SCIENTIFIC ABSTRACT PRESNOV, V.A. - PRESNOV, V.A.

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December 31, 1967
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SCIENTIFIC ABSTRACT
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89695 S/139/6-1/000/001/003/018 Methods of Obtaining p-n Junctions. E036/E435 potassium 1w90 V, Li ^030 V, As - 20 V. These differences cannot be explained by differences in the initial resistivities of the germanium. The growth of current is attributed to: 1. tunnelling by a Zener mechanism; 2. impact ionization of atoms within the junction by the current carriers in the strong electric fields of the junctions, In diodes prepared from material of greater than 0.5-n cm the current growth is by impact ionization. The differing critical voltages are due to the differing depths of the energy levels associated with the impurity atoms. This depth determines the field at which ionization occurs. The dynamic characteristics of diffused Ge diodes and alloyed Si diodes are shown in Fig.4; the static characteristics are plotted in Fig-5, I mA cm-2 vs V in volts. Ga-As diodes of the p-type have characteristics resembling those plotted in Fig.4. The method of producing alloyed S! diodes is not detailed, reference being made to work by M.P.Yakubenya (Ref.3) where the wetting properties of titanium alloyed with Ag, Ni, Cu etc ( the "active phase") are discussed. In earlier work of the author (Ref.1) this system had been applied to Si and the nature of the bond between Si, the active phase and the Ti was investigated, The system has Card 5/8 89695 S/139/61/000/001/003/018 Methods of Obtaining p-n Junctions ... E036/E435 rectifying properties, the Ti apparently behaving as an acceptor. There are 5 figures and 3 Soviet references. ASSOCIATION: Sibirskiy fiziko-tekhnicheskiy institut pri Tomskom gosuniversitete imeni V.V.,Kuybysheva (Siberian Physicotechnical Institute of Tomsk State University imeni V.V.Kuybyshev) SUBMITTED: September 22, 1959 Unitially) June 20, 1960 (after revision) Card 6/8 S/139/61/000/001/003/ol8 IMethods of Obtaininz u-n Junctions.. E036/E'135 ArM f4v A 'If V. I All PHC. 1. Pitc. 4. Fig.4. -Card .-7/8-- lethods of Obtaining p-n Junctions.. Card 8/8 89695 S/139/61/000/001/003/018 E036/E435 P)m 5. Fig-5. S/200/61/000/001/004/005 D223/D305 AUIT.Ua6~ Vertoprakhov, V. N., and Presnov, V. A. TITLE: On the anisotropy of the transverse photomagnetic effect in germanium PERIODICAL. Akademi-y-a nauk SSSR. Sibirskoye otdeleniye. Izvestiya, no. 1, 1961, 121-122 TEXT: The photomagnetic effect (FME) was discovered and investi- gated by Academi-c�an 1. K. Kikoin-(Ref. 1: DAN SSSR, 3, 418 (1934)): He showed that in.addition to the usual photomagnetic effect there ex:Ls.ts a side FME (Ref, 2: 1, K. Kikoin, and Yu. A, Bykovskiy DAN SSSR, 109, 735 (1956)), The essence of the latter conclusion is that when a thin plate of germanium--is-illum:Lnat-ed and placed in- side a. magnetic- field- whose direction- forma -a certain angle c4 with the illuminated-surface. then.besides the ordinary induced emf, a transverse electrical field results whose-direction is parallel to the appl-ied-magnetic filed. When a . 0, the transverse FME disap- pears.- Experimental work on monocrystalline samples of Ge (Ref, 3: C ard 1/6 22678 S/200/61/000/001/004/005 On the anisotropy... D223/D305 1. K. Kikoin, and Yu, A. Bykovskiy DAN SSSR 116, 381 (1957)) has shown that except for zero value when M = 0, germanium possesses a-marked anisotropy and it was shown that transverse ME does not conform.to the theory of Kikoin-Naskov Z-Abstracter's note.