(SANITIZED)INVESTIGATION OF METHODS AND TECHNIQUES FOR DETECTING UNWANTED CRYSTAL MODES. QUARTERLY REPT. NO. 3, 1 DEC 56-1 MAR 57(SANITIZED)

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• Collection: General CIA Records
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• Document Creation Date: December 27, 2016
• Document Release Date: October 25, 2013
• Sequence Number: 5
• Publication Date: April 29, 1958
• Content Type: REPORT

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INVEST/GATICH CF
FOR DETECTING UNWANTED CRYSTAL MODES
THIRD QUARTERLY REPORT
December 1, 1956 to Mirth 1, 1957
SIGNAL CORPS CONTRACT NO. nA-36-039 SC-72378
DEPARTVENT CF THE ARMY PROJECT MEER 3-24-02-072
?
SIGNAL CXRPS PROJECT NINBER 86711
PIA CED DY
UNITED sums ARMY SIGNAL co t PS
ENGINEERING IABCRATCR /ES
FCRT MX:MOUTH, NEW JERSEY
MDTOROIA p INC.*
CtiDal,GO, ILL
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CF 222,_=1211
CTING UN
THIRD QUARTERLY RET
December 1, 1956 to March 1, 1957
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The object of this investigation is to develop a crystal
orcilletor type of test sot for the purpose uf ditecting
to-4*.nted crystal modes in the frequency range of 1 to
100 Mc.
slava CORPS CONIIIM;7 NO. DA-36-039 SC-72378
SQUIER SIGNAL LABORATORY TECHNICAL REQUMEMEWIS
FOR
FR&C 56-EIS/D-0, DATED FEBRUARY 13, 1956
DEPT. CF ME ARMY PROJECT NUMBER 3-24-02-072
SIGNAL CCRPS PROJECT NtNiBER MTh
107tROIA,
B. NIEDUMUI
J. LOOS
STAT ,
STAT
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The basic purpose of this study is to develop one or more
crystal oscillators, covering the range of 1 to 100 Mc, which are
more susceptible to operating on a spurious made than any other
oscillator in that particular frequency rano*.
Crystal manufacturers have, for tome time, employed an elaborate
setup to plot the main and spurious modes of a crystat directly
on graph paper. Spurious responces whose series resistances are
four times that of the main mode escape detection entirely, .
showing the extreme inadequacy of this system.
This places a double burden upon the military when crystals are
to be purchased. The first problem arises when spurious limits are
to be specified for a crystal which must be suitable for a number
of circuits. The second problem lies in the limitations of the
detecting equipment itself. Both of these problems must be
solved before the military procurement agencies are able to stoCk -
pile quantities of crystals for use in a variety of circuits.
An oscillator which is more capable of oscillating on spurious
responses than any other known oscillator is the obvious solution
to these pichleme. This oscillator, or series of oscillators, Is
to be incorporated into a military type of test set.
?
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Abstract
The Butler and Hartley oscillator circuits are analysed to
determine the highest values of crystal spurious resistances capable
of sustaining oscillations.
The schematic diagrams of the 6-7 Mc. Butler 2nd Hartley
oscillator circuits, which have been developed, are given. Utilizing
the derived equations, the highest values of spurious resistances
cspable of controlling oscillations in these two circuits are
computed.
The in and spurious mode resistances and frequencies of the
crystals used to test the oscillators are tabulated a The spualous
responses detected by the teit oscillators are indicated.. The
overall ability of the Hartley oscillator to detect spurious
responses is given by a curve of highest spurious resistances
detected vs. percent frequency difference from the main response. A
similar curve, expanded to include only those responses within one
percent of the main response frequency, is also obtained by the use
of the similated spurious technique.
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Publioetiona. LectlirOA Reports and Conference'
There were no publications, lectures, or reports during this
quarter.
Mt. B. Niederman and M. 3. Loos of Motorola conferred with
Dr. Guttwein, Mt. 0. Layd4n, Mt. 04.Cougoulis, and me. D. Pochnerski
of S.C.E.L. at Fort Monmouth, N.J. on 17 December, 1956. Progress
of the work up to date was discussed. The objectives of the contract
were clarified and plans for the immediate future were discussed.
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Epotual Data
In the previous report it war concluded that an oscillator capable
of detecting (i.e. - having its frequency of oscillation controlled
by) crystal spurious responses must meet two main requirements. The
first is high gain to compensate for the attenuation caused by a
high resistance spurious mode in a series feeoback path. The second
requirement is that of extreme selectivity (i.e, - narrow bandwidth)
to discriminate against a. low main mode series resistance while per-
mitting oscillations.to be controlled by an adjacent high resistance
sputicus mode.
The Butler and the Series Mode Hartley oscillators were chosen
as the most logical circuits because of their ability to meet the
above two requirements and tha added advantage of simplicity. Since
the final equipment is to be used by inexperienced personnel, it must
remain simple.
I. OSCILLATOR ANALYSIS
The conditions required for oscillations in terms of circuit
parameters for the Hartley and Sutler circuits are derived in the
following sections. The resulting expression in each case is solved
for the crystal series resistance (R), which when evaluated, becomes
the hi9hest value allowable for sustained oscillations.
In some cases it might be desirable to limit the value of this
resistance. Therefore, in the Hartley circuit, the expression
governing oscillations has been solved for "a" which is the inverse
of the autotransformer turns ratio. In this manner the feedback may
be adjusted to control the limiting value of detectable resistance.
A. Hartley Series Mode Oscillator
The Hartley oscillator schematic and its equivalent circuit ars
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shown in Figs. 7a and 7b respectively.
We define Z1 and 22 as
Eq. 1 Z1 z
Re
Rg Z
RIL (R a2Z1)
Eq. 2 22
Rk R a2Z1
From Equation 1 and Fig. 7b:
Eq. 3
El
Ek
From Equation 2 and Fig. 7b:
Eq. 4
is
R+a2Zi
1 Rp (1 U)
Multiplying Equation 3 by Equation 4 results In
Eq. 5
I.
The term (1 ? o) may be simplified to (u) since it is intended
to use a pentode or a high u triode in the Hartley circuit, therefore:
auZiZ2
(R a2Zi)(Rp + a * u))Z2)
?1
Eq. 5a
auZiZ2
(R a2z1) (Rp OZ2)
-1
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In order to solve for R the equation for 22 must be reinserted
since 22 is a function of R.
Eq. 5b
auZiRk (R +
*221)
Rk * R 4221
(R
Solving for R and simplifying yields ?
gmaZiRk (1-1a) - (Rk a2Z1)
Eq. 6 R
1 + gunk
uRk(R a2Z1)
Rk * R * 412Z1
To liet the value of datectable R, the turns ratio (a) of the
coil is adjusted accordingly. Solving Equation 6 for 'a" yields:
Eq. 7
2Z1 (1 gnpk)
gmlIkZit)/(gatRkZi )2 -421(1+ gmTtl)(Ra ? ) Rt)
a 31E
If the quantity under the radical is a positive value, there will
be two solutions, either of which will satisfy the requirement. Any
value of "a" between these two solutions will result in a higher
detectable R. If the quantity under the radical is mode equal to
zero, only one point on the toil may be tapped. If the quantity
under the radical is negative, the circuit will require a lamer value
of R to produce oscillations.
B. Butler Oscillator
A generalized Butler oscillator schematic and its equivalent
circuit are given in Figs. 8a and 8b respectively. The additional
equivalent circuits of Figs. 8c and Bd are simplified versions Of
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Fig. 8h. In Fig. 8c the voltage generator of Fig. 8b (u*E2) is
replaced by a negative resistance oval to -u"(Rp" + z1)/(u " + 1).
From Fig. 8 (note) equation 8 is obtained.
