SCIENTIFIC ABSTRACT RUMSH, M.A. - RUMSHEVICH, P.V.

• Document Type: CREST
• Collection: Scientific Abstracts
• Document Number (FOIA) /ESDN (CREST): CIA-RDP86-00513R001446020010-3
• Release Decision: RIF
• Original Classification: S
• Document Page Count: 100
• Document Creation Date: November 2, 2016
• Document Release Date: August 22, 2000
• Sequence Number: 10
• Publication Date: December 31, 1967
• Content Type: SCIENTIFIC ABSTRACT


s/o51/6o/Oo9/OAYS2.
E201/E191
AUTHORS: Lukirskiy,.A. Rumsh, M.A. and Smirnov L A
.TITLE: Measurement of the Photoelectric YieA,of Very Soft
~X-ray Radiation N
PERIODICAL., Optika i spektroskopiyaq 19609 Vol 91,No 41 pp 511 515
TEXT: The authors describe a technia.ue of measuring the
photoelectric yield of very soft (23-113 A) X-ray radiation.
Photocurrents were measured with an Allen-type photomultiplier
(Ref 1) which could count single photoelectrons. The power
supply and recording circuits of the Allen multiplier are shown in
Fig 1. The authors give also dependences of the recorded number
of photoelectrons on the amplification factor of a. wide-band
amplifier used in conjunction with the multiplier (Fig 2)~ on
,the voltage between the photocathode and the second dynode (Fig 3)5
and on the location of the point of incidence of a monochromatic
beam on the photocathode,(Fig 10. The absolute number of the
X-ray quanta was,6ounted with a Geiger counter. The photoelectric
yields, obtained for Be, Ni, W9 LiF, NaF, GaY2, SrF2 and NaCl,
are listed in a table on p 515 The yields ranged from 0.7%
for Be subjected to.X-rays of ~3.6 wavelength:to 27% for NaCl
Card 1/2

84691
S10511601009100,510121019
B201/E191
AUTHORS: Lukirski A.P.-9,gumsh, M~A.,. and Karpovich,, 1,,A~
Measur Iement 0 f 'M~ hots
TITLE: 1~oelectric Emission Yield1or
1.54--13.3 A- X-rays
r7
PERIODICAL: Optika i spektroskopiya
1960 Vol'.9, No.5, pp 653-6q
TEXT: In an earlier paper (Ref. 1) the authors-described a
,technique of measuring the photoelectric yield of'ultrasoft
X-rays by determination of the intensity of.X-rays with a Geiger
counter and thenumber of photoelectrons with an Allen-type
elec-tron.multiplier (Ref. 2). The presentpaper describes the.
use of this technique for X-rays of x = 1-54-13.3 1. A vacuum
X-ray monochromator (Ref. 3) was employed; it is shown
scthematically,in Fig-1. Dependence of.the counting rate of art
Allen-type electron multiplier on the amplification factor of the
electronic circuit, on]the place where the X-ray beam fell on the
multiplier photocathode, and on the voltage between,the
photocathode and the first dynode, is given in Figs 2~ 3 and.1t,
respectively. The photoelectric yields were found for Ti,.W,
Pt, NaBr, CsI and STF25 they are listed (in %) in a table on
Card 1/2

8h661
is~o S/020/60/135/001/014/030
B006/BO56

AUTHORS: Rumsh, M. A.p Lukirskiy, A. P., and Shchemelev, V. N.

TITLE: The PhotoeffectlFrom Metallic Cathodes in the Wavelength
Region of From. 1.39 to 13.3 A
PERIODICAL: Doklady Akademii'nauk SSSR, 1960, Vol. 135, No. 1,
-57
pp. 55
TEXT: By mean s. of a.,method described already earlier (Refs. 1, 2)9 the
authors invest igated thedependence of,the quantum yield x.on the glanc-
ing angle 9 of W-, Ni-, and Be-photocathodesVin the range of.1.39-13-3 A.
It was found e xperimentally that the quantum yield.decreases rapidly with
a.decrease of the glancing angle; this function may well be approximated
in the case of small 0 by a cosec 9 function-Fig. 1 shows % sin G = f(g).

In the case of 0
very small a . of
ngles (up to 3 ),'the rapid decreasp the
curves may be explained by the total reflection of X-ray radiation. All
curves have a tendency toward a decrease of x sin 9 with a decrease of 9 of
0
from 10 15 0
to 2 -.3 .The effects observed may be explained by assuming
that, as a result of the absorption of the radiation energy in metal,
Card 1/5