- Theory nQ-.dp.fined_7, A. A. Grinberg (Ref. 4: FTT, 2, 153,(1960))cormects this phenomenon with anisotropical change of resistance in a wag- netic.field, His theoretical approach to the angle effect on RIE has given results in close agreement with the experimental findings given in Ref. 3: (Op.cit). The experimental results are given in tabulated form of the investigation of FME,anisotropy on the samples of n-germanium (these results were reported at the Vsesoyuznaya konferentsiya. po radioelektronike (All-Union Congress of Radio-Elec- troni-cs) in Kiev during January 18 - 25, 191;5)whose illuminated surfaces-were parallel to the crystallographic planes (100) and Abstracter's note: Numbers refer to Miller's indices-/ (110) Z These were compared with the theory suggested by Grinberg, crystallographic plane (111) the results obtained agreed with the results of angle effect on RIE given in works Refs. 3 and 4 (Op.cit) The samples were cut from monocrystalline ingot of Ge. (IP = 8 ohms. Card 2/5 2 2 67 --" S/200/61/000/001/004/005 On the anisotropy... D223/D305 cm) and 12 discs were cemented together with tin on a common axis through a symmetrical center of determined crystallographic direc- ti-ons. Aft-er corresponding chemical treatment of the surfaces with perhydrol, to remove the layer cracked by mechanical treatment, the samples were placed in a uniform electromagnetic field, the disc bases being parallel (rA = 0) wi ,th the dLrection of magnetic field. The angle effect on the potential of FME was measured when the side of the - disc was.. illuminated with a white light in a magnetic f lux of-5000 gauss. Considering that samples were cut to the accuracy of a few degrees, then agreement of the angle effect on transverse FME with the theory (Ref. 4.* Op.cit) can be taken as proved. The tensor components.,T~iklm calculated according to Grinberg for planes-(100) and.010) are given in the table below. The samples were used-to measure-the resistance change in the magnetic field at differently orientated vectors of electrical and magnetic fields and.results obtained agreed in the main with publ-ished data (Ref. 6-- G. L. Pearson, H. Sulh. Phys. Rev., 83, 768, (1951)); (Ref. 7: R. G. Annayev, A. Allanazarov, DAN SSSR, 118, 47 (1958)); and (Ref. 8: R. G. Annayev, A. Allanazarov, DAN SSSR, 132, No 3, 557, (1960)) Card 3/5 On the anisotropy... 22678 S/200/61/000/001/004/005 D223/D305 On the basis of this investigation the area diagram of anisotropic photomagnetic effect was constructed; it was found to possess 6 maxima- in plane < 100 > and 8 minima in plane < 111',), . It is pos- sible that further analysis of FME could result in revealing the forms of isoenergy planes (surfaces) in investigated material, The authors express their gratitude to Ye. It. Samoylov for his assistance. rAbstracter's note; Essentially a complete translation2 There are 2 figures, I table and 8 references: 7 Soviet-bloc and I non-Soviet- bloc. The reference to the English-language publication reads as follows: G. L. Pearson, H. Sulh. Phys. Rev.. 83, 768, (1951)~ ASSOCIATION: Institut neorganicheskoy khimii, Sibirskogo otdeleniya, AN SSSR (Institute of Inorganic Chemistry, Siberian Section, AS, USSR); Sibirskiy fiziko-tekhnicheskiy institut pri Tomskom gosuniversitete im. V. V., Kuyby- sheva (Siberian Institute of Physics and Technology, State University of Tomsk, im,. V,. V,, Kuybyshev) SUBMITTED: August 21, 1960 Card 4/5 9, A13 6 0 (3 2, Z,3 //37) IZ& - W3 1-- 21513 S/139/61/ooo/o02/00/ol.8 E032/E414 AUTHORS% Krivov, M.A., Malisova, Ye.V., -rxesnov. V.A. and Synorov, V.F. TITLE: A Study of Some