Eq. 8
zitg
Z + R9
The quantities Z2, Z3 and Z4 are defined as
Eq. 9
Eq. 10
Eq. 11
z2*
7-3
Pp. + Z1
u" + 1
ak. (a z3)
Z4 Is
From Fig. Sc Equation 12 is obtained.
Eq. 12
E2
From Fig. 8d Equations 13 and 14 are obtained.
Eq. 13
E2
Ek
Z3
R + Z3
Eq. 14
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Ek u'Z4
ONO
+ (1 ?u')z4
MUltiplying Equations 12, 13 and 14 yields
Eq. 13
u'Z1Z3Z4 -
Z2(11 ? Z3)(Rp' + C 1 + u'DZ4)
Simplifying Equation 15 and substituting the value of Z4
from Equation 11 yields
Eq. 16
usZ2Z3
RP'
' (1 * te)(R * Z3) * (R ? Ric' ? Z3)
Rk'
Solving Equation 16 for R gives
Eq. 17 R
Simplifying results in
Eq. 18 R
- Z3(1 u' +51) - RI;
7,2 Rk'
u'Z1Z3 - RZ.2
z2 * u.)aki Pp'
If the value of detectable R is to be limited, it is possible
to do so by adjusting the gain of V'. This may be accomplished by
adjusting the value of 111;. Equation 18 may be solved for Rk'
yielding:
-z3
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Eq. 19
Rk
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Z2Rp 1(R + Z3)
WZ1Z3 - RpsZ2 - Z2(1 + 10)(R + Z3)
By substituting the desired limiting value of R, the required
value of Rk' is obtained.
II DEVELOPED OSCILLATORS
The oscillators described in this section were developed from
preliminary circuits described in the second quarterly report. The
Butler oscillator of Fig. 1 was originally descriVed in Fig. 4 of
the second quarterly report. (1) The Hartley series mode crystal
oscillator of Fig. 2 was originally described in Fig. 1 of the
previous report. The symmetrical oscillator of Fig. 3 was evolved
from that of Fig. 1 in this report.
A.Bulles_Oe_ltsiltAm
The Butler crystal oscillator described in Fig. 4 of the previous
report was conntructed. The plate tank coil LI was constructed
at a fixed coil rather than a tunable one since a higher "Q" was made
possible by the substantial increase in diameter. The coil that was
originally tried was about 13 microhenries. The tuning capacitor,
which was connected from pin 6 to ground to facilitate mounting, was
made a 7 to e7 uuf air variable. The tank circuit impedance was
approximately 160,000 ohms since the "Q" of L1 was about 300. Howe
ever, this tank circuit was shunted by the plate resistance of the
grounded-grid amplifier, about 5000 ohms. This results in a loaded
"Q" of approximately 10. This was definitely not the selectivity
(1) In Fig. 4 of the Second Quarterly Report, the lead from pin 6
to the 150 V terminal should be broken since it shorts out the tank
circuit of LI and C2..
In Fig. 5 of the Second Quarterly !leper!, the lead connecting
C3 to pin 2 should be broken. The disconnected end of C3 should be
grounded.
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desired but was utilized to determine the effect of a very high gain.
This circuit was tested and found to be highly unstable. At
this point it was decided to decrease the gain of the grounded-grid
amplifier stage and simultaneously improve the selectivity. A dee
coupling network was placed between the tank circuit and B+ and the
plate tank impedance was lowered. These two changes are shows in
Fig. 1. Tho resulting 4 uh coil, LI, has a "Q" of about 250 resulting
in a tank impedance of approximately 40,000 ohms. However, as used
in the circuit, the loaded "Q" becomes about 27. The variable
capacitor, C.7, is a ceramic trirmer which is used to set the range
covered by the air variable C6. The range covered by C6 is slightly
greater than 1.01% of the center frequency.
After wiring a capacitor in series with the crystal, resistances
were substituted for the crystal to determine the maximum value at
which oscillations would occur. This was determined to be over 1000
ohms. With this sensitivity it was possible to pick up and detect
a large number of spurious responses. However, to further ieprove
the selectivity of thie circuit eome of this sensitivity must be
sacrificed. It was therefore decided to begin investigating the
Hartley Series Mode Oscillator since the high "Q" desired would, in
that particular circuit, be much more realizable.
The circuits appearing between the cathodes of V1 in Fig. 1,
which lead to the "Crystal Current" and "R.F. Indicator" terminals,
were installed in this circuit for ,urposts of power measurements
and oscillation indications. The network consisting of C4, 114, D2
and C12 is the R.F. probe developed in the first quarter and is used
to measure the R.F. voltage at the cathode of the grounded-grid
.t
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amplifier stage. The capacitors CI and C3, due to the rectifying
action of the diode DI, charge up sufficiently to deliver a DC
voltage across DI equal to the peak value of voltage across the
crystal. The resistors R. and R6 are used primarily for isolation
of the metering instruments. It was experimentally determined that
no additional losses occured by grounding R6 in order to Obtain a
ground reference for metering purposes.
B. nitlim_adili_dcit
The original Hartley oscillator circuit, described in Fig. 1 of
the second Quarterly report, was taken almost entirely from an
oscillator presently being used as a second mixer oscillator in a
commercial Motorola receiver. The original schematic had been codified
to the extent of changing the tube type, adding a screen voltage
adjustment and making the feedback circuit an inductive rather than
a capacitive transformer.
In the ensuing tests it Was determined that the inductances 13
and 14 were not necessary for our purpose. The inductance 14 had
been originally intended for a high impedance cathode load to attain
a near unity gain from the cathode follower. The inductance 13 had
been used in conjunction with a series tuning capacitor for purpose*
of frequency adjustment. These two inductances were therefore
discarded and'a 470 ohm cathode load resistance placed in the circuit.
At this time the problem of 1.2 was brought up. This is the
inductance shunting the crystal Which is used to tune out the shunt
capacitance of the crystal. An inductance to shunt the crystal for
this purpose is a logical idea w!len a narrow range of frequencies is
to be covered by the oscillaLor. However, it would require an elaborate
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switch to select a proper inductance at any frequency between 1 and
100 Mc. At this frequency however, it is not even necessary to
include 1.2 in the circuit since the reactance of the crystal shunt
capacitance is over 4000 ohms. The problem of minimizing the feed-
through caused by the shunt capacitance of the crystal was postponed
to the time when higher frequency oscillators would be considered
since this capacitive effect would be much more detrimental at that
time.
It soon bscamo apparent that, although the "Q" of Li was about
300, shunting this tank circuit with a grid resistor of only 10,000
ohms lowered the "Q" to about 17. The grid resistor was therefore
increased to 1 megohm. The loaded "Q" of the tank circuit then becase
256_ This circuit however, proved very unstable and would oscillate
even with the crystal out of its socket. At this point it was
decided that the .impedance of the tank circuit was much too high and
should be lowered. The resultant circuit is now shown in Fig. 2 of
this report.
The Hartley oscillator circuit of Fig. 2 was used to Obtain the
"Spurious Detectich Sensitivity" curves of Fig. 5 and Fig. 6. The
metering networks leading to the R.F. Indicator" and "Crystal Current"
terminals are identical to those described for Fig. 1. The crystal
current indication in this circuit, however, was obtained by metering
the voltage across a 100 Ohm resistor in series with the crystal.
The capacitor, C5, was wired into the circuit to prevent DC loading
of the cathode when resistances were substituted for the crystal.
In order to determine the most efficient point at which to tap
the coil, LI, it was decided to try each turn while recoroing the
mtput voltage obtained with a crystal controlling the oscillation.
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The maximum value of resistance which would sustain oscillations
for each tap point was also recorded. The results are shown in Table
TABLE I
SELECTION OF ?)ST EFFICIENT FEEDBACK RATIO
Ilums from R.F. output at Pax. Resistance
ground at Cathode with sustaining
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---------------1800 "
2200 ?
