarized tby poiarizer P, at an angle of 450 to the pL:.ne of incidence) beam falls on plates (1) and (2) wit-A mirrors of the studied metal deposited on them. Tha two plates are attached to a goniometer table; one of them is fixed and the other can be moved parallel ti) it. 'The light, reflected three times by the meta 'lie surfaces, falls on an analyser, A, whose angh! of rotation can be read down to 2 minutes of arc. r is a receiver of radiation. leirst the second plate --s in the position 21. Its displacement to positi(':i 2 makes it possible to obtain quintuplet reflection "' necessary. in the visible region the source of l-_,,ht is the exit slit k0-) of a Card 2/7 monochromator 'YM-2. r" -an prisms serve as the 61-4-11/26 A hew Modification of' the Polarization Method of Measurement of the Ootical Constants of Metals. Cara 4/7 the receiver. This an6le of' incidence was measured several 'times, and a mean value was taken. bjear. values of V wei-e also obtained. linowing Lf $ W and A = - 600, the optical con6tants of the metal could be calculated from Eqs. 6 arric, 7. Mleasurementsof the optical constants of metals for lii~.-ht fallin8 from the glass side (Fig.2) did not differ in principle from measurements using liGht fallinE~ from ~~Iae air side. The authors applied the method to meaL~i%urement of' the optical constants of aluminium in the vis,*IbJ:;a re6ion. These constants --aere Measured earlier by ')'Bryan (Ref.l), in vacuo because a layer of oxida i'~, always present on aluminium in air. To exclude the el"fect of oxide the present authors used the apparatus -.)f' Fi6.2- Aluminium layers .,ere deposited on the slz-I~Loet. AAI and CC' at b x 10-0 mm. lig. To avoid any contai~,,Lnation, for the first few moments aluminium was evapor,.,ted on a special screen and only then on the surfaae of t'I.ie prism of Fig.2. Table 1 Gives the results of measurem-,nts thus obtained (triple reflection with 600)-~j This table gives (in 61-4-11/26 A New Modification of the Folarization Method of Measurement of the Optical Constants of Metals. This shows the great influence of the oxide layers in measurement of the optical constants from the air side. The highest values of the optical constants were obtained from the glass side. O'Bryan's results are lower; results for samples measured on the air 3ide after 6 hoi-.rs are still lower, an~L the results for samples meas- ured 50 days after deposition are the lowest of all. Thb authors concluded that aluminium surfaces used by O'bryan, altho%h r~repared and measured in vacua, viere covored by an oxide layer about 26 R thick. Samples measured in ,.ir after 6 hours and those imeasured after b0 days F.re (.ztii-mtted to have had oxide layers 74 and 97 R thi-(,k respuctively. Tile oxide thickrfews estimated by the p-csent authorz ror freshly prepared .4amples (6 hours aft----r deposition) -were several tinies hii~her than those calculated by Hass (6hef.10) - This is tecause Hass did not ta&c into account thu oxide la-er formed in vacua. The autho--,s thank Professor K.D. Sinellnikov for valuable (Ascusslons and hiE inter,~st- There are 2 figures, Card 6/7 2 tables and 10 i,e fevence s, 4 of -.jh--',ch are Slavic. AL. 51-6-13/25 AUTHOR: Shklyarevskiy, I. N. TITIE: A New Interferometric Method for Determination of the Optical Constants of 1.1etals. (Novyy inter- ferometricheskiy metod op-Dadeleniya opticheskikh postoyannykh metallov.) P.EidQDICAL: Optika i SpektroskoFi-ya, 1957, Vol. III, Nr. 6, i pp. 638-611-0. (Ussi) ABSTRACT: This paper describes a new interferometric method for determination of the optical constants of metals, based on the measurement of the difference of phase- shifts of the p- and s-components of polarized light at two anGles of incidence onto a surface of the metal studied (deposited on interferometer plates). On oblique incidence of light on the interferometer plates a splitting of the equal-chromatic-order lines is observed (Refs.3,4). The magnitude of this splittinS depends on the angle of incidence 9. increasing with increase of that angle. The long- wavelength components obtained on splitting are found Card 1/3 to be polarized in the plane of incidence, and the 51-6-13/25 A New Interferometric blethod for Determination of the Optical Constants of hietals. short-wave length ones - perpendicularly to the plane of incidence. Splitting of the interference lines is due to the difference of the phase-shifts of the p- and s-components, which are produced on reflection froiff the metal. Splitting of the equal-chromatic- order lines can be used to find A , the difference between the phase-shifts of the p- and s-components, for any angle of incidence T. From two pairs of values of A and (P the refractive index ~L and the absorption coefficient ~LX may be found at any given wavelength using the well-knowm equation relating A , (p, p and ~Lx (Eq.6 on p.639). This equation is valid for bulk metal, while the layers on the interferometer plates are thin and semitransparent. To avoid errors due to the thinness of the inter- ferometer layers the following method was adopted. Measurements were made on two identical semitrans- Card 2/3 parent silver films at two angles of incidence. I SOV/51-4-6--13/24 AUTHORS: Shklyarevskiy, I.N., Staranov, N.G. and Padalka, V.G. TITLE: Measurewent of Optical Constants of Silver in the Infrared Spectral Region kl2mareniye optichaskikh postoyannykh serebra v Infrakrasnoy oblasti spektra) FERIODICLL; Optika I Spelctroskopiya, 1958, Vol IV, Nr 6, pp 792-795 kUSSR) ABSTRACT: Optical constants of metals are of great interest in the electron theory of metals if they are measured in the frequency region-which satisfies the inequality given by Eq. 1 on p. 792: 2 4 Vo J.4102 00 -where 'V0 is the frequency of electron collisions with the crystal lattice and 4 is the frequency corresponding to the upper limit of the internal photoeffect. This frequency region lies usually in the infrared part of the spectrum. The present paper reports measurementa of optical constants of silver in the 1-12 j& region using the methods described earlier ~Refs 1, 2). In the first of these methcds (Ref 1) the phase difference A = d - d between the p- and a- components Is made equal to -1800 by multiplasreflection of light by two identical samples. The apparatus used is shown in Fir, 1. Here 8 is the exit Card 1/4 slit of a monochromator aMR-2; Z1, Z2) Z3 and Z4: are aluminized SOV/51-,1-6-13/24: Measurement of optical Constants of Silver in the Infrared Spectral Region mirrors; F and A are a polarizer e.nd an analyser, respectively, msde of piles of six selenium plates which are placed at an angle of the order of 700 to the light-beam; M, and M2 are the samples of the studied metal; B is a receiver. A parallel beam of mono-_-hromati4~ light papses through a polarizer, which is positioned at an angle of 450 to the plane of incidence, and falls at an anglo ? on to samples M, and M2. The angle of incidence is chosen to make mA -1801, where m is the number of reflections from metal ssanplas Under these conditions the light reflected from metal samples may be extinguished by the analy-ser, Position of the aaalyser gives the value Y1 , -which is related to the azimuth of restored polarization T by the relationship tan Y ;Z ~ . ~77 - Knowing the angle of incidence AP, the phase difference L and the a:&irwath I the optical constants car,. be easily calm-ilated. The secon-' method of "rotating analyser" (Rof 2) is based on a conversion of eMptically polarized into circularly polarized light. The apparatus is the same as in Fig 1. By a suitable choice of the angle of inciden-ce TO, for a given wavelength, the condit"Lon mh = -900 is satisfied aad the amplitudes of the p- and s-components are made equal by a suitable Gard 2/4 rotation of the polarizer. Then the light reflected frcm metal Eurfacez SOV/51-11-6-13/24 Measuraaent of Optical Constants of Silver in -the Infrared Spectral Region is circularly polarized. The modulated component -which has paised through the rotating analyser disappears and the recording instrument shows only a constant signal. The azimuth of the restored polari-Lation is obtained as in the first method, but i:f now represe=ta the angle between the chief direction of the polariser and the plane of incidence of light. From measured values of 9, & and V the optical constants F- (refractive index) and ~Lj (absorption coefficient) are obtained. The optical constants of silver layers produced by evaporation in va=um viere measured by both these methods. The results are shown in the table on p. 795 -whose columns give respectively the wavelength (in the anrles of incidence 9, the m,.mber of reflection m, the phase differences -h, the azimuth Y, the refractive Indices ~L and the absorption coefficients AN - Fig 2 compares the values of the refractive index and the absorption coefficient kcarves 1 and 2 respectively) obtained by the pres,ent authors kshown by open circles) with those of Forstarling and PreWericksvz (Ref 7, shown by black dots) and those of Motulevich and Shubin (Ref 6 shown by half -black dots). All these values are shown as a function of -wavelength and they agree Card 34/44 well with each other, except for values of the refractive index in SOV/51-4-6-13/24 Measurement of Optical Constants of Silver in the Infrared Spectral Region the 3'5-6 region reported in RE)f 6. in the spectral region vihare the inequarity given by Eq. I on 1). 