84661
The Photoeffect From Metallic Cathodes in the S/020/60/135/001/014/030
Wavelength Region of From 1.39 to 13.3 A Bc)o6/BO56
'Ifreell electrons occur, which move with avelocity that is sufficient
to overcome the work Ifunction. In'a layer of the thickness dx,.the
energy dE = I(ji/sinO)dx is ab sorbed per time unit, and leads to the oc-
currenc e of dn = WE "freeltelectrons., (I -~90(hc/x) Li _R(Q)j exp(-gx/sin 0)
R(Q) - reflection coefficient, linear attenuation factor; IO=N hc/X
0
intensity of the incident,beam, N - numberof t1r::incident quanta per see,
0
A - wave length, E_ - the energy necessary for theforming of one "free"
electron. For the quantum yield the following formula is obtained;
='he R [1-R(G)]cosec 0. a For X-rays,.R 1(9) = 0, with the ex-
Ea X a+g/sin 0
ception of very small 0, where total reflection occurs. The factor..
a/(a+p/sing) differs only little from unity. Small angles excepted,"it is
possible to ut % -_ (hc/F_a)(V/4)cosec 0; (this relation holds for
9 >,-10 - 15,P)..The numerical results of.measurements are given in a tAble.
In = kX2
-the spectral range investigated here, x Fig. 3 shows
log X = f(log X) (experimentally). The linear course of this function
and the angle of inclination confirm Lthe assumption made concerning the
nature of the effects observed. The authors finally thank Academician
Card 2/5

8h661

30
S/020/60 135/001/914/o
~
B006/BO5

-40

00
43 7

0 0

0
5 0 -
ca

TI

7 10 15 20

Rc.
Card 4/5

ACC NR1 AP7005862
SOURCE CODE: UR/O'i8l/66/Oo8/Ol2/3a7/364~
AUTHOR: Yeliseyinko, L. G.'; Shchemelev, V. N. :,.~hj~_M
_j.,A
ORG: Leningrad State University im. A. A. Zhdanov, ningradskiy gosudarstvenrrjy
univ
ersitet)
TITLE:. Ratio of directional and-diffusion parts of thelfree path of kilovolt
electrons In a solid
SOURCE: Fizika tverdogo tela, v. 8, no. 12, 1966, 3647-3649
TOPIC.TAGS: free path, physical diffu,sion'Lelectron emission, photoelectron, x ray
effect, electron energy
ABSTRACT: Using apparatus described in an earlier paper (Opt. I spektr. v..9, 653'
1960), the authors determine the distribution of~the'electron emission direction in
the case when the photoelectrons are primarily of the Auger type. The secondary elec
trons were suppressed. The varied parameter was the angle between the x-ray beam and
the emitter plane. In the case of the Auger electrons, it was found that the emis-
in a narrow solid angle, whose axis makes an anglem with the normal,to the
plane boundary of the cathode, is proportional to coGm. In the case of.x-ray photo-
electrons, a cosinusoidal variation of the emitting volume was also observed, althougli
this is not quite evident from the theory. Measurement of the energy distribution of
the emissionin two different directions shows that the relation between the number oi-
photoelectrons and Auger electrons is approximately constant, confirming the cosinu-
CaM 1/2

ACC NRt AP7005863 SOURCE CODE: uR/ol8l/66/oo8/0l2/3649/3652
AUTHOR: :Yel.iseyenko L.G..; Shchemelev, V.N. Rums-h., M.A.
ORG: Leningrad State University im. A.A. Zhdanov (Leningradakiy
gosudarstvennyy universitet)
TITLE: The absorption of electron fluxes of,kilovolt energy during
their penetration of a solid body
SOURCE.:, Fizika tve'rdogo tela,' v. 8, no. 32 1966, 3649-3652
TOPIC TAGS: x ray absorption, electron beam, electron.capture,
electron flux, electron.loss
ABSTRACT: Tw.o factors.are pon*s i~ ie 'io'r a decrease.in-the-number of electrons
which can penetrate thin film: scattering, and retardation. To deter-
mine which process is predominant .at a Igiven film thickness, an investi-!
gation was made of the penetration-of electron fluxes through a solid
-.body. The study was based on the i-ray photoeffect of large cathodes.
'The theoretical quantum yield (Xr) of the photoeffdct'- was'calculated'
by means of a formula whose derivation was based on a spherro-ally
symmetric representation. A quasi-spherical analyzer was used to obtain
*the quantum yield (Xr (50)) experimentally under conditions of a 50-volti
retardation. The theoretical_and experimental values were in gcod
Card 1/2 UDC: none

FWUMM
'ACC NR:
AP(00534L)l
SOURCE CODE. Un/01(31/6'j/oo9/vji/or(.1/0 4
17
AUVOR: Yeliscy~nko, L. G.; Shchcmelev,N. N.;,Rumsh A.
M
07G: Leningrad State University im. A. A. Zhdanov (Leningradskiy gosudarst'v6nnyy
univer.~ it eli-)
TITLE: On the ratio of the,mean free paths of fast and slow electrons in alkali-
halide compounds,
S
'rACE:. Fizika tverdogo te 1, 1967, ~171_174
OL la, v. 9, no
TOPIC TAGS: alkali halide,,cathode, photoeffect,,quantum yield, x ray effect, free
path, electron enerGy
ABSM~CT: -1his is a continuation of earlier work (FT-T v- 8, 3649,,,1966'and earlier) f
dealing wit'- the x-ray photoeffect, of bu11W cathodes. In the present . investigation,
by con,-jarir,& the pulsed quantum yields and th e quantum yields of the x-ray photoeffect
proper (,these cuantities were defined in the earlier work) in the x-ray wavelength
ange 1. 10 an-4 the thickness denen,~enc;a of the q7,;sn' ,;;-L yir;!_~s the
T2-
al_'rali-halide ccrnzounds can be much lower than ya-c-hz; of --hr
secondary ellectrons produced by them. In the experiments on the.thickness dependence,;
the Cs! was sputtered on aluminum,substrates. The test results show that at low
thicknesses, all the absorption events are converted into photoemission, and that with
increasing thickness the number of registered photoemission events becomes smaller
Card 1/2