- - -2200 "
----- ----------1500 "
----- 150 16
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2.98
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Based on this information the tap was placed on the fourth turn from
ground. (The coil, LI, had a total of 10.5 turns.)
At this point it is possible, by the use of equation 6, to compare
the theoretical and experimental voioe of Leximum R for which
oscillations will continue. In order to do 20 the following parameters
have been utilized. For a 6AK5 vacuum tube with a plate voltage of
150 and a screen voltage of 120, the transconductance (gm) is given as
approximately 5000. With LI having a total of 10.5 turns and the tap
being placed on the fourth turn, "a" becomes .381 and a2 equals .145.
The inductance, 1.1, as measured on the "Q" meter, is 3.78 tab. Its "Q"
wee measured as 250. This makes Z, the equivalent impedance of the
tank circuit at resonance, equal to 38,500 ohms. With a grid
resistor, Rg, of 1 megohm the value of Z1 (equation 1) becomes 37,200
ohms. The value of Rk as given in Fig. 2 is 470 ohms.
Substituting these values into equation 6 results in 4.39 K ohms
as being the largest value of R which is theoretically detectable in
the oscillator circuit of Fig. 2. This value is quite different
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from the maximum value of 2.2 K ohms which was determined in Table I.
However, when the vacuum tube which had been used in obtaining the
data for Table I was tested in a transconductance type tube tester
under the actual operating voltages, the gm was measured as 3500
umbos instead of the 5000 which had been Obtained from published data.
Using this value of transconductance the maximum value of R was once
again calculated and this time came out as 3.23 K ohms.
The difference existing between the calculated and the experimental
value of maximum R is probably due to a number of assumptions and
additional factors which were not taken into account. For example,
the transformer action of LI was assumed to be loq% efficient. The
coil itself WWI fairly large in diameter with the turns fairly well
spaced to maintain the good "Q". Undoubtedly this led to inefficiencies
which were not taken into account in the calculations. The load
offered by the metering circuits as well as the shunt capacitances
between the cathode and ground were entirely disregarded in making
the calculations.
For most applications it is possible to use equation 6 to eetain
the maximum value of R as a first approximation. The actual
limiting value of R would in any case be determined by experimentation.
A simple method of controlling the limiting value of R is by
tapping the coil at a point yielding less over-all feedback. Instead
of flxIng :he value of "a" and determining the limiting value of R
with equation 6, it may prove desirable to set the limiting value of
R and determine the value of "a" necessary to set this limit. For
example, by using the previously determined values for gm, Rio Z1
and the desired limiting value of R (let us arbitrarily use 2000 Ohms),
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the solution of equation 7 gives two values for "a". These are .116
and .504.
C. ?vmmetrica Butler nsi
The schematic of a symmetrical Butler oscillator appears in
Fig. 3. This circuit was evolved from the Butler circuit appearing
in Fig. 1. The advantages of the Butler oscillator circuit of Fig. 3
over that in Fig. 1 are ? greater simplicity ? higher stability ? sore
versatility. The circuit was originally designed and constructed
around a 12AT7 vacuum tube. The circuit is, however, equally useable
with either a 12AU7 or a 12AT7 vacuum tube. The data given in the
following section (III) ir4icates thair relative ability to detect sp
spurious responses. The impedance level of the plate tank circuit is
the same as that of Fig. 1 with the padder condenser, C12, and the
trimmer condenser, C11, setting the center frequency while the air
variable, C101 is used to tune a 141% frequency range.
Using the circuit values of Fig. 3 it is possible to calculate
the value of limiting R as in the case of the Hartley oscillator.
The following constants are used in the calculations: NI = 560,000 ohms,
Z 38,500 ohms, u' = u" Z 18, = V.= 7000 ohms, Bk. Rk" = 270
ohms. Substituting the values for Z and Rg into equation 8 yields
the value for Z1 = 36,100 Ohms. Substituting the values of Rp", Z2
and u" into equation 9 yields Z2 = 2,270 ohms. Substituting the
values for Rk" and Z2 into equation 10 gives Z3 = 259. Substituting
these values into equation 18 gives a value of R = 1,210 ohm*.
Resistances were substituted for the crystal to determine the
actual highest value of R permitting oscillations. This meximusivalue
is 1100 ohms. k 1200 ohm resistor was too high r.id would not cause
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oscillations to occur.
III SPURIOUS DETECTION DATA
In the Second Quarterly Report it was stated that, of the 1000
crystals tested for spurious resrmses, 352 of them were useable.
The basis for this statement was that the rejected crystals
had no
spurious responses less than 100 ohms. However, as soon as the
oscillator testing began it became apparent that this limit should
have been raised to well above 1000 ohms. The 352 crystals whith
were acceptable had at least 1 spurious of less than 100 ohms series
resistance. Of this latter group, 100 were selected for testing
the Hartley oscillator ano two versions of the Symmetrical Butler
cscillator. The high "Q" versior of the Butler oscillator uses a
12AT7 vacuum tube and the low "Q" version uses a 12AU7 vacuum tube.
The results of these tests are shrlsm in Table II.
In Table II the spurious were numbered according to their
separation from the maLn resoonse, The last three columns of this
table indicate the ability e the particular oscillator to detect the
various spurious respPnses. An X mark appearing on the line of a
spurious indicatts thlt the oscillator, in whose column the X appears,
was able to oscillate under the control of that spuriouse
The spurious cats of Table 1: is obtained in the following runner.
A crystal is inserted i.nto the socket and the plate tank tuned to
obtain an output voltage. The tank Circuit is then tuned lower
in frequency until there is no longer any output. The resonant
frequency of the tank circuit is then raised until an output is
indicated. This output is then mnnitored by obtaining a beat note at
the output of a hetrodyne frequency meter. As the tank circuit is
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tuned hic.her in irevercy tis beet no V3r1tS but, by varying
tee zoning of th- freqeency meter. is maintained In the eudible :ecge,
es te tan. ciccuit is tered highir the audible heat note will
euodenly diseppeer. If, at tlis time, a DC voltege is still present
at the k.F. Inlicator terninel it means that the oscillator is being
controlled by .ptriots ieiponsc. The hetrolync frequency meter is
then tuned higher ia ixeooency until the audible note is once again
mord in the vic!nity of the spur:cus response controlling the
csci:lations.
This procedare ts repeeted e this spu.:ious response until the
eudible cote is once aoin lost and regained oy 7et-aing the hetrocyn,
frecT.:eney meter to the cPntrollInij spurious, The rrequency of each
of these spurious is noted. Tae oifferense in frequency between the
spurioef anc the :rain res7,onse is calculated as a percent of the
main response frequency ad noted in Taole II. Thslesistance of the
upurious that me,e detected, as well as the ones whica were not detectedp
were obtained by the series resis:ance method as reported in the
previous quarterly report,
Dur:ng the tuning operstione of the tank circuit it is advantegeoue
to 1-termittently turn off the EN voltage all imediately turn it back
on again. This Pinimiros tan pulling effect of ths moose that is
controlling the oscillations. It is possible for the controlling yode
to halo the ;requency as 4he tuna: circuit skips an adjacent response
and arrives at still another response at which the circuit will
oscillate when the controlling response loses control. By interrupting
the 11+ voltage the osci:lator is more likel;, to detect the spurious
between these two, In some capes it is possible by reverse tuning to
................r.ftme...~.0/????14110.1111111.1111.41111.1111.1111.111M1r411r
- 18 -
detect a spurious that was passed over When tuning from a lower to a
higher frequency. It is also possible by careful tuning to maintain
oscillations on two frequencies simultaneously.
TAME II
Resistant* Detected in Oscillator
Crystal Spurious & Butler
NO, No, f in X ohm; 1-113xA2i.L.__12,8.M_iM2
201
----------_----
7
1
.63
1300
2
1.09
185
3
1.17
1550
4
1.47
91
5
3.36
3650
6
5.62
2400
202
?
