(SANITIZED)

Document Type: 
Document Number (FOIA) /ESDN (CREST): 
CIA-RDP79B00873A001600030001-4
Release Decision: 
RIPPUB
Original Classification: 
K
Document Page Count: 
67
Document Creation Date: 
December 28, 2016
Document Release Date: 
August 16, 2012
Sequence Number: 
1
Case Number: 
Publication Date: 
November 1, 1971
Content Type: 
MISC
File: 
AttachmentSize
PDF icon CIA-RDP79B00873A001600030001-4.pdf2.66 MB
Body: 
Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part -Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 *a IMT Proposal No. P-5578-A ADVANCEn PHOTOMETER Approved by: November 1971 STAT STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 TABLE OF CONTENTS SECTION TASK ABSTRACT Cost Estimate Summary II III PAGE 1 2 3 INTRODUCTION 4 Background 4 General Configuration 4 TECHNICAL DISCUSSION 7 Basic Principles of Brightness Measurement 7 Considerations of Angle Coverage 9 Spectral Calibration 11 Digital Meter and Display 12 Display 13 Transporting Case 13 Warm-up 15 Temperature 15 Construction 15 Safety 15 Battery 16 Power Supply and Battery Charger 16 Weight 16 Photo Diode and Associated Amplifier 17 Accuracy 18 Detecting Head 19 STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 SECTION TABLE OF CONTENTS (Continued) PAGE Figure 1 - Advanced Photometer 21 Figure 2 - Section - Advanced Photometer 22 Figure 3 - Detecting Probe 23 Figure 4 - Optical Schematic Typical Microscope 24 Figure 5 - Photometer Block Diagram 25 Appendix I - Reference Calculation for 26 Exit Pupil Typical Microscope IV WORK STATEMENT 27 V DELIVERABLE ITEMS 28 Interim and Final Reports 28 Equipment 28 VI PROJECT SCHEDULE 30 VII PROGRAM SCHEDULE 31 VIII FINANCIAL CONSIDERATIONS 32 IX MANAGEMENT PLAN 36 Organization Structure 36 Personnel Qualification 36 Assignment of Personnel 36 X 411 COMPANY CAPABILITY 39 ?Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 es SECTION I TASK ABSTRACT STAT This proposal describes an advanced Photometer designed as a portable instrument to measure brightness of an image through optical systems (such as microscopes). It also measures luminance of light tables and projection screens._ The Photometer simulates the characteristics of the eye by providing filters simulating the observer's photopic response. The Photometer's entrance pupil and optics are designed to determine the apparent brightness sensed by the observer. The design emphasizes "ruggedness" and "accuracy", consistent with its use in field environment, without re- quiring "re-calibration". The Photometer supplies digital readout as well as an analogue output for use in chart-recording. The system can be used either with its own rechargeable battery or with standard 115 VAC supply. All components are enclosed within 8 1/2" x 8" x 5 3/4" portable case weighing less than 11 pounds, which includes detecting heads, electronics, display, battery, and battery charger. ?1? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 R Next 1 Page(s) In Document Denied Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 04 I 1. BACKGROUND SECTION II INTRODUCTION STAT has designed and built several types of STAT photometers for special applications. As an example, the Model 356 Quick Response Photometer has been designed by for the U. S. Army Signal Corps, for automatic measurement brightness within the range of 10-1 to 10-6 foot lamberts, accuracy of 5% over this range. This instrument has been ous use for 8 years, and was found to be highly reliable. STAT of sky with an in continu- Infrequent calibration (about once per year) has been required. has also manufactured other types of light measuring systems which are described in a separate section at the end of this proposal. In addition to STAT experience in Photometers TAT it also has the unique advantage of being a designer of photo-inter- pretation and photogrammetric equipment. This includes the design and manufacture of light tables, stereo viewers, and rear projection viewers. This combination of capabilities allows to STAT use its understanding of the sponsor's requirements, in the develop- ment of a practical (user-oriented) photometer. 2. GENERAL CONFIGURATION Figures 1,2 & 3 illustrate the configuration of the Advanced Photometer. The photometer includes a small detecting head (1 1/2" diameter by 2 1/2" long), that can be directly attached -4- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT to an eyepiece of a microscope. The flat end of the head is resili- ent coated to allow its placement directly on the surface of a light table, or on the surface of rear projection screen. The optics within the head can be tilted to allow measurement of brightness from +45? to -45?. The operator has the option of locking the tilt head in the center,so that only central brightness is measured. The electronic display and control is built into a fiber glass case. All electronic components are inserted into polyurethane foam within this box. The use of these types of Shock absorbing materials assure the maximum degree of ruggedness. Figure 5 illus- trates the block diagram of the photometer. The detecting head con- tains a P.I.N. silicon diffused photo diode with a built-in integrated- circuit amplifier. The gain of the amplifier is set through precision resistors located at the control panel to realize the measuring ranges of 10, 100, 