MU-

~111 - - - - - - - - -- - - - - -
P~b-)-----14R~e4- JD,
ACr-MSTOI '0-, A-P5017099 UR/0054/65/000/002/0052 (
AUTHORt Rumsh, _X!_ A._, 7-onorov, P. P.; larubitts, K. iIr9
TITLEt Structure of epitwd&l layers of fftrmanium vacuum-ft2slted a orienting
substrates
SWRCICt Leningrad. Universitet. 'Vestnik.~Seriys fiziki i-kh4i%U-' no* 2.o
-59
2
5
TOPTC TAGSt epitaxial layer; quasixonocryst"ne geratanila mi vacv uvi "depositioni--
twinning orientation, orienting substrate, nucleation twin, electrohographic-stru
ture, hole concentration
ABSTPACTs So far the causes of the twinning orientation found to be.present In
monocrystaJ11ne germanium layers vacuummdepcoited on crystal substrates have not
been traced. (Orientation of this kind is accompanied by a high concentratioxi of
holes and lov nobility In laTera of this type.) To fill, this gap, in view of the
f-onsiderable interest cv-rrently shown in the properties of "monocrystal-Linen Dqere
of germanium, the authors perfomed a detailed ana4sis of electronograms of these
layers with the object of uncovering the possible mechanism of twinning and the de-
La

K7
57003-6-5-----
ACCUSION MEt AP5017099
gree of their development. "Mononcrystalline" layers or germaniumi were obtained
Id
by deposition on chips of natural fluorite, the latter having a tenTerature of
6oooc, in the presence of a pressure of 5xio-5 mm Rg. The layers of germanium
vere then separated from the substrate by a KC1 solution and collected on a mesh
and subjected to a detailed electronagraphic exazination. This examination re-
vealed the layers to have a quasixonocrystalUne structure which involves the ap-
pearance of twinning (nucleation twins) and a large number of defects in the Junc-1
tion region. As a result of the twinning there appear 6 orientations of primary
twins and 24 arlettations of secondary twins. Each of the six primary twins pbys-l
ical-ly adjoins over the lattice planes only one nucleation twin and three second- It
ary tvins, vhile the secondary twins themselves norms.11y adjoin only one primary
twin. KU this indicates that in the process of formation of the Ge layers owing
to the branched tvinaing, defects must appear in the boundary regions of the con-
tacting twins, and these defects may be present in concentrations similar to those
present in polycrystalline Ge layers. This apparently is the reason Vhy the elec-,
trical properties of epitaxially grown Ge resemble the properties of polycrystal-
line Ge layers and thus their practical applications are restricted. It is thus
concluded that it is possible to obtain layers with a small nvaber of defects by I
modifying the techniques for their preparation (degree of vacuum, temperature of
aubatrato, evaporation rate) so as to eliminate tvinning. "7he authors take this
2
r

and c ticaaal o=eIrts'" oriss art* hast figuesp 2 tables.

L 126)45_6c~ E~IA(k)/aFr(l)/EPA(s)-2/Lrir,(k)/F.WT(tQ)/T/MC(t)/,wPR/EWP(b)
Ts --,, : - 7 F',_- 'Jl)lJrIAT
Pz -6/
ACCESSION NR: AP4044922 S/0181/64/006/009/2569/2573
melevi~ 'K.,- Mezhevich~': 'Ao' N.-,-:'
AUTHORS: Denisov, Ye. P.; Shcli,6
Rumsh, M. A.
TITLE: Analysis of the energy composition of x-rM photoemission-
from a bulky cathode
tela, v. 6, no. 9, 1964, 2569-2573
SOURCE: Fizika tverdo%q
TOPIC TAGS: x ray emission, x ray spectrum, photoemission, cathode,
K band, L band
ABSTRACT: The purpose of the investigation was to separate the
parts connected with the K, Lo, Auger# and secondary electrons from
the total photoemission, and to compare the relative number of elec-
trons in each group with the corresponding coefficients in the formu-!
la for the quantum yield. To this end, the method of spherical
capacitor was used to study the energy composition of the x-ray pho-
Card 1/2