????? ?????? ????????
10
.47
2650
2
.72
81
3
.99
2000
4
1.34
2400
5
2.67
1750
203
14
1
.68
89
2
1.26
320
3
1.28
160
4
1.37
1300
5
3.04
3650
204
----------
7
1
.82
145
2
1.33
62
3
'.70
87
4
3.62
3650
205
7
1
.63
530
2
.82
770
3
1.32
89
4
1.44
2303
5
1.74
85
206
-----------------
6
1
.67
425
2
.89
210
....M.. ??iM Mw.
X X
X X X
1?1.01.?
X X X
X
x x x
X X X
--- -------
X X
X X X
X X X
X X X
X X X
X X
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Declassified in Part - Sanitized Copy Approved for Release ? 50-Yr 2013/10/25: CIA-RDP81-01-613e62300090005-8
1111W -v
Is elr IrN ? ,
Ii
- 19 -
I1 Resistance Detected in Oscillator
Crystal Spurious & Butler
I
No. No, f in % ohne Hartley 12AT7 Val
I
1 I
5
ii
Ii 207
1
I
Il
I I
I I 2
20E
It 212
1.4
I. [ 212
II
3
--_-_----------
-_______---
1.49
64
X
4
1.96
70
X
3.38
920
X
6
3.66
240
X
7
4.78
770
X
8
9
4.80
6.19
2200
1650
X
10
6.47
1650
X
5
1
.64
82
X
2
.83
2300
3
1.31
53
X
4
1.85
35
X
5
3.56
110
X
6
7
4.74
4.76
390
1550
X
8
6.37
340
X
9
9.57
1550
X
15
1
.64
400
2
1.03
1090
3
1.38
205
X
4
2.78
3800
5
1
.50
840
.67
388
3
1,08
122
X
4
1.48
71
X
12
1
1c05
65D
w
.,
2
1.41
90
X
3
2.77
1240
X
5
1
.59
425
2
:64
685
3
1.00
355
X
4
1.47
70
X
6
----
1
.62
800
2
1.47
65
X
3
1.87
90
X
X X
X
X
X X
X
X
X
X X
X X

X X
X X
X
X
X X I
1
X X
X X 1
X
1
X IE
X X
X X
4 2.39 2950
1U
11 . i
II.
All
'
^
41.
4/WNW.
Crystal
lo
Spurious
No
^
- 20 -
Resistance
D:tected in Oscillator
Butler
rtl 12AT7 12AV7
213
5
1
1.26
706
X
2
1.39
700
3
1.67
90
X
214
8
1
.55
2200
2
1.18
185
X
X
X
3
1.59
545
215
.....
5
--_-_-_---------
...........
1
.32
460
2
1.06
88
X
X
X
3
1.67
18
X
X
X
4
1.82
1045
5
2.12
30
X
X
X
6
2.48
1000
7
3.33
1680
8
3.51
1000
9
354
620
X
10
3.74
100
X
X
X
11
4.12
2800
12
4.83
770
X
X
13
4.87
800
14
5.02
3250
15
6.22
1000
X
X
16
6.45
1090
X
X
216
----__--_--------
6
1
.61
650
2
1.04
255
X
X
3
1.43
83
X
X
4
3.02
2400
217
5
-----
1
.65
1000
2
1.14
162
X
X
X
3
3.07
85
X
X
X
218
-----------------
5
1
.47
460
2
.67
70
X
X
X
3
1.03
840
4
1.40
1680
5
2.82
1410
X
X
219
--- ..... ....-----..
5
1
1.03
460
2
1.45
88
X
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Declassified in Part - Sanitized Copy Approved for Release
_
50-Yr 2013/10/25: CIA-RDP81-0-16713-072300090005-8
f,14;
A
?
?
?
???. ????? ???? ..???????????? ????? 4.??, GU..M?eftk?
- 21
?
Crystal
No.
Spurious
No,
I in X_pJL_AL_SYi4_U_-la
Detected in
Resittance Outler
Hartley
11 ------------------------
Oeci)lator
12AU7
220
---_--_----------
1
.50
2000
2
.65
475
3
1.04
565
X
4
1.38
162
X
X
X
221
---------
..... ---
5
1
.75
178
X
X
2
1.24
36
X
X
X
31.74

58
X
X
X
4
2.95
1820
X
5
3.36
270
X
X
X
6
4.45
2800
7
4.56
620
X
X
8
4.70
2950
222
5
--------
........
--_-----
1
.56
705
2
1.19
44
X
X
X
3
1.69
68
X
X
X
4
3.27
195
X
X
X
5
4.42
500
X
X
X
6
4.88
2100
223
------------_----
5
... ???? ??
----
--
1
.57
95
2
.73
475
3
1.13
135
X
X
X
4
1.45
3250
5
1.62
103
X
X
X
224
-----------_----
7.5
--
-Se
1
.54
170
2
.70
595
3
1.12
303
X
X
4
1.30
2500
5
1.58
95
X
X
X
225
10
ear.
?????
???????
????
1
.98
225
X
X
2
1.44
68
X
X
X
3
2.97
3050
226
6
01???????
?????
dionma..??=.
1
.39
320
2
.77
3250
3
1.25
30
X
X
X
4
1.88
46
X
X
X
5
3.11
705
X
?.
1
ii
Crystal
No.
- 22
Spurious
No. f in S
Resistance
&
ohms
Detected in Oscillator
Butler
Hartle), 12A17 32&!
6 3.12
1130
7 3.51
155
X
X
X
s 4.79
255
X
X
X
9 5.95
2300
10 6.05
595
X
X
X
11 6.45
650
X
X
X
12 9,35
1360
X
727
13
41??????.??????? 1.???????,?.???????
1 .62
355
2 1.04
270
X
X
3 1.49
74
X
X
X
228
?????????1111
7
-----------
????? ??????? ???????
1 1.15
-- . . -----_
X
X
X
75
2 1.69
88
X
X
X
3 3.17
388
X
X
X
4 4.32
1190
X
X
229
5
M.IPIP/40
----------
-- --
-----
1 .56
520
2 .71
2200
3 1.16
225
X
X
4 1.27
1200
5 1.55
135
X
X
X
230
6
---------------
--- --
-----------_--
1 1.24
162
X
X
X
2 1.66
91
X
X
X
3 3.39
1000
X
X
4 4.31
1090
X
X
231
---_-------------
1 .96
240
X
X
2 1.39
84
X
X
X
232
6
--- -----------
--
1 .49
1090
2 .68
270
3 1.05
355
X
4 1.43
80
X
X
X
5 2.72
3C50
233
-----------------
5
1 .46
2200
2 .62
3250
3 1.02
336
X
X
4 1.37
92
X
X
X
5 2.84
1540
X
Declassified in Part - Sanitized Copy Approved for Release ? 50-Yr 2013/10/25: CIA-RDP81-01043R002300090005-8
Si
Declassified in Part - Sanitized Copy Approved for Release 50-Yr 2013/10/25: CIA-RspP81-01_043R002.300090005-8
23
?.,
???ag=r..../ ???? ??????11....An.........????????????????????1??????????????....
Resistance Detected in Oscillator
Crystal Spurious I Butler
234
235
???????10
1 .59
2 .79
3 1.31
4 1.47
5 1.73
6 2.,10
.4?????????????1....11.M.YMNI.M.40111.
9
255
255
135
1680
62
2800
16
??????
X
1
.73
285
2
1.55
78
X
3
2.05
240.
4
2.29
3050
236
...... ???????????.????????????
10
1
.40
3350
2
.60
705
3
.94
1360
4
1.33
135
X
237
--
8
1
.57
- - -
2000
2
.96
910
3
1.31
162
X
238
3
.59
-
1
2540
2
.97
503
X
3
1.32
95
X
239
----..---
6
1
.52
------ ....