792 is satisfied the conduction electron density N is independent of the wavelength If N 1!5 constant it follovs that (e V - fk'~,-2) which should be a straight line. Such a atraigtit line is shovin in Fig 3. In the regior. 5-12 V, the slope of this line gives the conduction electron de-Vqity as 7.4 x 1022cm-3. The experiMerLtal points in Fig 3 in the regii=L 1-6 ~& also lie on a straight line -whose slope gives the cond--- ~~.,ticn electron density as 5.Z x 1022=--',, vhich is the same as the numbe:~ of atoms of silver in 1 cm3- The authors thank K.D. Sinallniko-T fu:r his interest and advice. There are 3 fiSures, 1 table and 8 referen:~A.;~, 4: of -which are Soviet, 2 English, 1 Gennan and 1 American~ ASSOCIATION Kharlk vskiy gosudar8tvennyy univer,3itet Ln. A.M. Gor*-'kogo (KharCv State University imeni A.~A. Gorlkiy) SUEa-TTED: November 15, 1957 Card 4/4 'a.lj r, lc'i-.- 3 h SOV/51-5-5-19/23 ~'IT 11-7 On -.Lu Frobleu Cf of Thic~cLaL;,~ of Thin Lavers Usin-- Equal Chrnzj:~Li1c Ord ~r Linor. (K vopresu ob izm5renii .-ol5hchir- tonkikh Flen-ok i pmxshchlyu liniy cavkio-o klir"..atic~asko-o por yal a~ PSUCIDIC4L: Op!-Iiim i Spa:."roskopiya, 1938, Vol 5, Nr 5, pp 617-619 (USSR) AUS 7: In 1945 Tolansky applied equal chrozz-a--;ic order lines lo ths st-ady of of t plaue surfaces, usinG 1"hite li6ht. Lutier Sin-311nilcwr and Rapp (Ref 2) applied Tolansky's mathod to measureuiew" of t -,in fil,~ls lliopmeed in va-cu c' or glass plates. A scratch is iaada across such a filLa. The filia is i;hon covered (by vacuum daposi-.,ion) by aa opaqua lay3r of silver which repeats the scratch contours fonnia- a Six-3,11 Ste-0. Tha height of this step is equal to the orivinal film "hic~aiqeis second glass plate is covered by a seui-trars parent layer of silver. The two pla-las aru pressed to6ethar and ara placed in front of a apectQrograph slit in such a -v.,ay as "m place the step, referred to above, at right anglea, to the slit. The---e platas are ilhaLlir,ated .~.,ith a par,,~;11-31 beac; of white lic-Int, da-:ails of the Card 113 a 9 p-a I-;..:us !~~r-3 7iver, in Refs 3, 4. An aahra.-.'~tic lens is used to foms Q SOV/51-5-5-19/23 0:1 Probla:,t of of Thic~mez;s of Thin La-,,-,ars Using Eclal Jhroma-:ic Ord ~~r Lin-~i- Card 213 rap bj'~lv:aett i;he -lass plates on to a spectro -raph slid_ -'!he fo~:~il pla_ne of the sp3e-'rogra-,311 caiAera objective tvro s~-,Stafus of equal chrcr_~_,Iic order lines are observed (Fig 1). The sea,_ral-ion ba'~-i,f~cn the ".,, system-F, of lines is a fazction of the ori-irjil film -~hickmess . Wavelengths cf borh svstems of lines vare ~.ie~_suriA in ~ho spac~ral reion 5000-6500 1. 'For auen of the systems a gmsph of fal-ctioll nl)~z is construc~ad. Have Li = ic - 1, where k is +ho iii-Irfaceaco ordor of a particular line. Fig 3 shows such functicnE obtained fro.-i ~is interfero~~ram of F-10-c- 1. The difference be-1-aeL, cr,_4ira`t)s of the tvo st.raight linDs s_~icvn in Fig 3 is aq:ual t-o t1ne cri inal film tLickma-ss t (in the prel-ant c --- s e i -1 .7a s 2 6 0-rh- a U t~-ickriess is of craar of sevaral wavelengths -he air gap "he int-4rferance platei is chosen to i_-ake the m-th line of one sy t-3r_1 _i 7-oln2ide with 'the r.--h line of +he a' er systam, ar. shown in Fig 2e ~h Then -c = Aj(fa - r)12,-vIhara b ia the original filrd thickness and Xi i~ ---a ravelergth a-: -.-,hijh 'he m-th and a-th linet; of the two sys-e~l.,-- SOV/51-5-5-19/23 On the Problew of :-,aL~zurerwit of Yhi6niass of Thin Layers Using Equal Ghromatic 'Order Linas coincide. For tha case given in Fig 2 Al = 6176 R, m. - n = 4 and t = 1.225 The author thanks K.D. Sinellnikov for his advice. There are 3 figures and 5 references, I of which _zra Soviet and 1 English. SUBLaT_'ED ;April 29, 1958 1. Thin fil=--0'ePLP4rement, 2. Thin films--Testing equipment Card 313 3. Spectrophotometers--Performance 4. Mathematics 5. Silver --Applications 67212 sov/58 -16118.1. P~ 0 C) -59-Y Translation froin., Referativnyy Zhurnal Fizika, 1959, Nr 7, p 259 (USSR) AUTHOR- Shklyarevskly, I.N. TITLE-.~ Measuring the Optical Constants of Metals, In the Infrared Region of the Spectrum Using the "Rotating Analyzer" Method PERIODICAL-, Uch. zap. Khar'kovsk. un-t, 1958, Vol 98, Tr. Fiz. otd. fiz.