ZVI
T,
L 12645-65
JACCESSION NR: AP4044922
toemission for aluminum, chromium, tit&Wum, and iron plhotocathodes~.
'The setup used was described by two of the authors (Rumsh and
.Shchemelev, FTT v. 5, 71, 1963). A graphic procedure for separating
~the various components is described. The results confirm the valid-
ity of the equation derived previously by the Rumsh and Sbchemelev
(ZhETF v. 42, 727, 1962) for the quantum yield of the external photo-.
(-ffe,ct. "The authors thank Academician A. A. Lebedev for interest in
the work and for a discussion of the results." Orig. art. has: 3
,figures, 1 formula, and 1 table.
1ASSOCIATION: Leningradak-iy go9udarstveftny*y uniVariaitet (Leningrad
iState Un-iversity)
ISUBMITTED: 28Nov63 ENCL: 00
SUB CODE: OP, SS NR REP SOV.-- 008 OTHER: 000-
Card, /2

_77
~
L 12640
EWT
t 'EWP(b) Pd,,;6/P
t)AWAI
ACCESSION NR: AP4044923 8/0181/64/006/009/2574/2579:-.
AUMORS: Sbchemelev, V. N.; Yeliagenko.. L& 0.1 Denk23L, Ye. P_~
Rumsh, M. A.
TITLE: Current and pulse measurements of x-ray phot0emission of a
bulky cathode
SOURCE: Fizikaltverdogo telai -vi,- 6o*'nd. 9,.,1964 2574-2579-
4.
datho
~'TOPIC TAGS: x ray..,em ss opp mdtalliq~ hPt
p o oemiss on, P-L __0
electrori-,_
Mu tiplie
ca ode, d elec ric-p dtocathod secqnq~!~_y
electron multiplier
ABSTRACT: It is shown, after reviewing the-earlierAiterature and,--'~J
the various measurement methods, that.the discrop, in, d-io, s -- in-L the
'a:r*e-*_66_-:.i~~i-~cer a
sults obtained from metals and dielectrics t in.. pec'~41
arities in emihsion from these substances. Meta11i6_"~hotoc"ath6de''d
I are characterized by emission of fast x-ray electro'ni; 'Unaccompa_ni4a,,'."~.
1/3
ow-

3.2640-65 ------ -
4044923
ACCESSION NR: AP
~b_ `_~slow t3j~uly-secoridary_ lites~ u
with the aid of sedonddry,-electron-'multipli46ro-~--o a open type".~._-~ -_-A-
fails to record an appreciable partof this emission. . In the cafse""-'1.',',
17"
of dielectric photocathodes, an appreciable fraction of the emissioh.!~~~
1acts consists of purely secondary events, the nurd6er of which in-
creases as the thicknesses for,the yield of x-ray and secondary elec--,A~'
d.1
trons become equalized and as the secondary.emissivity of the ie e
tric medium increases. it is therefore possible to explain the
crepancy between the number of x-ray electrons emitted into va 'um',T".
1from a dielectric and the number of produced x-ray electrons in
dielectrics without resorting to an additional emission mechanisme
!Experimental data are presented for the average nunber of electrons-~_'_
Jper einssion act. The corresponding emission coefficients and f re-..-."
4
quencies of emission acts are tabulated for various dielectrics
(NaCl, KC1, KBr, CaCl, Cal) and me~qfls (A1# Ti. Cre Pet Cot Sne Au,`.X.;.'
Pb, and Bi). The effect of coa irt~gmetals with dielectrics is also
briefly discussed. "The authors thank Academician A, A.-Lebedev for-'~;'_
rard 2-

lea
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Acassiox n.. AFW19841
B/0181/64/006/003/0796/08W
koll=ikov~ Ia. V.; PL=Ii, -A.; 1-buller,, R. L.
AMORS: Shl
TITIS: X ray study of crystallization of sonaconductor glasses of the type
Goy
SOUXE: F_Jzika tverdogo telaa v. 62 no, 3, 1964, 796-Boo
Topic TAGS: semiconductor,, semiconductor glass., crystallization., electric
condueuvity
.ABSTW.CT: The authors have synthesized several compounds with the general formula
AsSeX Gey by a method.described previotisly (R. L. Myuller.and Ye, V, Shkolinikovi
Vestn. LGU., 22., 1i9., 1962). They have compared the x-ray method of detex-mining I
co,-,mleteness of vitrification with previously used methods (density and 3.wr 1- e=. or-J
ature dependane'a of electrical conductivity).- This commaris,on is s==-Ized in
Fig. I on the Enclosure, The comparisoa shows agreement., and the authors conclude
that the process of crystallization may be satisfactorily described by measurements.,-,.
Card 113

ACCESSION NR: AP4009988 S/0109/641009100110148/0154
AUTHOR: Rumsh, M. A.; Tyutikov, A. M.. Shchemelev, V. N.
A
TITLE: X-ray photoelectric effect of a multilayer cathode
SOURCE: Radiotekhnika i elektronika, v. 9, no. 1, 1964, 148-154
TOPIC TAGS, secondary electron multiplier, multilayer cathode, photoelectric
effect, x-ray photoelectric effect, BeO cathode c6ating, MgO cathode coating
ABSTRACT: An-experimental investigation of the effect of the, thickness of MgO
and BeO passivating layers upon the quantum yield of the photoelectric effect (or
.the efficiency of a secondary-electron multiplier) is reported. Wedge -type (from
tens A to 7, 000 A) MgO and BeO -coatings on Au, Cr, Al, and SrF., backings- were
tested. It was.fo.und that: (1) The above effect is not a monotonous function:
thickness curves may have maxima and mirxirna;, (2) The changing shape of the
thickness curves can be explained by (a) groups of electrons with different
Z:d?d 1/2'