388
2
.71
1460
3
1.15
62
X
4
1.63
88
X
5
2.79
2500
6
3.14
545
X
7
4.22
2200
240
amiwomea?????????????????...........
8
1 .68
................n.?
336
2
1.48
38
X
3
1.64
3650
4
1.92
-49
X
5
3.26
270
X
6
3.48
225
X
7
4.42
1000
X
8
5.83
2950
9
6.08
3650
??????
MM. ....MP
1
X . X
- -- I
X X 1
- an
1
X X
-- I
X X 1
X X
X- X II
....? ....?? NM
D
X X
X X i li
X X
X X
1 il
SAY*
Crystal
NO.
24
Spurious
No. f JP _1(
Resistance
&
ohms
Detocted in Oscillator
Butler
Hartley 12AT7 12AU7
241
6
????????? alp
an 1.????? m........... 411.
-
1 .43
1600
2 .97
565
3 1.31
135
X
X
X
242
111........????????????????????????????
5
1 1.03
460
X
2 1.38
162
X
X
X
243
????????????????.......................
6
1 .57
3050
2 .87
1410
3 1.20
178
X
X
X
244
???????????????????????Map...???.....?
1 .49
255
2 .60
178
X
X
3 .97
2300
4 1.35
2400
245
...Mb M.G.wm...1.0.?????,???????410...1?1111
5
-
-
-
1 .58
2400
2 .99
240
X
X
3 1.38
92
X
X
X
246
6
1???????????????????????????????
-???????????.4.
1 .44
1360
2 .63
2300
3 .92
255
X
X
4 1.34
95
X
X
X
247
????????twoM.??????????????????04.Mr???????11.
6
1 .47
2200
2 .64
425
3 1.08
195
X
X
4 1.19
3250
5 1.49
135
X
X
X
248
7
-
1 .63
255
2 .81
1300
3 1.33
98
X
X
X
249
4 1.72
92
6
X
X
X
????????Mba.m.??????=?????????????????111.
1 .61
2400
2 .78
595
3 1.19
255
X
X
4 1.55
105
X
X
X
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Declassified in Part - Sanitized Copy Approved for Release 50-Yr 2013/10/25: CIA-R-DP81-01043iT662300090005-8
trro
.?
-
nr7:1!
?
. ? --- ?-- . . .2.71????-?? ?
?
Crystal
No.
25
Spurious
No, f in
Resistance
1
ohms
Detected in Oscillator
Butler
Hartley 12AT7 12All7
25-0
---------------
6
1
1.80
41
X
X
X
2
2.33
44
X
X
X
3
3.26
3250
4
3.77
2800
5
4.10
210
X
X
6
4.27
95
X
X
7
5.25
425
X
X
8
5.29
960
9
5.38
1410
10
5.59
3250
11
6.43
2000
X
12
6.45
3650
13
6.65
650
X
X
X
14
6.95
2650
15
7.86
3550
16
7.96
2650
x
251
-----------
5
1
.47
2950
2
1.10
100
X
X
X
3
1.20
1680
4
1.51
90
X
X
X
5
3.74
2650
252
28
1
.53
1190
2
.67
285
X
X
3
1.23
100
X
X
X
4
1.33
910
5
1.72
90
X
X
X
6
3.05
2200
7
3.52
195
X
X
X
8
4.84
371
X
X
X
9
4.82
2200
10
6.12
2400
11
6.33
770
X
x
12
6.38
910
13
6.50
2950
14
8.34
1750
15
9.53
1680
X
253
Mr ???=? am 0.4111.
...... Owl....
6
NI. ?????
---
??????P 411...?.0???
O... W.,. MM.
1
.68
100
X
x
2
1.36
46
X
x
x
3
1.95
58
x
x
X
4
3.32
1680
5
3.64
100
X
X
X
6
4.90
285
X
X
X
7
6.32
1000
X
8
6.50
336
X
X
X
26
.11?11.111.m...
Resistance Detected in Oscillator
Crystal Spurious & Butler
No No n ohms Hertley
9 8.65
10 9.77
11 9.83
12 11.90
1060
1680
1360
1750
X X
x
x
x
254
??????=4.411.41?????brm 1.111M6 wal??????????
7
1 .76
X X X
135
2 1.27
500
3 1.51
100
X X X
4 2.93
3250
255
5
41?? 0.N ...?????=???? AO sea ???????? ?????????MAMINNED
1 .50
910
2 .67
445
3 1.13
75
X X X
4 1.25
3350
5 1.57
93
X X X
6 2.71
3350
7 3.05
371
X X X
8 3.96
2950
256
5
1 .66
aMMI,
X X X
55
2 1.10
70
X X
3 1.47
55
X X X
4 2.90
910
X X
5 3.75
3250
257
110.? ???????=.m,
5
ass
1 .46
2800
2 .69
2403
3 1.08
55
X X X
4 1.71
53
X X X
5 2.80
2200
6 3.216
178
X X X
7 4.59
320
X X X
8 5.55
2650
9 5.96
1410
X X
258
7
1 .61
3250
2 .78
910
4
3 1.30
98
X X X
259
4 1.63
122
X X X
0,411.....111MMID?1?1????????????????.???
1 .5e
6
84
x x
2 .70
1240
3 1.14
210
X X X
4 1.57
170
? X X X
Declassified in Part - Sanitized Copy Approved for Release ? 50-Yr 2013/10/25: CIA-RDP81-01043R002300090005-8
Declassified in Part - Sanitized Copy Approved for Release_ ? 50-Yr 2013/10/25: CIA-RDP81-6r04A1602300090005-8
.0,
1.14FLT
9,
^
??? .1* ?? or. . ?-- ????? ? ....??????-i?Or??????????????=a1W.In.......??.m..
?
( '
27
ResistanceDetected in Cscillator [
Crystal Spurious 4 Butler .
No. NO. f In g ohms Hartley 12AT7 12AUY ,
260 ???=.4??????????1???????????????????N 8
1 .64 149 I
2 .81 100 X X X
3 1.25 270 fl
4 1.62 142 X X X
5 2.97 3250 I 11
261 ?????????.....????????????????????????? 5 ...... -
1 .46 3250
2 .62 3250 r
43 - 1 .. 47 17800 xx xx xx ..
262 ......-....-------.... i
2 .64 1820
3 1.08 95 X X X 1
4 1.19 3650
5 1.48 84 X X X
263 ?????????????41??????????..........Miln? 7 1
1 .63 960
2 .79 1410
3 1.28 77 X X X I.
4 1.66 1126 X
264 -------......-- 7 i T
1 1.04 cg x x X
3 1.45 84 X X X
4 2.90 650 X X X fl
265
1
2 .73 2: .
CO .?.????? ------..... ??????????????????????
1 .56 303
3 1.22 79 X X X
4 1.68 74 X X X
5 2.90 3650
6 3.14 910 X X
7 4.10 1460 X X 11
266
41????????
7
1 .41 303
2 .56 2500
3 1.01 88 X X X
4 1.42 90 X X X
5 2.88 7C5 X X X
6 3.77 2500
- 28
Resistance Detected in Oscillator
Crystal Spurious i Butler
No. No. f in ohms Hartley _121J7 12AU7,
267
268
269
270
271
272
-
---_-------_-----
......
--.
8
1
.59
3250
2
.79
1410
3
1.23
142
X
X
X
4
1.37
1300
5
1.58
79
X
X
X
6
3.43
200u
X
6
.......
--
1
.59
705
2
.76
388
3
1.21
90
X
X
X
4
1.58
100
X
X
X
6
1
1.22
135
X
X
X
2
1.60
135
8
X
??????? ????? IN.
X
X
0..
1
1.05
100
X
X
ow..
.
X
2
1.13
2200
3
1.45
200
X
X
X
4
5.43
3650
4......A.m....?41M.....
8
i??? up.. ????1.60 Oa ------------

IMO IMOD..