-matem. fak., Vol 7, PP 325 - 328 ABSTRACT: In order to deteinine the optical constants of metals in the infrared region, the author used the rotating polarizer method of Konn (Russ. spelling) and Eaton (RZhFiz, 1956, Nr 2, 14657) in conjunction with the repeated reflection of light from two identical surfaces of the metal to be investigated, Light from the monochxomator passes through the polarizer (a selenium pile), is reflected from the two parallel samples, and passes through the slowly rotating analyzer and on to the radiation receiver. By gradually varying the angle of incidence of the light on the samples, an angle of incidence is found at which the reflected light is circularly polarized, i.e., the signal at the analyzer is Card 1/2 constant. Then the optical constants are calculated from the known SHKLYA.REVJKIY, I. N. Doc Phys-Ilath Sci -- (diss) "C,-,rtain problems of metalloopties." r,-hsrlkov, 19h9. 22 -or) (Min of Higher end Specialized Secondary Education McSSR. Khsrlkov Order of' Labor Red B8nner State Univ im A. IA. Gorlkiy), 150 copies. Lis'. of author's works at end of text (26 titles) (KL, 44-59, 125) -1- .- ..' 51-6-i-13/30 .-LIUTHOCtS Shklyar$73k-y. I.N~ and FadalL-R.. TITLE Yea~,-,reme--it cf the Gr.tical. -'ctr-.tantz sf Co-joar, Gold and Nickel in the Infrared L~$giOP, 01: tne Spec-tr'lm (Izineraniya optichaskikh postoya.nnyk---d madi., zclota i nib-,31ya v infrakrasnoy oblasti spektra) PBRIWICAL: Opti~~ 1 Spaktrcakopiya, 19,19., Vol E., Nr 1, pp 78-34 (USSR) ABSTRACT: The optical con-it-ints cf %oppar, gold and nickal were measured in the reg~cn --~f 1-1-2 u !--y means, of the method described by Shiclyarevskiy at al (Ro:P,n- -1, r5" .YwAittyrorzent.; were mado on a nixaber of pairs of samples an~ c-t' tv,-) refractive index IL and -L-i46 ab,~vrpti-.n index c.. were obtaine,~ The results of measuremeata are giver. in Table2 The saver- columns of each table give the -wavelen~,t!.. %., th-a angle of in-;1don,~a of ttie li&t ip, the number of 7, t~ia phaa-, sti'Aft &, the azztm-oth V, the refractive index ji and the abtcrptlon- indw-, 1,~X. The cptical conetants were calculated from the UGL,a--, .-ro-.mula* (S,:~s 5 and ev Ythich give )i and in term of and A. Thi,:!k layara oi copgar were prepared by vacuum deposlon on glass platoe. b159-surements of the optical constants of copper war* made within five daya. Control measarements carried out on freshly-,.,, Card 1/3 prepared stunplaq yielde, the same optical constants as the measurements SOV/51-6-1-13/30 Measurduant c.' tria 0,~tlcal Cojw~tant-7 cf Copper, C,ole. and Eickel in the Infrared Region of the Spe:ttr---j-, C-Tt aft,!- f-,ve 1%o e-f1*Fj--;t: of a layer of copper oxide a--:ur-.;imfr 1-1-0 fisdrpicn (Rof 6) su~,h a layer should not afft-ct -Iti,3 ~ptj,-al mic.-i than a few par cent. The results kcr ~cpner era glv-.~n i-c-. Ta(,1,5 I and the derived optical constants are Ln Fi- 1, w)-tP.,4 tha represent the authors' dc-t:- re,-)~,a~ent thv3ts of M-3tarling and F r 0 64- a r-J R a f La yard of go' , A; 1. 1,L thi,-k were d apos ited on a -,Ia~5s plate? by va--.-tam I- Ns differenzea -were found between c-rt;--al n--natant3 derived frcv. measuraments made seven days after aLc' ontill-al dariy5d from weasuraments carried out ons after rrazaraticrin of ths sampi-su . rho results are given in Talbl,t ., aui~ the, a6fived cptir--al ;.c-n3tantz are shown in Fig 2. Again open :-irclea denote the present author;., results and the black dots th~ae ~:P FZ:r~atarling ana Freedzrichez (R"ef- 7). Thin layers of nickel ware de-no:31to-d by vanram deposition cn glass plates. The results obtainod are given in Tabla 3 and the derived optical constants in Fig 3? where oDea circles denote the present author.:i I values, and triangles sh-W th U - a optlcal r~-mtants obtainad by Inc-ersoll ~Ref 8) at A= 2 IL. Card 2/3 Measlir amen-% -~f T-h-5 C-coner, Oola arji flj;~kai in tho Infraxed + t~ f-r,!,3 OILO-ArOI13 ill MatalS the raaxation tiines and d ~I f~.O sillrar. They are wi-,~n "roo llod-5,-mt-s and Beatt":~ ;jn;i w;.-r~: (.Rof~ 10,1. Fr~oi tho' 1:1.cwn -values of 11 and" -.4 it If of t1w absorption whers R I'F te~a rof'.Q-ti%,-n oC tine matal. Dapendenca of tha a'-,-Forrtl~,.a A wav!3langth is given for copper, silver, A 12-'L J`Iiq -7)rd;rtAt,j aXj.S copper, gold i ap'-111-9s to alij t. P~-:~knoriledgmenta are made to Pr C;'-~-X S for hi ad s . There are 7 f i gures , 4 tabLw. and %f whIA ar-~ Scr,',3-t, 3 Engliah 2 German I Dutch and SWi.~ITT3U- C I r'! 