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Determination- of thickness-and.~-
B102/Ble
Only, if-the salt layer- thickness7' is o"ll er:--than -the Debye radius ~.S ;depends
ur _11
::qn,the.substratum properties. %:,There are.5,fig so and - abl

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7-f-ACCESSION KRt APS000678 0/0161/64/006/012/3711/3712
AuTHORst Yeliseyenkou L, at- Slidbemelevt Ve. Ituhsh 14 A
U0111 ~'% 'M ~41~
TITLEs Spectral variation of --the x-ray Pbotoe c-Pan
ife't d - det ermiha
tion of the laws governing the Lenard constants on its basis
SOURCE: Pimika t4erdbgo"~teld', --vo. -61 -no. 12t .19641'3711
4,1
Topic TArst 'x ray.
emission
RALCTs-_-_: By th",
Plott XPeXX _r_
effect.-from a JL 6"liod -comp~ar nit-~t
t e.,anq helplot, 8
to
anium~,pho
theoretical values, is- a own a e-Ijenard:.equati6n.
(a -- coefficient of linear attax.ition of the -electrons by e ca
material, C -- constant) should be replaced by the formula
C2 En, with n < 2. -Theexperimental data were obtained with an
strument previously described by some of the authors~'.~ (PTE, No"
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ACCESSION NR: AP5000283.

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S/181/63/005/001/011/064
B102/B186
AUTHORS Rumr~ki, M. A. and Shchemele-i
TITLE; Part 'layed by the secondary emission phenomena in the
p
X-ray photoeffect~of metallio'cathodes
'PERIODICAL: Fizika.tverdogo tela, v. 5j no. 1, 1963, 71-77
TEXT: Earlier, the authors have shown (FTT, 4,2795,1962) that -in the
pase of X-ray induced"photoemission not one but several electrons are
Omitted per absorbed quantumt this being due to secondary emission. 'Two,
~uantun, yields are distinguished. One, designated as pulse quar4:lim
YIdld , is the ratio between emission events and quantum num'ber.kx n/11
4.
The other, called current quantum yield, is given by 3~ - 0/11.where _V ~15
the mean number of electrons emitted per event. A special inatru~ent was
developed for measuring x consisting in principle of a quasispherical
capacitor with a central plane,cathode. A spherical molybdenum grid with
a nickel cylinder is used as collector. Theentire system is contained
in a steel vacuum chamber with two windows closed by beryllium plates for
Card,1/3

S11OX631005/00110111064
Part played by the secondary ... B102 B186
the exit and the entrance of the X-rays. The operating pressure in the
'chamber is not hir an 5-10-6 mm Hg. The current was determ
gher th ined by-
1. ng pens, -14a. The
m
e, qurA' , a coin, ation current, with an accuracy of 10
studies were made with Cu-K radiation from a -A (BSV-I) X-ray tube.
a
Nu ai ained only
_rouls experiments showed that reproducible results were obt
-,Nhen metvils were vacuum-sputtered onto polished glass plates. The
J
following results were obtained:
Photocathodes B1 Pb Au Sn Te Cu Co Cr Al
3.0 2.5 2 .'4 2.4 O.A
7.4, 6.5 7.5 6.7 5.5 1.2 5.0 3.8 0.-
2.2 3.0 ~2.6 2.5 3.7 2.3
In addition the energy spectrum of the X-ray induced electron emission was
in-veutigated . Vne course of the volt-ampere charadteristics of these
letals iz typical. With positive voltages the current is constant and of
-13
the order of --10 a, at zero voltaUe it, is steeper and decreases.almost
step-wise, at -40 to -50v the current becomes constant again.. It remains
Card

S/lai/63/005/001/010/064
BIWIBls6
AUTHORS: Shchermelev, V. N., and
TITLE. X-ray pho'to effect of dielectric cathodes
PERTODICAL: Fizika tverdogo tela, V. 5, no. 1) 1963, 66-70
T-77T An apparatus f.or determining the quantum yield of the X-ray photo
effect is described in a connected paper (R.ef. 1: FTT,5,1,71,1963), here
the same method is us4d to study dielectric photocathodes, made of NaCl,
KC I , Isf CaF Sr ;and MgO. To prepare the first five of these the
F2 2' P2
substance was volatilized in vacuo and.deposited on small aluminized.,
glass plates in thicknesses of 3-4000 A. Mg was burnt in air, and the
particles of I.IgO-smoke were also deposited.on such plates. The volt-
ampere characteristics of the first four photocathodes werevery similar:
they all showed a step at about zero potential, i.e. the current was-
- 12
constant at 6-10. a for positive voltages, fell sharply at V-O,* and
12
reached a value less than 1-10 a atminus,10-15 Y,.this value.remaining
constant in the negative voltage range measured down to -160y. The shape
Card 1/3

