IMPROVED SCREEN FOR REAR PROJECTION VIEWERS
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Collection:
Document Number (FOIA) /ESDN (CREST):
CIA-RDP79B00873A002000010079-6
Release Decision:
RIPPUB
Original Classification:
C
Document Page Count:
22
Document Creation Date:
December 28, 2016
Document Release Date:
November 8, 2012
Sequence Number:
79
Case Number:
Publication Date:
October 12, 1966
Content Type:
REPORT
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Body:
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)
;CORNING GLASS WORKS
ELECTRO-OPTICS LABORATORY
RALEIGH, NORTH CAROLINA
IMPROVED SCREEN FOR REAR PROJECTION VIEWERS
Technical Report No. - 14
Date - October 12, 1966
Period Covered - September 16, 1966
to
October 12, 1966
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'25X1
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ABSTRACT
This report summarizes the light scattering properties of additional
samples of Corning Glass Works materials. Good agreement was found
between the experimental and theoretical data on the fraction of the
incident energy scattered into +450 and into +900. Some samples were
found to have excessive particle densities and new samples of these
materials will be prepared.
The samples of FotoforPglass with the surface layer of crystalline
material were found to have good, easily controllable optical properties
which include low sensitivity to ambient light. Samples of lenticular
screens were fabricated using small glass beads. This work is discussed
along with the status of the lenticular ribbon which is being re-drawn.
The complete modulation transfer function analyzer is shown along with
a discussion of its basic construction.
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TECHNICAL REPORT #14
I. Materials Investigations
A. Glass-Ceramics
As part of our continuing effort to identify new and promising
materials we have obtained additional samples of glass-ceramic
materials. These have been evaluated and the results are
summarized in Table I. Data concerning the angular gain function
and other optical parameters are given in the Data Appendix.
The diffuse transmittance as a function of axial_ gain, which is
a good measure of the efficiency of a material, is plotted in
Figure 1. The fraction of power within +45o as a function of axial
gain is shown in Figure 2. As before, we see that our materials
fall close to the theoretically predicted curve*. Samples AG1,
AG2, AG3, and AH1 look very poor both from the angular gain data
and from their low values of Ts due to the high concentration of
scattering particles. We are requesting additional melts of these
glasses with lower particle concentrations. Samples AH1A and AH1B
should have had excellent color fidelity as the relative index of
refraction between the crystals and the surrounding glass is .65.
Sample AC18C was cut from the same block of material as AC18A and
AC18B, and AC19C and AC19D were cut from the same material as
AC19A and AC19B, which are the two best glass-ceramic materials
found thus far.
Figure 3 shows how diffuse transmittance varies with sample thickness.
The large variations in Ts occur primarily because the samples are not
completely uniform as could be seen from pieces of the original
material. We are making an effort to have more homogeneous samples
in the future.
Samples AG4A and AG4B look promising from their angular gain curves
and from Tspec; however, both show some slight red transmission and,
when used in a rear projection configuration, the filament of the
projection lamp can easily be seen. The remaining samples show small
'Improved Screen for Rear Projection Viewers", Technical Report 25X1
No. 12, August 24, 1966.
?
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kiEU A
Summary of Optical Properties
Table I.
Glass Ceramics
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valuesofTspecbut still transmit some light at the red end of the
spectrum. Nothing further can be accomplished by increasing the
density of scattering particles because this only further reduces
Ts which is already low.
We .are in,-the process of grinding and polishing 12 new samples of
material and expect 16 more within the next week. Other glass-ceramic
systems as well as some containing metallic particles are being
prepared.
The influence of different heat treatments can be seen from the
different sizes and shapes of the crystals shown in Figure 4. The
material shown is used in some of our commercial cookware. It is
evident that both time and temperature are critical in determining
the final crystal structure. Figures 5, 6, and 7 partially illustrate
the large variety of glass-ceramic systems, each with its own
particular type of crystal structure. In each of these electron
photomicrographs the solid white bar represents one micron.
rri
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CRYSTALJZATION OF A MUL,..
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Figure 5
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Figure 6. Dendritic Crystals similar
to those in the samples of
Fotoform Glass.
7
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Our future effort with the glass-ceramic materials will consist
of obtaining samples of other new systems, re-melts of those
systems which look particularly promising, and re-melts of those
systems which need further modification to improve their optical
properties. From the re-meltings of promising systems we will
fabricate small prototype screens measuring, 2 to 3 inches square
for further testing and evaluation. At the same time we will be
investigating several different techniques of fabricating larger
screens. This is important as it is almost impossible to grind screens
even 6 inches square which are only one-third to one-half millimeter
thick.
CD
B. Fotoform Glass
Fotoform glass has many interesting properties which we are attempting
to bring under control. The first of these is its ability to devitrify
giving a relatively dense crystal layer over the surface of the material.
We have made several samples using different heat treatments which give
crystal layers from 10 to 500 microns thick. The nature of these
crystals is relatively independent of the time-temperature cycle; here
only the total number of crystals can be controlled. Since this
layer forms only at the surface, the interior portion of the glass
remains clear. This then represents a significant advantage over
other materials because the thin scattering layer and the thicker
structural support are an integral unit, not a thin scattering layer
attached to some supporting material.