1
1.11
49
x
x
x
2
1.65
35
X
X
X
3
1.97
3650
4
2.90
1360
5
6
43.2257
122
225
X
X
X
X
X
X
7
4.53
1303
8
5.73
2950
9
5.99
1900
10
6.CQ
595
X
X
X
11
6.17
1190
12
7.52
1090
X
X
13
14
15
7.95X
1 9c 4c .9 ? 30
100
960
X
X
x
1611.60
1820
X
6
1
.63
320
2
.84
135
X
X
3
1.28
95
X
X
X
4
1.44
1300
5
1.69
84
X
X
X
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7
?
-
???????
- ........???????Or,??????....?.????4.0".???????????????????wo?bm?? -??????
?
Crystal
No.
-29
Spurious
No9 f in %
Resistance
lip
ohms
Detected in Oscillator
Butler
Hartley 12AT7 12Atr7
274
275
.1??=?????????,m?????????????????????
1 .69
2 1.02
3 1.48
4 3.04
??????????=???4?11..??????????????ml????
10
1300
220
95
4700
6
x
:4
x
x
1 .46
170
2 .64
2300
3 1.02
240
x
x
4 1.52
75
x
x
x
276
-----------
10
1 .47
2650
2 .61
100
X
X
X
3 .98
770
4 1.25
336
X
X
X
5 2.76
4100
277
--- --?????????1110....??????
6
---
1 1.31
94
X
X
X
2 1.43
3050
3 1.72
97
X
X
X
4 5.52
3900
278
6
owe
1 .50
870
2 .75
1190
3 1.17
95
X
X
4 1.34
2950
5 1.72
68
x
x
6 1.83
3250
7 2.93
2950
8 3.24
336
X
x
9 4.33
705
x
x
10 5.88
2650
279
4?1.???????????+?????????? IM....1.?
7
ed?D.I.??mb GM ----------------
1 .67
1190
2 1.04
565
X
3 1.37
100
X
X
X
4_ 2.61
2200
280
-----------220
1 .47
1820
2 1.01
1240
x
3 1.32
360
x
x
x
281
------.--------
7
1???????????? ???????? ...............
???????
1 1.11
108
X
X
X
2 1.54
85
X
X
X
1....???????
7
17
1
-30-
-
...4??????,..???????rl,
47'
...??^????
Crystal
No
Spurious
No. f i S
Resistance
&
ohrr4
Detected in Oscillatcr
Butler
Hartley 12A17 12A1.17
282
1 1.05
2 1.16
3 1.56
4 3.09
5 4.22
149
3250
83
445
910
283
???????????? ..... ..0.1?????Mbini.?????
5
I.. ??? O... ??????
???????????? Owl., ????????????? da.M
1 .59
620
2 1.20
77
X
X
X
3 1.57
122
X
X
X
4 3.36
3650
284
11
1 .67
500
2 1.17
77
X
X
X
3 1.26
1540
4 1.58
67
X
X
X
5 2.23
2100
6 3.04
545
X
X
X
7 4.05
2200
285
5
--Ow...????......?????????????????
1 .53
500
2 1.20
40
X
X
X
3 1.68
72
X
X
X
4 2.79
595
X
5 3.11
425
X
X
X
6 4.12
1000
X
X
286
5
?????.?????????????????????.????????????????????1
- flea
1 .62
240
2 1.
3 02
1.40
270
78
X
X
X
X
4 2.74
1600
X
287
??????????????.m.?? ....1.4???? ...W.????/IIMIr
9
1 1.11
es
x
X
2 1.56
100
X
x
3 2.99
1090
X
x
288
IIVIMI.M???????????4????????????m
10
1 .67
100
x
2 .82
840
3 1.38
78
x
x
x
4 1.80
77
x
x
x
289
11?.???????????????????=0.? ????????????? =D.
5
1
.59 68
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?
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A
A=f,14=tid
? ??-
Crystal
No.
Spurious
No,
-31-
f in %
Resistance
&
ohms
Detected in Oscillator
Butler
Hartley 12AT7 12AU7
2
3
.91
1.26
1820
685
4
2.59
1460
X
X
290
--------------
5
1
1.13
122
X
X
X
2
1.51
81
X
X
X
3
5.30
2400
291
-----------------
5
1
.74
320
2
1.25
140
X
X
X
3
1.58
108
X
X
X
-
292
8
1
1.002
162
X
X
2
1.09
2400
3
1.40
135
X
X
X
293
6
1 ?
.49
1750
2
1.14
95
X
X
X
3
1.55
88
X
X
X
4
2.66
2000
294
65
1
.65
1045
2
1.02
303
X
X
3
1.40
100
X
X
X
4
2.64
2400
295
6
1
1.06
400
X
2
1.61
64
X
X
X
296
5
1
.65
58
X
X
X
2
1.05
225
3
1.40
162
X
X
X
297
95
1
.39
870
2
.56
215
X
X
3
.85
1090
4
1.20
355
X
X
X
5
2.44
1540
X
X
298
......
41406
7
1
.70
84
X
X
X
1
IT
F.
?
.44 4????.k .1.4.4?? ?AAafieI.0?0111.:
Crystal
No,
Spurious
No,
32
f in %
Resistance
&
ohms
Detected in Oscillator
Butler
Hartley 12ATJ _12AU7
2
3
1.05
1.40
210
85
299
-------
6
1
.71
400
2
1.08
290
X
X
3
1.53
69
X
X
X
300
-- --a
11
---
-- . ---
1
.50
371
2
.80
100
X
X
X
3
1.1.7
303
L.47.
_________________
--1-
..._41_.
B. Analyst'
In the first crystal tested, #2011 the effect of the "Q" of the
tuned circuit (the bandwidth of the oscillator) became very apparent.
The Butler oscillator incorporating the 12AT7 vacuum Whey by virtue
of a higher plate resistance than a 12AU7, was able to detect the 185
ohm spurious (#2) which was located between a 91 ohm spurious (#4) and
a main mode series resistance of 7 ohms. The same oscillator using
a 12AU7 vacuum tube was not able to detect this spurious. The only
factor involved in this case is the selectivity of the circuits since
the gain in all three circuits will easily allow oscillations on a 185
ohm spurious.
Of the 100 crystals tested, the 12AU7 Butler circuit oscillated
on spurious as high as 705 ohms in crystals #213 and 266. The 124T7
Butler circuit oscillated on a spurious resistance as high as 1650 ohms
in crystal #206. The Hartley circuit oscillated on a 2650 ohm spurious
in crystal #250.
The greater selectivity attainable with a Hartley oscillator is
apparent in the results of crystal #206. Spurious #5, whose resistance
?
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4AVAI4
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' ?
?
- 33
is 920 ohms, was detected only by the Hartley oscillator. This
spurious was picked out from in between a 70 and 240 ohm spurious
by this oscillator. The 12A77 Butler was incovable of selecting
this spurious and went from spurious #4 esectly to spurious 106.
The gain of the 12AT7 Butler oscillator was obviously sufficient
since it detected the spurious #10 resistance of 1650 ohms.
The results obtained with the Hartle/ oscillator are displayed
graphically in Fig. 5. .7he curve, which las been obtained from the
experimental points, shows the maximum VE:AAS of spurious resistances
detectable throughout the frequency range. It is only possible to
utilize a few points since, in the majority of cases, when a high R
spurious was present, the oscillations we,* controlled by a lower R
spurious in the immediate vicinity. In tie upper region of the
curve (above 2%.4f) the curve is almost rapresentative of the maximum
values of R's which may control oscillatiwrs. In the immediate vicinity
of the main mode frequency the actual abi_ity of the oscillator is
never utilized since there are always lowtr R spurious responses
present. To obtain a more accurate plot .11 the vicinity of the mein
response the simulated spurious technique was utilized.