S/161/63/005/1001/010/064
X-ray photo efifect oil ... 3102/3186
of the curve is explained by assuming ~that the X-ray electrons are
emitted from a depth equal to the X-ray penetration depth, and that an
additional electron mechanism exists furnishing slow electrons. If the
results of the analysis of the volt-ampere delay curves are compared with
the pulse values (definitions cf Ref. 1) of the quantum yield, which,can.
exceed 1001,~u
for some dielectrics, then it is possible to determine the
contribution of this additional mechanism to the total effect and to,
calculate the number of electrons emitted per X-ray photo-emission event.
These numbers for NaCl, KC1, MgF 2 and CaF2 worked out at 13.2, 11.4, 2-55
and 5.7. The X-ray quantuir, yields K,r = ir/Ne amounted to 0-57t 0-77t
0.18 and 0.44 (in the same sequence); ir is the current of the X-ray
electrons, e the electron charge.and 11 the number of quanta; the quantum
yields of the additional mechanism were.2-07, 2.63, 0-17 and 0.86. It
can be shown that the multi-electron effects are connected with secondarY
emission effects. There are 2.figures and 2 tables..
Card 215

S/054/62/000/004/004/017
B100186,
AUTHORS: Rumsh, M. A., Shchemelev, V. N.
TITLEs X-ray photoeffect of a massive photocathode and determination
of the rules governing the K fluorescence yields of the
elements in the photocathode
PERIOPICAL: Leningrad. Universitet. Vestnik. Seriya fiziki:i khi mii,
no. 4, 1962, 63 - 71
TEXTs A evious paper (M. A.,Rumsh, V. N. Shchemelev, ZhETF, 42, no 31
727, 19627dealt with determining the fluorescence yield,from a study,*of the
jump of the quantum yield of the extrinsic photoeffect caused by X-rays
falling on a massive photocathode consisting of one element. For a photo-
cathode of a two-component compound AB it is assumed thatL I +.ckb holds.
/a
the X-ray attenuation factor.~, On this assumption the X-ray quanta and
fluorescence quanta absorbed by the components A and B are calculated by a~
method of M. A. Rumsh et al. (DAN SSSR, 135, no. 1.960).
Card 1/4 _d ~Jor S03't,,,T-16L) P:jtZ FV.4LU~47-10J

S/054/62/000/004/004/017
X-ray photoeffect ... B104/B186'
~E' + !L. Ska - + !Lb Skb
X sin 0 - -Lk=- - We, + ~- +
al Sk. 22 SAra a3 Sk. a4 Skb
LA& Skb (A)[ Skb +
40 A.) We
Web+ -L- - We.) Y.( -L+ .) T (6)
a Skb asskb a7 SkOl
Skb Wrb) + T(B) -eb)
+ Web + a all a
Skb 29 Skb aIO
is obtained for the quantum yield. ~s k is -the ratio between the total abscrpo.
tion by an atom and the absorption by all its shells other than the K shell.
The indices a and b refer to the components A and B.. w .(i=a,b) is the
el
Auger yield; Mis a function of the angle of incidence and the attenua-
tion factor. )c shows a jump
~2 Pb (Skb 2 IAb (Skb Web 2 1-b
E31. + - E + Es' + - EI y( B) (I w&) th
Ska Skb 4 skb
+
_Ea E2 11b 2
3 E 6
Ska SAb
(7)
+ IP 0 "b) 1012
hb
6
Card 2/4 Tla'e3+ Skb

S/654/62/000/004/004/017 :7
X-ray photoeffect ... B104/B186
at each absorption edge. From this jump
E2 (B) E2
(B) + O(A p (A) Ig G'- H
6) 7b 12 k
k E32 (8), 7e1 = .-,
Ska E2
H
Web )Lb= -0 E2 W) E211 - I(B) E2 La 2
0 la, 12 Ska
SAb
+ tAb (511b - + Jb (Skb - 2 11b 2
F 23 1 WebE; + -H60~
SAra Sk& SO Skb
2 2
H-1 (A)E72 + M) Skb - E 2+ 46-1 WebE9 + E10 (9)
Skb Skb
0 Web) T!Plel I + TV) E212)
are obtained for the Auger yields. w 0.8010.017 and W 0.870!P.41
eC1 ieK
is obtkined for the Auger yield from the experimentally determined jumps
C'
O~ - 2.23.+t0.05 and fi-j - 3.91-+0.05 of the quantum yield of a K and C1
k
photocathode. The linear X-ray.attenuation factors were determined
according to Johnson. If theyaredetermined with the aid of a formula of
Card. V4