Physical Properties of PolycrystallIne GaAs PERIODICAL: Izvestiya vysshikh uchebnykh zavedeniy, Fizika, 1961, No.2, pp.66-70 TEXTt This paper was first reported at the Third Conference of Schools of Higher Education on Semiconductors and Dielectrics, Leningrad, 1960. The resistivity, thermoelectric power and the Hall coefficient of polycrystalline specimens of gallium arsenide were measured, The original material was synthesized directly from arsenic and gallium and was zone refined six times (this will be described In a separate paper). The final specimens were rectangular in form and their dimensions were 2 x 2 x 7 mm3. The resistivity and the Hall coefficiint were measured with the aid of ohmic tin contacts fused into the specimens in a vacuum at temperatures of the order of 6oo to 700OC- Before measurements were begun, the specimens Card 1/6 21513 S/139/61/000/002/008/018 A Study of Some Physical 9032/E414 were immersed in a solution containing 20 ml of NaOH and 4 M.1 of 30% H202 (G,K.Averkiyeva, O.V.Yemellyanenko, Ref.1) After this treatment they were washed in boiling distilled water,, Fig.1 shows the temperature dependence of the electrical conductivity and carrier concentration calculated from the Hall measurements under the assumption that the hole concentration was negligible. It is estimated from the slope of the curve representing concentration as a function of temperature that the activation energy of the donor impurities was 0.12 ev. Fig.2 shows the thermoelectric power as a function of temperature for two gallium arsenider specimens at different average temperatures. Using the Pisarenko formula (Ref.2) the magnitude of the effective mass of the carriers was estimated to be of the order of O~27 m0. The experimentally determined temperature dependence of the concentration was compared with its theoretical value computed from the formula Card 2/ 6 S/139/61/000/002/008/018 A Study of Some Physical ... E032/E4i4 K A + + A('(IV.'- Na 112 0-68 n 2 K, = (2rm-'k Tlhl)',' e- lrjtlkT where NA and Na are the donor and acceptor impurity concentrations, nre" is the effective electron mass, and 'aEA is the donor activation energy. it was found that NA = 1.18 x 1018cm-3 and N. =_1.10 x 1018cm-3. _n addition, the contact potential difference of gallium arsenide specimens relative to a standard platinum electrode was measured. The measurements were,carried out on polished and etched specimens in air and in vacuum at various temperatures in the range 20 to 850C. Fig.4 shows the temperature dependence of the contact potential difference of germanium and gallium arsenide in air, The continuous and dashed curves refer to etched and polished specimens respe6tJvely. Fig.5 shows the contact potential difference as a function of air pressure after etching'. Fig.6 shows -the variation Card 3/ 6 21513 3/I39/6i/ooo/co2/oo8/oi8 A Study of Some Physical _;,C7z/zq14 in the contact potential difference on heati-ng in vacuum. A quantitative analysis-of these results i., not given since the specimens were polycrystalline and tht! rest.-Its are therefore said to be "not entirely reliable". The general conclusion is that changes in the surface properties of gallium arsenide are associated with the properties of surface compounds formed during the etching process and subsequent adsorption of components from the surrounding medium. Students I.A.Vinitskaya and L.Ye.Smirnova took part in the measurements. Acknowledgments are expressed to the Senior Scientist of SFTI, Candidate of Physical Mathematical Sciences A.P.Izergin and Engineer V.A.Zgayevskiy of: the Technical Division for taking part in discussions of the results. There are 6 figures and 6 references: 3 Soviet and 3 non-Soviet. ASSOCIATION: Sibirskiy fiziko-tekhnicheskiy institut pri Tomskom gosuniversitete imeni V.V.Kuybysheva (Siberian Physicotechnical Institute at the Tomsk State University imeni. V.V.Kuybysgev) SUBMITTED: October 17, 1960 Card 4/6 t, !