For the simulated spurious technique tne main response was obtained
by the use of a crystal that had no detec-.able spurious responses. In
shunt with this crystal Was placed a serivf. circuit consisting of a
crystal, whose main response was within 1: of the spurious free crystal
frequency, and a resistor. This resistor was varied to determine
the value at which oscillations would no 20-ger occur. The results
of this test are shown in Fig. 6. As in T19. 5, the circles indicate
responses that were detected and the triangles responses which were
11
ii
ii
?-?
-
.??
? 34
not detected. In Fig. 6 all of the responses of the crystals within
X% were plotted. In Fig. 5 however, only the pertinent values in
the region of the curve were utilized to minimize confusion. It must
be realized that if all the points would appear on the curve of Fig. 5
there would be many triangles below the curve but no circles would
appear above the curve. The triangles below the curve Imre left out
for reasons of clarity since the only reason they were not detected
was due to the presence of lower R spurious modes in the immedlatm
vicinity.
IV POWER DETERMINATION
The power dissipated in a crystal may be determined in a number
of ways. If the R.F. current through the crystal
resonant frequency is known and the resistance of
been determined, the power may be computed 'ay the
voltage across the crystal at series resonance is
at its series
the main mode has
T2R method. If the
known and the
resistance of the main response has been determined, the power may be
computed by the e/R method.
A. Bk_alst_Willi_Vz
During the investigation of the Butler crystal oscillator of
Fig. I both methods were tried. F.r the following tests a variable
0 to 500 ohm AC lout was placeo across R3. This load was varied to
obtain an R.F. voltage of .5 volts across R3 as measured by a Ballantine
AC meter. The tank circuit was then tuned through resonance and
the DC voltages appearing at the Crystal Current terminal and the R.P.
Indicator terminal were recorded. The following results were obtained.
Voltage across crystal ? .2 - ? .29 ? .43
Voltage across R8 - .26 ? .36 ? .49 - .49 ? .42
It may be noted that the point of resonance is indicated by a minimum
-7:
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?-???
- 35 -
crystal current as well as a maximum output voltage at the crystal
series resonant frequency.
It may be seen that the voltage across R3 also appears across the
series combidation of the crystal resistance and R8. That is to say
that the current which flows through the crystal also flows through
R8. Therefore, by measuring the voltage across Ra and dividing by the
R.F. impedance from the cathode (pin 8) to ground, the current
flowing through the crystal may be obtainod. The R.F. impedance across
the resistor R8 is equal to the resistance R8 in parallel with the
sum of the tube plate resistance and the tank impedance divided by
the sum of the amplification factor of the tube plus 1. This
calculation yields an R.F. load in the cathode of the grounded grid
amplifier of 240 ohms. In the previous data it as seen that the
maximum output voltage across this R.F. cathode load was .49 volt.
Dividing .49 by 240 gives a crystal current of 2.0 milliamperes. The
resistance of this crystal (#201) is 7 ohms, from Table II. Th;
power oissipated in the crystal may now be calculated as .03 milliwatt.
The voltage drop across the crystal may be calculated by multiplying
the 2 milliampere current by the 7 ohm crystal resistance, giving
14 millivolts. Adding this to the .49 volt across R8 gives a voltage
across R3 of .504 volt. This egress with the original setting of .5
volt. The 14 mtllivolts dropped across the crystal is far different,
however, from the 290 millivolts obtained by direct measurement.
To determine if the voltage across the crystal was a function of
the current at all, the AC load across R8 is changed. The load wes
first changed from 240 to 127 Ohms resultin9 in the same voltage across
-
.? ? 11.? ?romostadr?len..,
1
1
omk ...a.. ? ?
this cathode impedance; but the 290 millivolts across the crystal
was raised to 410 millivolts. When the AC load across 118 was
changed to 100 01.M11 the voltage across the crystal was raised to
540 millivolts while the voltage across R8 remained the same, .49 volt.
At this point resistors were substituted for the cryztal until the
value was found which would give the same output voltage as the crystal.
This value turned out to be few hundred ohms rather than the 7 ohms
of the crystal. A value of resistance %es then found which would
give the same value of voltage across the resistance that had previously
been measured across the crystal. This value was again different
but also in the hundreds of ohms. These experiments were duplicated
with B. voltages of 150 and IC5 volts with the same em results. At
this point experiments on the Hartley oscillator were begun and the
remainder of the power determination experiments were performed on
that oscillator.
B. Hartley Oscillator
The methods of measuring nower in the Hartley oscillator are
identical to those explained for the Butler oscillator. That is, the
currert through the crystal or the voltage across the crystal must
be determined and either one utilized in conjunction with the main
mode series R to calculate the dissipated power. Since the current
flowing through the crystal is now applied to the tank circuit there
I s no simple way of measoTing the crystal current. FoeIlds reason
the voltage across the resistor RI is used to calculate the current.
e
R1 is a plug-in resistor which may be interchanged with the crystal
allowing voltages across the crystal to be measured.
With the potentiometer, R8,(See Fig. 2) adjusted for maximum
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? . ? o. or.... ?
?
- 37 -
oscillator exitation, the output voltage measured at the R.F. Indicator
terminal is 3 volts and tho voltage across the resistor RI is 84
millivolts. The crystal is removed from its socket and resistors
substituted until a value is found which produces the same output
voltage. This value of resistance is 120 ohms, which gives s voltage
across RI of 275 millivolts. If the 84 millivolts measured across the
100 ohm resistor is any indication of the current through the crystai,
the power dissipated in the crystal is only a few microwatts. However,
since the actual operating conditions cannot be simulated by substituting
resistances for the crystal, this veXual of measured current cannot be
considered valid. A possible reason :or the inconsistencies of the
resistance substitution method may be ce to nonlinearities. In
an effort to obtain pure class-A operation, the screen exitation
voltage was decreased in steps and the resistance substitution method
tried in each case. The results are shown in Table III,
TABLE III
Screen
Volts
Resistance Substitudon Tests
Output liV Across Resistance for
Volts 100 ohm res, same voltage out
MY across
100 ohmzeil.
110
3.0
84
120
275
100
2.5
64
120
205
90
2.13
52
150
148
80
1.7
36
120
112
70
1.37
26
135
65
60
1.02
15.8
135
36
50
.68
8.4
150
13
45
.48
4,3
68
7.6
40
.34
2.3
9
4.0
35
.22
1.0
1.1
The column entitled Output Volts is the voltage measured at the
R.F. Indicator terminal. The third column is the voltage measured at
the Crystal Current terminal, the voltage across the 100 ohm resistor
???
^
--y
???? ""*.ar.....???????r?-- ???????""-??????????"'"'"'""" """-"""-'"
- 38 -
R1 with the crystal in place. The last column is the same voltage but
with the value of resistance indicated in column four in place of
the crystal. The results remain fairly inconsistent as the exitation
is decreased until the screen voltage drops to about 45 volts. At
about 40 volts of screen voltage the resistor which must be substituted
for the crystal to obtain th same output voltage actually approaches
the series resistance of the crystal itself. However, the voltage
across RI is measured at 4 millIvolts with the resistor in place and
only 2.3 millivolts with the crystal in place. When the screen
voltage is dropped to 35 volts the output voltage with the crystal in
place is .22 volt. This voltage is not obtainable with even a short
circuit in place of the crystal, the highest output obtainable being
.17 volt.
C. Measuring Techniaues
'he voltage measured at the g.F. indicator terminal in the
oscillators of Figs. 1,2, and 3 is primarily used as an indication
of oscillation. However, in the case that the actual R.F. voltage
is required, as in the case of the Butler oscillator, the R.F. voltage
may be obtained from the calibration curve of Fig. 4. By the use of
this curve an R.F. voltage in the range of 40 millivolts to .8 volt
may be determined. The DC voltage in this case was measured with a
"Millivac".
The indications obtaineo by measuring the voltage across a resistor
placed in ce=ies with the crystal always tend to be much too high.