S/07o/62/007/oo6/007/020
E132/~435
AUTHORS: Rumsh, M.A., Novik, F.T., Zimkina, T.M.
TITLE; The structtiral characteristics of single crystal layers
of CdTe
PERIODICAL: Kristallografiya, v-7, no.6, 1962, 873-877
TEXT: CdTe was sublimed on to,crystals of NaCl, cut to expose the
(111) faces and heated to 200- 300*C. : S.A.Semiletov (Kristallogr,
no.3, 1956, 3o6-310) had earlier shown that CdTe can exist in
the spbalerite and wurtzite modifications. Since the two phases
cIan coexi3t by having their.close packed planes parallel to the III
of the NaCl substrate the preparations could not be.said to be
two-phase. Nevertheless, there were anomalies in the electron,
diffraction pattern i.n the form of extra reflexions and -streaks.,
The metal film was stripped, from the NaCl and examined by
transmission. The electron-lbeant passed'in the, direction of the
cubic direction, hence rcflexions for which h + k + I = 0,11
.fell ii~ the Ewald sphere for the cubic form. For the hexagonal
form reflexions with Ih k = 3n coincide with those from the
cubic form. Cubic .,reflexions 202 etc. had six spikes extending
about one third of the way~to the next reflexions.associated,with
.Card 1/2

S/07o/62/007/00.6/007/020
The structural characterisfics ... E132/E435
them. It was shown, and'confirmed by tilting the specimen, that
these sjAkes are the trace's of lines of density in reciprocal
space radiaiing in.the ocia:hedral directions from the common
reciprocal lattice points in the [Ilil directions- The effects
,are caused by the stacking'of the layers, sometimes in the cubic
-sequence and sometimes in the hexagonal. , However, some extra
spots may-occur when the 1~exagonal basa .I plane coincides with other.
of the octahedral planes Of the cubic form than that parallel to
the substrate. There are 5 figures and 1 table.
ASSOCIATION: Leningradskiy gosudarstvennyy universitet
(Leningrad State University)
SUBMITTED: March 5, 19.62
Card 2/2

5/161 62/004/008/039/041
B108/B102
AUTHORS z Rumsh, 1*% A., and'Shchemelev, V. N.
TIT:2: The Auger effect yield from the chlorine and potaosium K-shells
and its determination from the quantum yield jumps of the
x-ray plfotoeffect in a massive KC1 cataode-
?ZaIGDICA L: Fizika tverdogo tela,*v. 4, no. 8, 1962, 2281 2282
TEKT: In orevious vior M 1962) the authors have establi--ind
k (ZhE , 42, 727,
a theory of determining the Auger effect yields w from the-quanWm yield

jumps in. e
the x-ray photoeffect of elemental photocatha~es. This theory is
expanded to compound photocathodes, in parti.cular to KCI. The quantum
yield jum p correspondirg to the K absorption edge of chlorine involves
(C1)
only one he chlorine
unknown, namely the-Auger effect yield w from t
.
K-shell. In the case of potassium,~this jump involves.two.unkno;vns:
(Cl) (K (Cl)
1111
and Thus, w .scan be determined from the measured quantum
w
e (K) (Cl)
yieldJum p in chlorine, and w can be calculated from w and from,the

Card 1/2 e

3/1-1/62/004
B125/Blr%4
Rumsq, 1.7. A. and Shchemelev,
-----------
TITLE': The dependence of the quantum. yield of the Z-ray photoeffect,
in a solid cathode on the X-ray polariZation
PEEIDDICt'IL: Fizika -,.verdogo tela, v- 4, no. 8,- 1962,~2050-2058
X T Vna influence exerted by,the.directivity of photoelectrons on the
qu.,ntum Yield is studied by observinE tine variation in the quantum yield
caused by a change in X-ray polarization. N quanta of a monochromatic and..
partly pol,rized; radi"ation are assumed to hit a photocathode at an angle .2
The range of anl&les (q, ',j+ d'?) characterizes -.he s-.ata olf -pol_arization
relative to the plane of incidence. Then, allo%ring f 6r' the emission. caused
photoelectrons and AuYer electrons, the expressio-I
PL Ct9 E) (1)
2 6
S,
S,i-n
%lard 1/3

S11811162/004/006/008/04 11
Th, adetandence of the quantum... Bt25/BI04
is obtained for t'-e q~aantura yield. Here, and 0~72 are the attenuation
factors of electron currents-with the anerEy oil pnotoelectrons and Auver
electrons, respectively; S, is the K-absorption edge of the phrtacath.3a"O
material; i.,, is the Luger yield of the K-shell. At 21~. GOO, crea,.-hes its
Leos 9
Minimum! value 4,~~in,and -'cm 2 -s valid instead o.1- (41)
In -v
describes the effect of polarization of' the incident
(11) is to be ra~lacad by a more general formula if the .,.ravelength of the
incident radiation i3. shorter than teal. of tne Y-absorptJ or, e:'Ee of the
73hotocat!-,ode material. ~ fter determaininlc- the first and -I-th ord'ar
~;Vely, the tab-ulated
raf'lection quantum yields 1-1 and respec-
down len's-ths L and the mean Dhotoelectron enorgiiLs are obtu~nad with Z"".a
aid of the ex7:--.essiori
IiL ctry E) (it, (24 j) ID (2~jj,
Card 2/3