~Z343 EWP(J)/EWT(1)/LW(k)/EWT(M)/BI4/EW(~)-2 AFFTC/ASI)/ESD-3 Pc-4/11,4-~4 MVATAR(9Y_.._ s~ACCESSIOWNR: AT3003003 sliiiiel6ildbdl I t8/62b5 -AUTHOR: KaWev, G. A.; Preesnov,, V., A.; Cheglokcrr, Ye. ZWevskiy, V. E.1- patuyem, 1!TITIE- Effect of plwsicochemical conditions of surface on the parameters of ~Igermanium p-n junctiondt[neport of the All-Union Conference on Semiconductor Devices held in Tashkent from 2 t6 7 Octob~F ~11T SOMM: E1ekt=nw-dY,*rochW*ye perekhody* v poluprovodnikakh. Tashkent,, Izd-vo ssn,, 1962' 198-205 Ali Uz I TOPIC TAGS: germanium transistor, germanium transistor fftabilirALtion. ABST%CT: Complex chemical and adsorption compoinids deteimine the concentration f and position of energy levels of imp=lty centers and also the recombination cc-tditions and conductivity of the semiconductor Theoretical and experimental studies of the surface conditions reported in the article vere intenddd to help in solving tl~e problem of stabilization of Ge devices. Effect of the surface potential on the parameters of semiconductor devices is considered, and theoretical ~'current-Gain vs. sua-face charge and current-voltage curves are presented. E~Ter- ments vere conducted with P-5 and P-0 open-type Ge transistors Vnich were treated Vith awines (ani2ine.. dimethylaniline, anilim black, quinoline, triethylamin Cord ACCES3ION IM: AT3003003 7 with As) Se,, Mg., Zn, The amino treatment brought about the following results: f (1) amine adsorption lowers the reverse collector currents; (2) it also affects 4, the gain which increases or decreases -depending an the basicity of the emine in ,question; (3) durability of the adsorption bond, which,is connected with the s(!Mi ,conductor-device stability, depends on the type of amine used; (4) amine treatment i makes the surface charge less negative, Detalled explanations of the above re- suits are offered, Adsorption of elementary sd)stances has revelaed that As, Se, 1% increase the gain and decrease the'collector cVtrents; zz~k ,, as the reverse effec Protective coating of treated surfaces by RPF,-4()lVand EK-SO14namels was also tested: Orig. art. has: 4 figures, 8 formulas, and-T-WIes. PMOCIATION: Akademiya nauk SSSR (Academy of Sciences SSSR) Akademiya nauk :Uzbekskoy SSR (Academy of Sciences UzSSR) Tashlgantskiy gosudarstvenny*y universiteV Tashkent State University) 00 DATE AcQ: ismay63 -ENCL: 00 .:SUB CDDE: 00 NORM SOV: 003 OTW: 004 lCard 2/2 -L 18995-63 EPF(c)/EWT(m)/EWP(q)/BDS AFFTC/ASD 'Pr-4 P14/WW/ i D/MAY/JG/AB ACQESSION NR: AT3002455 S/2935/62/000/000/0211/0217 AUTHOR: Katayev, G. A.t Presnov, V. A.; Batuyeva, Ye. N.; Katayev, Yu. G.; !Lyuze, L. L. TITLE: Effect of adsorptioAf some~,amines by the semiconductor upon the fundamental parameters of rmaniurkhransistors (Conference on Surface Properties _&e anlu of' Remi-e- nduc1Du._j=jj ___M -6 June 1961] tute of ectrochemistr~~, AN SSSR, Moscow, 5 .SOURCEt PoverkhnostrV-*ye svoystva poluprovodnikov. Moscow, Izd-vo AN SSSR, 1962, 211-217 iTOPIC TAGSt semiconductor, adsorption, amine adi3orption, transistor, germanium ;transistor ABSTRACT: The following aliphatic- and aromatic-series amines were used in the ,experiments as adsorbates: hexamethylene-diamine,ltriethylamine, ammonia, ;p-phenylenediainine, p-toluidine, dimethylaniline,lbonzidine, anV11ne, bota- naphthylamine, diphonylamine, aniline