Since the method used to measure the voltage across this series
resistor responds to peak values of voltage, it is postible that these
high readings are due to some form of nonlinearity euch as might be
1
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- 39 -
obtained by class -B or class-C operation; or when blocking oscillations
are taking place at a much lower frequency.
In order to determine the cause and extent of the nonlinearitiee,
the waveform was observed in both oscillatoas with a high frequency
Tektronix oscilloscope.
The Hartley oscillator, when using a crystal in series with a
100 ohm resistor, showed a slight amount of distortion at high drive
levels. A 300 ohm resistor was substituted for the crystal which
gave the sa-e value of output voltage at the R.F. Indicator terminal.
The behavior was similar in that the waveform became slightly distorted
at higher drive levels. However, the distortion was more the limiting
type rather than the nonlinear type which occurred in the case of
the crystal. When smaller values of resistances were substituted for
the crystal the oscillator began to block. This blocking could have
also been observed by increasing the exitation from zero while
observing the output voltage. At the point that blocking oscillations
begin the output voltage increases &harply.
Since the Butler oscillator had no built-in exitation control it
was decided to obtain a variation in the drive level by varying the
tuning. This was successfully accomplished. The oscillator in this
case was the Syr=ztrical Butler oscillator of Fig. 3. When a crystal
was placed in 'Aries with a 100 ohm resistor the output voltage was
.44 volt. r.'y approaching oscillations from a lower frequency, the
output voltage could be continuously varied. Up to a value of .06
volt output which could also be obtained by replacing the crystal with
a 2200 ohms resistor, the waveform appeared to be purely sinusoidal.
However, when the output voltage was increased beyond this point the
output waveform definitely became distorted. At the point of maximum
A
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1
:*%
- 40 -
output the waveform was extremely distorted. In each case it was
possible to simulate the output voltage and distortion by replacing
the crystal with a resistor. When this value was 180 ohms a critical
point had been reached. At any value of resistance below 180 ohms
blocking oscillations were observed. The waveform observed at the
grid of the cathode follower stage indicated that the RC coupling
network between the tank circuit of the grounded-grid amplifier and
the grid of the cathode follower was the cause of the blocking
oscillations.
Declassified in Part - Sanitized Copy Approved for Release
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'1414'11:- "A?
?m,
-41-
Conclusion,.
The three crystal oscillators which were used to obtain the
data of Table II were successful, to some degree, in detecting the
spurious responses of crystals. The Hartley oscillator was more
sensitive and more selective than either version of the Butler oscillator.
This was principally cue to the tank circuit being in the grid of
the cathode follower where the loading is very light. In the Butler
oscillator the selective circuit being used as a plate impedance Is
subject to loading by the plate resistance of the amplifier tube.
The Hartley circuit has the added advantage of an easily incorporated
exitation control by varying the screen potential.
Of the two Butler oscillators used to obtain the test data,
the 0514 incorporating the 12All vacuum tube was both more sensitive
and more selective than the same circuit incorporating a 12AU7 vacuum
tube. The greater selectivity was due to the higher value of plate
resistance 12AT7 causing less loading on the tank circuit and
retaining a higher value of Q. The greater sensitivity is due to
the realization of a higher gain in the grounded grid amplifier stage.
The conclusion may now be drawn, at least for this range of
frequencies, that the Hartley oscillator best performs the functiun
of detecting spurious r2sponses. However, it is very possible that
the sensitivity and selectivity of this oscillator may be-too greet.
When it is realized that out of 100 perfectly useable normal production
run crystals, about 90 to 95 would have detectable spurious, the
thought must occur that this oscillator may be too good. In order to
determine just how much ability this oscillator should have it would
be necessary to compute the value of limiting R and the bandwidth of
????????.... ,j?????...A?aa...,AP.M1=4..6.011.?
?
- 42 -
the circuit for every oscillator currently in use and then use a
detecting oscillator which responds to a higher value of limiting
R and has a narrower bandwidth than any of these using oscillators.
Deciding just how much selectivity and sensitivity is required will
be left for a later date:
From the results obtained in preliminary attempts to measure
power dissipation in the crystal, it appears that the orive levels
must be raised to reach the 20 milliwatt level required. The mein'
problem encountered with measuring power dissipated in the crystal
when used in a detecting oscillator is that of extraneous blocking or
parasitic oscillations.
DU4 to the high "Q's" incorporated in most of these oscillator
circuits, the higher impedance levels have made regeneration a problem.
This moans that the physical layout will be critical and must be well
planned.
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TW,
- 43 -
Program for Next Interval
A Butler and s Hartley oscillator for use at 30 and 50 Me.
will be developed and evaluated. Based on the performance of these
oscillators, one circuit will be chosen for the final instrument.
The number of oscillators required to cover the frequency
range will be determined. These will be constructed as separate
units.ane then *valuated.
A 'bridge" mothod of compensating for the effect of the crystal
shunt capacity will be 4.nvestigated. Only by this means will it
be possible to achieve compensation over a large frequency range.
L.
111
AL'
4.1
?
Ii
iiIdentification of P,rsoru41
????
..???????NwiegoodiloolICT
.. 44 11??
1. Robert D. Vann - 542 manhours during third quarter.
Technician
2. Joseph Loos - 276 manhours during third quarter.
Engineer, Senior Electronic Development.
a
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?
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?_-
? 0 ?
210V
F TWEENT
-
?
BUTTER CRYSTAL OSCILIATCSI
R5
6-7 JEGACYCLES
? ?-???????????? ? Is ? .* !MP.. r????
??????.????????????.????,?????? -.=0".?????????????????????
cd_
?
cif
44
CRYSTAL CURREKT
R2--------27
Re4R6----1CM
R7R9------1 Meg.
--270
ALL RESISTANCE IM OHMS: ALL CAPACITANCES IN UUF UMLESS
OTHERWISE MARKED.
vi
.00UTPUT
OR.F. DIDICATOR
C2 1500
C5C10C11C12 .01uf
C6 - 7 to 47 Aix Var,
12AU7 C7 - 7 to 45 Car. ?VIA,
Cs
y--
Fran -
HARTLEY SERIES ht:CE CRYSTAL OSCnIATCR
6-7 MEGACYCLES
Ro - E3 --- -1 Meg.
R4R5 ------10K
R6 VI
Es --500K Pot
ALL RESISTANCES IN OHMS.
OTHERW!SE MARKED.
DiD2
???????? ?
1104
--6AK5
7
C/ 7 te 47.{kte t.
C2 7 to 45----Carr. Trim
C4C6C7C8'-2?3
-----
C5C?Cll
C1oci2C13----.0015,s1
ALL CAPACITANCES IN UUF MESS
Declassified in Part - Sanitized Copy Approved for Release ? 50-Yr 2013/10/25: CIA-RDP81-01043R002300090005-8
Declassified in Part - Sanitized Copy Approved for Release ? 50-Yr 2013/10/25: CIA-RDP81-01043R002300090005-8
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Declassified in Part - Sanitized Copy Approved for Release ? 50-Yr 2013/10/25: CIA-RDP81-01043R002300090005-8
Declassified in Part - Sanitized Copy Approved for Release
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Declassified in Part - Sanitized Copy Approved for Release ? 50-Yr 2013/10/25: CIA-RDP81-01043R0023
Declassified in Part - Sanitized Copy Approved for Release
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50-Yr 2013/10/25: 043R002300090005-8
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Declassified in Part - Sanitized Copy Approved for Release ? 50-Yr 2013/10/25: CIA-RDP81-01043R002300090005-8
Declassified in Part - Sanitized Copy Approved for Release ? 50-Yr 2013/10/25: CIA-RDP81-01043R002300090005-8
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Declassified in Part - Sanitized Copy Approved for Release ? 50-Yr 2013/10/25: CIA-RDP81-01043R002300090005-8