RESEARCH IN THE FIELD OF ELECTRON MICROSCOPES AT ZEISS, JENA

• Document Type: CREST
• Collection: General CIA Records
• Document Number (FOIA) /ESDN (CREST): CIA-RDP82-00457R005600390005-7
• Release Decision: RIPPUB
• Original Classification: S
• Document Page Count: 1
• Document Creation Date: December 22, 2016
• Document Release Date: October 21, 2011
• Sequence Number: 5
• Publication Date: August 30, 1950
• Content Type: REPORT

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b~z=~;crosca~~es gat ~,e~.ss, Jex~
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:~U .~~. ~eyaart~aent o~ ~e~:iss~ Jena. is bu~.l.cl~.n~ ~,rao alectroa' rd.croscopeso One
o:~' these ti~3ll be a normal aeodal ~ahich could l~ ter be put ~.:ntA proeiuct3an
i1 x?o~ui:~ed., the other. is ~t e.:?perimenta~. model to be rPt~~.~irad for
~?es~.rch :i.nto :improvew~?~t of olectaron microacopwe?
~fl TJ~~s to Hots (.~"ure 195?jy Csr~a? el~;ct~?on s~.cs~ascopes have emg~~.oyed c~lectrom
atx~~et~.c ~o~:us~.ra~; ~an~l e~oatrnl r~:l~ the electron betsma Zo:Lss is e~Serj.montinC
~ea:i.th olert~?cstic beam contx^ol~ ~ahiCh~ 3t is bel~.eved, ti~ill be s3.mp~.ex~
~.?.id Haste aE~ 5~^~ax~e,te t,
Cc~n~n~nlas planned prccltaction in 1950 of
l~J electros?~e~.tic e~.eCtron n~.croscc~pesa
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