black. The results of adsorbin by type P-5 transistors aret (1) Reverse collector currents have decreased; ~2) Gain has iincreased or decreased depending on the amine basicity; (3) Adsorption bond strength as judged by the time stability of the transistor parameters depends on the amine nature; (4) Surface charge has become I'less negativeH. The above Card 1/ 2 L-18995-63. ACCESSION NRi AT3002455 phenomena are explained by donor-acceptor interactions between the adsorbed molecules and Ge surface. Orig. art. hasl 3 figures, 4 formulas, and 2 tables. ASSOCIATIONt Tomskiy gosudarstvenny*y universitet im. V. V. Kuyby*sheva !;(Tgmsk State University) SUBMITTEDt 00 DATE ACQi 15May63 ENCL; 00 SUB CODE: PH NO REF SOV: 003 OTHMt 005 2/2 ard C L i8996-63 EPF(c)/EWP(q)/EWT(m)/BDS AFFTCYASD Pr-4 Rmlwdl JD/MA"Y/JG/AB ACCESSION NR:"AT3002456 S/2935/62/000/000/0217/0221 .".AUTHORi Presnov, V. A.; Lyuze, L. L. f Yi TITLEi Effect of amine adA2!:ptionAn the surf ace charge in 3.~rman~~ [Conference on Properties of Semiconductors, Institute of Electrochemistry, AN SSSR, Moscow, SOURCEt Poverkhnostny*ye svoystva poluprovodnilcov. Moscow, Izd-vo AN SSSR9 1962, 217-221 TOPIC 'TAGSj amine adsorption, germanium, semiconductor, surface charge ABSTRACT: Experiments e reported with the effect of adsorptio lof triethylamine, hexamethylene-diamine, aniline black, diphenylamine, and beta-naphthylamine by ~ra high-resistivity ger ium. Surface potential was measured by the a-c field-effect i ,method.. A special holder for the Ge specimen was designed (drawing given). .Strongly basic amines caused a considerable decrease in the negative charge. .WeaKiy casic amines brought about an increase in the hegative charge. Orig. art. .bast 2 figures, 1 formulas, and 2 tables. ,Card 1/1 i ASSN: Tomsk 3ktate University. AMC JD 'ACCESSION NR: AT3003015 S/2927/62/000/000/0254/6258 !AUTHOR: Presnov, V. A,; Gaman, V. I,; Sirotkin., A. A* icon _n iTITLEs Effect of a low-malt glass coating on the characteristics of sil t Aunctions [Report at the All-Union Conference on Semiconductor Devie-e`3770-hken i2-7 October, 19613 JSOURCEt Elektronno- - grcrwth rate, 50 -100 /JLL/hr), ,,6000, The average size of the crystals in the films produced by distillation and the iodide method was 4-5~x. Typical curves of the conductivity (r, Han coefficient R, and thermo-emf coefficient o( versus temperature for certain polycrystalline films are given in Fig. 1 on the Enclosures It is shown that the sublimation and iodide methods produce polycrystalline and epitaxial Oaks films that are fairly uniform in thickness and resistance. Both methods also allow doping with Zn.0 Cd., and Se. Origs art. hast 10 graphs, 1 diagramj 2 tabless and 1 formla. ASSOCIATIONI SUBMITTED: 060ct64 ENOLs 01 SUB CODE: SS No REF SOVt 004 OTHERt 002 Card 213 L 3368-66 ACCESSION NRt AT5020469 ENOWSURS s 01 V AN' FIR Fig. 1. Curves of conductivity, Hall coofficientg and thermo-emf coefficient versus temperature for polycr7stalline specimen Card 313 144 L-3367-66 EWT(1)/E,',[T(m)/T/EWP(t)/EWP(b)/F,'elA(h) IJP(c) JD/GS ACCESSION NR: AT5020491 AUTHORS1 Khludkov. S. S.; Vyllkin, A. P.; ("rishin, V. lo; Presnov Ve Ap-(Pro- fessor) TITLEI Diffused p-njunq ions in gallium W.