6"', 24(4); ;,4k'6) SOV/51-6-4-19/29 '0. -iy, 'vdeyen~-o, ~~..A. and Padalka, V.G. ITI, RS - Sh~clyarevu X IITLS; i~laasuramant of t?,,j Cotil-ai --',onj-canth of Antimony in tile Infrared S-Cectral Hegion at -T-V-1~,--~ratizras of 2PO and llooK. (Imereniye optichaskikh postoyanny'kh sur'ray v infrakrasucy oLlasti spektra, or-3 temoerature 290 i 1100K) Optik-a i 10~--9, Vo, G, Nr 5,28-532 (USSR) ix BS MICT: The optical constants cf antimony were ma-~sured at the wavelengths of 1-12 Ii and at temperatures of 290 and 1100K, using the technique described by ;--vary (Ref 3) v,.rhich is ess~~ntuially a measurement of o2 = Rp/RG , at two angles of inciderxe (0 (RD and Rs are the coefficients of reflection for li,~ht polarized in tho olane of incidence and at rightangles to it). Z~vury obt~ii:iad the rafractive (Ii) and absorntion (1,1,j Indices from a systew of t,.-;o equations 2 fi i~?jj and (jL, 14, LP2)- This method of caletilation is laborious and the authors used the method of intersectinr, circles (Rof t). The procedure described here 1// 4 is applicable to tha optical constants of inetals for which Ii A:$ the optical. c-on,stant~'. of antimony satisfy thi-3 condition. The SOV//61-b --i-19/29 ~.'easuremwt of the O~tical ~Ion~-tants of Antimony in th,3 Infrared Spectral RaZiroa at Temperatures of 290 and 1100K ao-)aratus used for measuremwit of the optical constants of metals in the infrarad ra;ion was described ~Rrlier (Ref I). ""he aonaratus used in vaidio,- of antimony differed from that described earlier (Raf 1.) in one rprti,~iilar. instead of t-xo samples on the gonomater table a cryostat was usdd nith one sEuanla in it. Fiv 1 showa the external viow, of the a--,oaratus. Th,3 i'ollowin- details are. marked in Fix 1: the slit (S) of ft monoch.,cmator ZITR-2, a pollarizar F and an analys ar -A , the. cryostat i, and a race' ver B (a ohotores istor or a bolometer). The polarizar aud analyaer consisted each of a uils of selenium plates which had to uza r-:3-placed every 3-4 month-S . Detaile of the cryostat are rshoiqn s(thematically in Fiv 2. Leasurements were made at 290 and 1100'K, (usiriE liquid oxygen in the jacket of the cryostat). The a,.)paratur, had to b-3 adjusted very carefully in ordar to avoid serious errors: first the selenium piles %are adjusted and then the sample. !~easuremants ware made on four samnles: the values of the optical constants of tha individual ssinple differed by no worc- thar. 5-81%. Controi !,;easureniant,,-i'carried out using other methods (i~6f 5j. gave similar resulta. Fig 3 show-,~ the refractive (curves aj and absorption (curves d', indices of antimony aa a function of -wavalr-ngtl-, card between 1 and 12 Ii at temperatures of 290 (curves la, it) and 1100K SOV/51-6-4-19/29 hja~,.s u 1~eaieiit5 of' the Optical- ""011574-Itzi 01' -ntimony in the Infrared Spectral Regicn at of' 2,110 and 11OOK 2,a, i'd). Vito ~;,,Lwo f1rure contains thu vuluou of JL and of' antimony, obta-inod at room tL~niporature and 2.45 p wavelength, by DoinansKiy and Noskov (Ref 6); these are shown as ooints 3a and From the meaii values of the oDtical constants the authors constructed the -oavelength dependence of' the real 2 and imaginary 11L [21ioi%)] components of comolex permittivity; this is shown in Fig 4. Fig 5 shows the waveleng-th depandence of the absorption coefficient A calculated from A = 4,1/[(,, + 1)2 + (111)2] Tha A = f(;L) curves exhibitclwirmaudma which are due to interband transitions. From tha positions of -,he maxima on the A curves the intarband energy gap was calculated. It vias found to be 0.18 eV at room temparature and 0.15 aV at 1101K.. 'This compares well with the Ca rd 3/4 SOV51-6-4-19/29 Leasurements of the Optical Constants of Antimony in the Infrared Spectral He-ion at Temperatures of 290 and 1100K values of O.o5 to 0.20 eV at room temperature reported by Smith (Rof 7". Aciuiowledgineat is alude to K.D. Sinellnikov for his advice. There are 5 figures and 7 references, _5 of -.%hich are Soviet and 2 Engl-~h. SUBMITTED: May 19, 19E-3 -lard 4/4 24(4) SOV51-6-5-19/34 UnioRs S hklya revs lciy, I.N. and Avdayanko, " I TI TiB Reduction of -Reflection of Metallic Coatings (Prosvetle-niye matallicheskikh pokrytiy) PERIODICAL. Oritika i Spektroskoriya, 1959, Vol 6, Nr 5, pp 678-684 (UssR) ABS'rRA.CT: A 1/2 It is very desirable to reduce reflection at the glass-metal boundary in The Fabry-Perot interferometer plates. koe-Ang the reflectivity at the air-metal boundary unchanged. This would improve transmission of the olates and consequently increase -choir speed, contrast and resolving power. Such a reduction can be achie-ved "ry evaporating a thIn film (100-150 1) of silver on a glass plate heated to 300-4DOOC and then depositing the main aluminium layer. Tramsmission of semi-transparent aluminium coatings on glass pre-treated in this my is increased by a factor of 2 to 4 in the wavelength region WO-1100 m1i (Fig 5). Transmission of semi -trans parent coatings of silver can be imoroved by a factor of 1.5 to 2.8 -when these coatings are deposited on glass plates previously covered with 100-11E-13 X silver films (deposited at 300-4000C) or top of vihich very thir. alufainium layers -,are evaporated (Fig 7). Reduction of reflection of interferometer plates proauces a revorsal of interference 14-nen, kFi~; V.). --vine iutansitiez of the ravors,3 line:. are hivhor thazi tkie inta_'.