S/ 1 1621004100810' 5/041
Uantum,.
The dependence of the C
B125/B104
,OnOnco in t~,e quarturil yields of 1_st and n-th orders . Any
,fOr ~he dif
chan-e in tilfj polLirization of Pilo tooloctruno will change tho
the ohotocathodd. If the photoeffact io 1~roclucod chiefly by AuCer
oloctroms, the quantum yield will bi.,virLually i-dependont of the X-ray
Oularization. There are 4 figures and 1 table.
~SCCIATION: leningradskiy gosudarstve
, nnyy univor,itet (Leningrad
A
State University)
S U 3 1- T TED February 27, 1962
.Table. I.easuriad and
calculated data. W L, A
La6end: material
T! Fe K~ 0.90 1.12:to.o- 10 ~00
o-f Photocathode; !2:�_0.715O:L2G,
Ti K~ 0.35 1.05:LOILU2,
(2) radiation. Cr Fe K, 1.35 11.007-.0., ^'0 o ;30
Ti K~ .06 5 ~~2 5160
OAS 1.11-_~O. - _!:3011 3soo
~Card 3/31

S/05(;/62/042/003/014/049'.~""--.~l.
B100102,
AUTHORS: Rumsh, hl. A., Shchemelev, V. N.
TITLE; Determination of the fluorescence yield by measuring the
extrinsic X-ray photoeffect on a massive cathode
PERIODICAL; Zhurnal eksperimentallnoy i teoreticheskoy fiziki,.v. 421.
no. 31 1962, 727 - 735
TEXT: The various groups of photoelectrons in the extrinsic X-ray photo-
effect of a massive cathode are analyzed. The role of the various,groups1'-'-11-'---
of electrons changes with the X-ray wavelength. When the wavelength of
the X-ray emission passes the wavelength of the K-absorption edge, the,
contribution of certain ~~7'20
electron groups to the extrinsic emission
vanishes, and the quantum yield changes,discretely. It is,shown experi---
mentally that the discontinuouschange of the quantum yield is directly
related to the yield of,the Auger effect, and that by measuring the
quantum yield jump of the extrinsic photoeffect it is possible to calcu-
late the Auger effect yield or the fluorescence yield. By an example it
is shown that the Auger effect yield of Cr, Tip V, and Mup or the
fluorescence yield,.are in good agreement with the experimenta,l,datas
~Card 1/2

9
Determination of the... B100102
Element
K jump of
K jump of
Fluorescence
absorption quantum. yield
yield

Ti 9.2 5.9 0.22
V 9.1 5-75 0.24

Cr
8.9

-55 ,

0.26
45
Mn 6.6 5.36
0.28
Thesq data are given in the units as stated in the experimental investiga-
tions (F. SusorG.:Chai-pakJ. Phys. et Radium, 20, 462, 1959; 17. F. Frey et
al.,Jhys. Rev., 113, 1057, 1959; H. 11agedorn,T.Konijn, Physics, ?J, 1069, f,
,.

1957, A. A. Konstantinov, Tezisy.
X Vsesoyuznogo
,soveshchaniya,po yadernoy ;
50
spektroskopii, X., Izd. AN sssa, 1960). Academ ician A. A. Lebedev is
thanked for-his interest. There: are,5 figures, -and 14
references
.1 table, .'
8 Soviet and 6 non-Soviet. .
,
ASSOCIATION: Leningradskiy gosuda rstvennyy univ ersitet (Leningrad State~'

University) t
SUBMITTED: October 21, 1961
Card 2/2
,0

33343
S/181/62/004/001/010/u)-
B102/B138
1617144
(/0 Y-3 20
AUTHORSs Rumsh, M. A., Shchemelevf V. N.p and Proys, Kh.
TITLEs Determination of the absorption coefficients of an electron
flux in a solid from the regularities of X-ray photoemission
of a massive photocathode
PERIODICALt Fizika tverdogo tela, v, 4,,no- 1, 1962, 62 68
TEXTs In a previous paper (DAN SSSR, 55t 1960) the authors have
ahown.that X-ray induced external photoeffect may be described by
No 2tX a sin 0
7sTn f3
where:9 is the quantum yield, which is equal to the ratio'between the
numbern of X-ray photoelectrons emitted into vacuum and number N of in-
cident quanta; R(Q) is thereflection coefficient which is nonvanishing
only for small 9, p is the linear absorption coefficient for X-rays,
S is the mean energy neceseary,for release of one electron, X-ray
Card 1/4

33343
S/181/62/004/001/010/052
Determination of the absorption ... B102/B138
wavelength anda linear attenuation factor of the electron flux For
R(Q) - 0, Wing K/(1 +,a/asing), where K joins all angle-independent
quantities. a.can be determined by two independent,ways: (a)jr, is
sin s1nw
1 2
measured for 9 and G then a _jL A -it sing /Y. sing
1 2 1 1 21 2
1 - A
~(b) A photocathode is' used consisting of a piece of substance II coated
with a layer,,x thick, of. substance I. If 00