-senide 13 -t- SOURCEI okays nauchno-tekhnic 03)UU3 x1\T49zhvUzo1 konferents a Do fizike poluprovodn:Lkov ( orkhnostnyye i kontaktWe yavleniya). Tomsk, 1962. Poverkhnostnyye i kontaktny yavleniya v poluprovodnikakh (Surface and contact role phenomena in semi~onducto . Tomsk# Izd-vo Toms kogo univ., 1964# 446-456 TOPIC TAGSt gallium arsenide,, pn junction, sulfur,, germanium. selenium ABSTRAM Diffused'p-n Junctions in p-type gall -- arsenide, p-n junctions in n-type GaAs, and also p-n-p structures in p-type GaAs were studied, and the meth- .oda of producing these Junctions are discussed. The p-n Junctions were produced b7 diffusion of sulfur and germianium in evanuated quartz ampules (10-4-10-5 mm Hg .:L"o with subsequent annealing, grinding, and etching (5% NaOH + 30% V202 in 5:1 ral 511 The p-n-p structures were prepared by diffusion annealing of GaAs in sele"i"" vapors at 750-UOOC for 0,5-22 hre with a solenius concentration in the vapor of Cori 1A L 3367-66 ACCESSION fiRt AT5020491 5-1017-9-1019 on -3; The static volt-ampere characteristic of a Junction pro- duced by diffusion of sulfur into p-typs GaAs is shown in Fig. I on the Enclosure The gernanium-diffusion junctions in the p-type GaAs had rectification factors of UP to 40105, while those produced by sulfur diffusion had a factor of 6*10. In the ease of n-type GaAsp the-garmnium-diffusion junctions had a rectification factor of about 7,104, The volt-ampere characteristic of contacts in GaAA-Ga2Se3 film in shown in Fig. 2 on the Enclosure., Orig. art, bass 7 graphs., 2 diagrams, and 2 formulas, r 'i ASSDCIATIONo none' litL SUBMITTEDt 060at64 RNOM 02 SUB COM SS NO RZF SOTS 005 OTHERs 007 Card L 3367-66-- ACCESSION M AT5020491 ZNGLDSURE 01 j f I r7 Fig* 1e Static volt-amL)ere characteristic of Jubation produced Card by diffusion of-sulfur into p-!tM_ GaAs L 3367-66 ACCESSION Mi AT50204% EWWSURSt 02 M .IL ep a. 147 m0 Volt-ampre charactoristio of oantacts 'a 04"442S*3 fjlm L 1117-66 EV1T(m)/EWPW/EV1P(b) IJP(c) JD/GS ACCESSION NRs AT5020497 UR/0000164100010091049110494~ AUTHORSs Presnov, V. A. (Professor); Bozhkov, V. G. TITLE: Calculation of the surface charge for a Metal with iin atomically pure ~surface coinciding with face (III) iSOURCE: Nezhvuzovskaya nauchno-tekbnicheakaya konfersnts~ya p0 poluprovodnikov (poverldmostrjyye i. kontaktnyye yavlpniy Tomskt 1962. -75 lPoverkhnoo e _ik_o_n_1a'_k't'nyye yavleniya v poluprovoanikakh- I urf ace and contact :phenomena in semiconductors). Tomsk, Izd-vo Tomskogg unitvv. -494 1964t 491 !TOPIC TAGS: semiconducting materialt germanium, crystal, excited state# eleotron trappingg electron hole IABSTRACT- Expressions are drivea for calculating the surface charge of a crystal I :with an atomically pure surface that coincides with face (111), under the assumption ~~that this charge is a result of either pairing or breaking of an unsaturated surface, I taken ,-atom bond. The effect of excited states on electron and hole trapping is not an linto account. The calculations were made an the basis of the woik of W. Shockley land J. T. Last (Pbys. Revot v, 107f No. 2# 195* It is found that a negative is present on an atomi2~1~ljpare germanium surfsoe boundod by fao* (111). Orig. iCUTd 1/2 L 1117-66 ACCESSION XR: art. hast 1 diagram and 22 forwil". 4SSOCIATIONs 'ri6im SUBXrf=: 06oct64 NO REP SOVj 001 4 ENCM W 001 M COM 88 Card 2 t 3371-66 E'dT(m)/EVTPQ)/T rsIRK ]ACCEWI0F NR: AT5020498 UR/00DO/64/000/000/005/0,50 AUTHORSt Presnov, V. A!Y('P'-rofessor); qelivanova, V. A. 5-S- liftIC;t~ IM" TITLEz On the problem of an electronic theory of crystallization of semiconductor compounds of type A111 and BY S0URCEi,\'\1MezhuzovskaYa nauclino-tokhnicheakaya konforentsiya Po rizike YV.LUFAWVW%"~WV L milavalLulijya jVCLV.LC"444%j* ZVUUJr,$ L7V&* Poverkhnostnyye i kontaktnyye yavleniya v poluprovix1nikakh (Surface and contact phenomena in semiconductors). Tomsk., Izd-vo Tomskogo univ.p 1964, 495-5o3 "1