As can be seen from Figures land 2, some materials have excellent
transmission properties which have been verified in a rear projection
system. The best of these sample, AD21, transmits over 90% of the
incident light which makes it relatively insensitive to ambient
illumination while differing in brightness by +28% within a viewing
angle of +450. Unfortunately there is some micro structure in these
materials when viewed under 10x magnification. This will be investigated
further to determine its exact origin. In addition, we are in the
process of fabricating prototype rear projection screens from this
material which are three inches square and cover a wide range of
optical properties.
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This glass has the additional property of being light sensitive.
By exposing the desired pattern into the glass, developing it
through a heat treatment, and, then etching away part of the exposed
area we can form lenticular elements on its surface. The resulting
crystal structure of the exposed areas is similar to that of Figure 6.
For our initial exposures we used two different nickel masks both
12.5 microns thick. One had 6 micron square holes with a 6 micron
spacing; the second had 25 micron square holes spaced 6 microns
apart, Figure 8. These masks were contacted to the Fotoform glass
between a thin sheet of borosilicateglass to give square, exposed
areas. These samples were then etched giving a material with negative
lenticules. Since all of the glass is actually etched and only the
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Figure 8. Micrographs of the Masks Used to Expose the
Lenticular Pattern into the FotofornP Glass.
difference in the etch rate cuts the patterns into the glass, it was
hoped we could
in the oven at
tension of the
polish the material after etching and place it back
a sufficiently high temperature so that the surface
molten glass would form the clear, flat, raised
sections into curved, lenticular shapes. Unfortunately, during
this heating operation crystallization occurred throughout the glass
producing a dense white scattering material. We are continuing our
investigations of the optical properties of the lenticular configuration,
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and at at the same time we are forming positive lenticules by evaporating
on glass a negative of the mask previously described by following these
fabrication procedures. Because of the large apparent size of the
crystals in the heat-treated lenticular material, we will also be
preparing samples of this and investigating the associated optical
properties.
C. Lenticular Screens
1. Glass Beads
We have fabricated some small lenticular screens to gain a better
understanding of their light scattering properties. These were
made by covering a thin layer of a quick setting plastic with a
layer of spherical glass beads before it became completely solid.
After the plastic had hardened, the loose beads were removed.
Screens made in this way have values of Ts from 60% to 95%
depending on the size of the beads used. For our studies the
bead diameter varied from 460 microns down to 75 microns. The
larger beads gave very high gain, poor quality screens as
expected; however, the smallest sizes gave no noticable distortion
of the image as viewed directly by the eye. Naturally, under 10x
magnification the beaded structure could easily be seen. Our
future effort in this area will be concerned with making uniform
?single layers of glass beads with diameters as small as 15 to 20
microns.
2. Cylindrical Lenticules
The glass blank containing the cylindrical prism is presently
being redrawn into ribbon. :Figure 9 shows a end view of the
original plate; actual size. We will be reporting on this in
detail in the next report.
II. Instrumentation (MTF Analyzer)
The MTF Analyzer is nearing completion. Figure 10 shows a photograph of
the film transport, light source and the contrast computer. The system
is operated in the following way to obtain a transfer function:
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Figure 9. Cross Sectional View of Lenticular
Blank
Figure 10. Photograph of our MTF Analyzer Showing
the Film Transport, Light Source and
Contrast Computer.
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-14- 1,
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1. A sine-wave mask in the film transport is focused onto the pinhole
aperture ahead of the PM tube.
2. The transport is then manually positioned at the low spatial
frequency end so that a low density region of the sine-wave mask
falls on the pinhole aperture. The output from the PM tube is
presented to the MTF input. This signal is amplified, if necessary,
by a pre-amplifier stage and then compared to an external voltage.
The external voltage source is then adjusted using the "mask
maximum" adjustment to null out the input signal.
3. The transport is now manually set to a high density area of the
sine-wave mask and the input signal is adjusted as outlined in
paragraph 2, with the exception that no additional compensation is
made in the pre-amplifier. The "mask minimum" adjustment control
is used to null out the PM tube output signal.
4. The sum of the voltage levels from the maximum and minimum circuits
is fed into an averaging amplifier. The transport is then activated
so that it traverses the full length of the strip starting at the high
spatial frequency end at a varying rate. This generates a fixed
frequency of 27.4 cycles/second.
The 27.4 cycle output is summed with the output from the averaging
amplifier, and the signal is again amplified and fed through a
step-up transformer. The transformer output is rectified and
filtered, and the resulting envelope of the AC power contained in the
mask as a function of spatial frequency is fed to an x-y plotter.
5. The test procedure, when a glass sample is used, is the same as outlined
in paragraphs 1-4 except now the "sample maximum" and "sample minimum"
level adjustments are used. In this stage, due to the decreased voltage
level as a result of the attenuating characteristics of the glass, the
output from the averaging amplifier is passed through an adjustable
gain amplifier to insure that the DC levels with and without the sine-
wave mask are the same. The only difference is the AC signal level
is a measure of the MTF of the sample. This output results in a second
trace on the x-y recorder. The ratio of these then constitutes the MTF
of the sample.
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Data Appendix
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Declassified in Part - Sanitized Copy Approved for Release 2012/11/08: CIA-RDP79B00873A002000010079-6