~Atius of linas reversed by o Reduction of Reflection of Metallic Coatings ~OV/51-6-5-;9/34 cutting out the "zerc-ordar" line.S. Th"S Makes it oossible to use reflection interfarometers with a opa(Tue coatinu, in studies of hyperfine structure. One section of tha uaoer deals witn trie optical Pro-)3rties of tnin silver filrns dencsitod on glass plates heated to 1W, LOO, 300 and 4rjCo;;. The optica.L constalats of such films ware found to be similar to the constants recorded eariier for thick silver layers d3posited on hot subctrat,,~s. These films are, granular in structL,.-e as shorr in Fig 2. A6:nuwIed0srt 16 made to Y.X. Sinel~nikov for his ad vi ca. There are 9 fi6ures and 13 reforane6a, 6 of -which are Soviet, 3 Ger,=--n, 1 6nglisi-- aLY-1 1 tr-n-;Iaticn frcmi EnSlish into Pussian. a r-i ,ara 241(4), 24(3" 51-6-6-9/34 1 5 Ov/ "MHORS Shklyarevskiy, 1.17. Padalka, V.G. TITLE: Tiio Anomalous Sk_jn-;7_ff'ect and the Optical Constants of Co:)Der, Silver, .3old and I,-, tho infrared Region (Annmaltnyy slcin-effelcb i o-pticheskiye postoyawiyye inedi, serebra, zolota I nilcelya v infr-tkrasnoy oblasti SDektra) F-ERIODIGAL; Optika I spektroskopiya. 1950, Val 6, Nr 6, pp 776-779 (USSR) ABST,tACT: Recently the authors ;aoasured the optica). constants of copper, silver, --old and nicicf;l at iafrarad wavelaugths and interpreted their results in term.-5 of the class!::Rl frea-alectron theory of Drude (Refs 1, 2). From thes,3 optical constants the authors had deduced, inter alia, the d.c. elec-cri~7al eolld u eti, Vi ties of these metals. These conductivities ,aere foliuo to be :considerably s~rialler than the values obtained directly on massive samoles - The reason for this discrecancy lies in the use of disaarsion fonaulaa of Drude which are valid only for the normal s kin-af fact, ,,jhsn the inequality Is satisfied is the mean free ,vith of electrons and 6 is the death of the "skin" layer). For good conductor,~ at roorr, temperature the Plean free path of electrons may be of the order of the cleptn of the sir-in layer, and at low temperatures this ?7Lth may be ~onsidaraLly larger than 4' , i.e. anomalous skin-effect S OV/51 -6 -66 -9/34 The i'~,ncmalous SIKin--Effect a11!4 the Optical Constants Of Copoer. Silver, Gold and "ickal in the Infrared -Rasion conditions apply. Dingle (Refs 4-6.1 gave the theory of the anomalous sicirl affect and derived the d:s-oarsion formulae for the optical constants of ire-cals in-the infrared region'. Dingle allovied for the f-act that electrons can be reflected from the ms-b-l 3urface both specularly and diffusely. His theory involves a coefficient of spacul~rity p; 2, - 1 for specular reflection and r) = 0 for diffuse reflection. in real raotals p lies between I. and 0. Thtj authors used Dingle's theory and the v~i_-aas of the wpzieal nonstants of copper, silver, gold and nickel, deteriainad earliar, ~Refs 1. 2), to calculate the conduction electron densities IT, the relaxation tiirivq -6 and the values of (1 - p,Iv for these metals khera v is the electron velocity at the Fermi surface). -%11 these on p 779, cols 5, 6 and 8 respectively. -juantities are listed in the tabl, Thaue calculations aere --L-.de an the assi'lliantion that the electrical conductivity of thick metal fiLas depcsited in vacuo is equal to the conduezivity of wassive sarples. Acknoviledg7pent is made to K.D. Sinellnikov, for his advice, There arr. 3 figures, 1 table and 8 references, 4 of which are Soviet, 3 Engli~;h and 1 translation from English into Russian. 0 SMil'TTED: "o,,ember 26, 1958 Card 2/ 24(4) SO','/ 51 -6-G-10/34 ~~jTHOR: -I'mclyarev-skiy, IS. TITLE. iiev: Interferometrit: Method of haasurinr Disnersion of Liquids (Iicv-yy into rf a rorrietri. -has ki y :ietod dispersii zhid~'-osteyj F:,~R_LOJICAL: Outim i Gpel,-troskopiya, 1959, V31 6, IT r 6, pp 780--e-3 (U~_"SR) R T -lard 1/3 I The author at al had already described itn interfaromatric of metsurin,r disoersion of liquids and sol,"ids tfil;-as) in the visible ~Ref 1) and ultraviolet (Ref 21.) region5. it Y:a5 *hown kRefs 1-3) that,althaagh the !aethod has the advantap-a of high soead comnared with the method Q described 1,y 0breJ_'mo,7 (Pef 4.1, it vns not very accurate because the phase shift at the dielectric-uletal boundary was neglected. Tile present paper describes a modified method which dces not have this disadvantare. The effect of dispersion of the phase shif-~ is --illomled for in the saneway .;:s in measurement of thickness of thin films kRef 5". One of the inter- farometer ol;ates is nolished in such ;a vav as to form. a steo of 2-3 thickness ~FiG la). The second plate is In optical flat. T-he inte~w7...; surfaces of tho two plates are covered by semi -trans Da rent layers of silver or alumini-,ua ~tha latter is used for i!iaasuramants in the ultra- violet region). The metal coating on the plate with the step is ruled in several olaces (Yig 1d). The scratchos F so fonaed are used later as a A New Interferometric .-,ethod of Dis,,arrsion of SOV/51-6-6-1-0/34 1: - Liq~airls the dat7,ua marics. The two plates are pressed against each Othe.- and placed in front of a spectrograph slit, as shown in F-iog 2. In the focal plane of the objoi-tivn of' tne s r)o:,*tro grit ph c-uiiara two syqtoiai; of equal- chro:aatic order lives are obsorved; they are due to the two different thickntisa"-.1, of the air ~-Aps. tj Und tA, stown in Fir, la. The plates are Placed oil in object tablo and are itioved In a horizontal direction parallei to th~3 --~laxie of tho coactroZraph slit. 'Xilen one of the scratches P is foo-ised on the slit,the interference pattern disappear!3. '71"len tills hapoens the reading of the drum of the mi::rcraeter screw of the object table is noted aDd in this way two or thrae oositlons cf the scratch qiarks- a-e recorded. The height of the step is determined exactly at several places between the scratelles. This height is deduced fr= t -.-ibere ;k is the -.,nvalength at which two interference lines of ox4er M and n (one f::-am each systm) coincide (Ref 7). Since the wavelength can be found to within 0.1 X, the stop height may be also de'..3rmined -.-;ith the same accuracy. To find dispersion of a li(Tuid it is Dlaced in the ggap between the interferer2s olates, and the interference pattern is recorded for one of the ;places -share the stop height t --s L-nown exactly. T h --t refractive index of the liquid is deduced from the difference between rd 2/3 A rem Interforoyaotric Lethod of Y"eaSurin& Oirror3ion of Li-z2-zids the ordinates of the follo,~;inF, tao curves: m~/Zt = f(X1 anei 2t = tp(X). Such a ~-,rocedure excludes the effect of the dispersion -111/ of the phase shift at the dielertric-metal boundary. The order of interference is determined as follo,,.,s. Lei; Xo and )Ll be the wa-velengths t~ of t7wo neighbouring lines. If the (.-orresponding refr-i,:tj.vg indices of the liquid jLo and ~Ll do not differ too rrich, then m = Al/O~,, - X;), - The value of m shculd be rourAed out to the nearest integer. The true order of interference -.-- equal to (m - 1j, -.s sho,.-;n in Ref 34 -rhe method described abovc- is suitable also for measurements in the ultraviolet region. In this case the source inay be an iron arc or spark. The axoariraental tachnique for this case has a'-read,,, been described (Ref 2,;. G.Y. folyakova and S.T. V,9r,';1,cvtseva tooic xirt in experiments designed to trv out the mothod descrIbed above. Aci:rowledgment. is made to .K.D. Sinellnikov for his ,.idvica. There ara 3 figures and 6 Soviet ref orancez; - SUBKITTED: Deceiaber 26, 195~3- -a rd 3/6 SOV/51-7-4-23/32 'UTMt~;: \,_. L~ hklyu revs kiy, 1,111., Vurkhovtsova, E.T. and Polyakova, G.N. TITLE: On the "Vernier Effect" Obviarved when the Thickness of Thick Layers is -'-aasured Usino an Intarferomatric Ilethod. 0 PMUOD-101.~L: Optika i spektroskopiya, 1959, Vol 7, Nr 4, pp 566-5C,8 (U~~4RJ -0ZTR.CT: in a preceding; paper Shklyarevskiy (Ref 1)' described an interferometric wethod of measuring thickness of thin and tj-dck films. Two plates were used, distance t, apart. A layer of thickness t deposited on, say, one half of one of the Plates, reduced the ai; gap locally to t2, i-8- t = ti - t2- If these plates rare DLaced in front of a spectrograph slit and illuminated with a parallel beam,of white light, then two syst&as of equal-chrowatic-order lines were observed in the focal plane of the spectrograph camera. By selecting the air gaps t1 and t2 it was possible to make one line of m-th order of one system to coincide with ann-th order line of the second system. The wavelength No of the coincident lines and their inzerference orclers determine the layer thickness; t = (m - n)),0/2. Th's formula is indeuendant of the phase shifts (Ref 1). A new Ca rd 1/3 I coincidence betweeL lines of the aqual-chrcozatic-order systems should SOV/51-7-4-N/32 Ort tne "Veraier Effect" Observed when the Thickness of 'Nicir Layers is ~:eeisurod Using an Interferometric !~:fathod occur after k lines of one system and (k + 1; lines of the second system, i.e. the so-called vernier effect 3hould be observed . The authors show that tne eyact vernier affect would be .' jossiDie only ii: tne dispersion of the phase shift wds absent. If such disparsiou occurs exact coincidence of 2iore than one pair of 1~_ne5 is impossible. "."han not even one _ttir of lines is coincident on an interfarogram, the film thickness can be calculated using M)o ax0l t = t1 - t2 7 2 2 0, th a t-no v4bere n and La arg the orders andX N, are the T:~.velengths o~ lines which abaost coincide. Yaglact- of the chase shiiTai in :;q "10) leads to an error in the fifth olaeo. 2his is uni-aporthnt in measureLlenT, of thicKnesses of rho order of several microns as shown by the practical exam-ple of a ZnS layer whose into rf -3 rogram is givan in a fi--.ure on p 568. THa wa,.alar:-ths and the interf-3rence orders of tna almost coircidoat lines Card 2/3 SOV/51-7-L--251/32 on the "Vernier Effect" Observed -when the Thickness of ThicL- Layers is Yfeasured Using an Interfarcmetric Ilethod shown in the fizure, are listed in a table on p 568. The mean thickness of the ZnS layer, calculated using Eq (10) -was 49998-45 1, -which differs only slightl I om 50 000.2 1 calculated using Bq (1) for the A = 5263.18 Acknowledgment is made to K.D. Sinalinikov for his advice. There ara 1 figure, 1 table and 5 roferances, 2 of which are Soviet, 2 English and 1 translation from English into Russian. SUBLaTTED: Karch 27, 1959 C;ard 3/3 yt -Imz of 7 no. GPV on L;.L.7 68889 s/o5l/Woo8/o2/016/036 ni E201~~3A-I. AUTH01"_: ShklyArevskiy, I.N. and Sharano 0 11 TITLE~ of Measuring Optical Constants of Metals PERIODICAL: Optika i spektroskopiya, 196o, Vol 8, Nr 2, pp 239 - 242 (USSR) ABST%1kC*_-`: The paper describes a photographic method of measuring optical constants of metals in the visible and ultra- violet regions. This method is a modification (in experimental technique and in calculations) of the Shkiyarevskiy et al polarization method of measuring optical constants of metals in the visiole (Ref 1) and infrared (Refs 2,3) regions, based on the use of multiple reflection of light from two parallel identical samples. Th;e apparatus used is shown schematically in Figure 1. Whie light from a source 0 proceeds via an achromatic lens L 1 and a polarizer P to reach a sample (2) from which it is reflected to another sample (1) Several such reflections occur between the-Wo samples and then the light proceeds via an analy 68889 S/05l/6o/oo8/oz/ol6/036 F_2yl_~E~2_jant, A Photographic Method of Measuring Optica a of Metals A , another achromatic lens L 2 to a spectrograph slit S . By suitable selection of the angle of incidence on the samples q)l one can find a certain wavelength At for which the phase difference _mA 0 after m reflections from the samp, Los will be 180 C. The wavelength X1 is extinguished by a suitable rotation of the analyser and the value of X1 is found by comparing the extinguished band (line) with a calibration spectrum. The procedure is repeated for a different angle of incidence W'' and a corresponding wavelength %''- is found. In this way we can construct a curve representing y = f 1 (k) f or -AI = -600 (triple reflection, m = 3) Similarly, a curve representing (P = f2W can be constructed for five-fold reflection, when A2 = -36' Using these two curves we can find, Card2/5 for any given wavelength, two pairs of values: 68889 S/051Ao/006/02/016A36 EjOl Y3~lnstants of Metals A Photu,;L,aphic Method of Measuring Op ic 0 'Pi" 'i ~ - 600 and y., 48 2 = -360 The refractive index IL and the absorption index Ii are given by: 2 2 2 1 2 2 2 2 2 2 2 IL (a b + sin (P) -V(a - b + sin (p) +.- 4 a b =~2 2 (a 2_b2+sin 2Y) +. (a 2 b2 + sin 2T)2 + 4a 2b 2 1/2 II)C 2 2 V wh ere b tg Altg A2(s'n (P it g2(Pl sin (P,tg 2(P2) 2(tg A 2sin y 1tg yl - tg Alsin Y2,tg Y2) C a r d'j./-:-) V18211, S/051/60/00 0 016/036 E281/Eg2j ConstiLntS of Metals A Photographic Method oif Measuring ptl and 2 a =Vsin'Tlt g YJ - b2 2b.ctg A s in (p1 tg (P1 (5) 2 (6) sin (p - (sin yl + sin ~P.) 2 If sin 2~O It:Z:: s i n2Y2