1,000, 10,000, and 100,000 foot lamberts. The full scale output is 1 volt per one thousand counts. However, when the output reading is 1999, the voltage is increased to 1.999 volts. The display uses highly reliable light emitting diodes with 4-digit readout. However, the most significant digit is the over- range bit allowing maximum reading to 1999. This type of readout allows the reading of 1,000 instead of being limited to 999; further- more, it allows the' overlap of scales, maintaining the ease of read- ability. The detector-amplifier combination has been selected with extremely low drift, where both short time and long time drift are minimized; calibration will not be necessary for at least 3 months of operation. -5- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 NMI 'WINN ? da STAT The basis of the design is to use the minimum number of components, increasing maintainability and reliability. Power drain is minimum to decrease heat dissipation, and to allow the use of the smallest battery possible. The power requirement is either 105-130v,50-60 cps, or built-in battery of 6 volts. The battery supplied with the instrument uses readily available recharge- able silver cadmium sealed cells. A built-in battery charger is provided, which fully charges the battery in less than 10 hours. The photometer simulates the eye-response by using the combination of filters to realize a spectral response which corres- ponds to that of the eye within accuracy of better than 10%. In addition, the optical system simulates the eye by providing an area dependent photometer, containing an iris similar to that of the eye. In this manner, if the standard iris is not filled by the photometer, the brightness measurement is reduced in correspondence to the area of the exit illumination. The photometer enclosed within the case is 8 1/2" long x 8" wide x 5 3/4" high. weight is estimated at 11 pounds. ?6-- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 SECTION III TECHNICAL DISCUSSION Basic Principles of Brightness Measurement The definition of brightness is well established and is consistently stated in many handbooks* - It is the luminous flux emitted from a surface per unit solid angle, per unit area (pro- jected normal to the line of sight). STAT It is also well known that an optical system which magnifies an image does not change brightness (simply due to change of magnifica- tion). Thus, a simple magnifier (or a microscope) does not change the brightness of the image. The only attenuation is usually created by the loss of light within the optics, and losses due to reflection, at the air-to-glass surfaces. This theory that brightness is not effected by changes in magnification is illustrated in an example of a simple lens magnifier: At *Reference: Modern Optical Engineering by Warren J. Smith - Published by McGraw Hill Co - page 199. ?7? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79800873A001600030001-4 41.01 i NNW 004 NNW the above example, a lens is shown to magnify the image. The betihtness at the object is F (flux) A (unit area) 9 (solid angle) It may be noted that the area has increased due to majnification by (M2 Also, the subtended angle 91 has decreased by the same ratio (M2). Consequently, the brightness of the image is not changed. STAT However, any viewer looking into a microscope of high powyr realizes that apparent brightness is appreciably decreased. Thi:; contradiction of theory and practice is caused by the fact that brightness (as normally defined) is not the only criteria to deter:line the visual sensation. Another important criteria is the area of the pupil of the eye being filled with light. Thus, if the licjht beam from the microscope is smaller than the exit pupil of the eye, then a visual attenuation of brightness is observed, in proportion of te reduction of the area of the pupil. An example is illustrated in Figure 4. Typically for 40 power microscope and n (Numerical Aperture of 0.1), the exit pupil = 1.25 millimeters (See Appendix I for calc.;1ations). Thus, in the above example, if the brightness of the illu:-i.nation is 2,000 ft. lamberts, then the normally defined brigness at 40 power is 2,000 x transmission of optics = 1,000 ?8? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79800873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 mit ft. lamberts, for a typical transmission of 50%. However, the apparent brightness is actual brightness x !exit pupil diameter = 1,000 x (1.25) 3 / 2 ) 2 (eye pulil diameter ) = 170 ft. lamberts. STAT It may be concluded from the above that the actual bright- ness (as defined) is 1,000 ft. lamberts while the apparent brightness is only 170 ft. lamberts. Consequently; the apparent brightness must be considered, which includes a factor proportional to the exit pupil's area. simulates the eye diameter of 3 mm angle of 50 of ob measured is very approach utilizes an optical system whi STAT ? It includes an iris which is set the the average of the eye. It also includes a predetermined small servation. In this manner, the brightness being closely the same as that brightness being sensed, by the standard human observer. the image Considerations of Angle Coverage The photometer should measure brightness of the field of without being effected by other parameters, such as (angular field of view). Let us consider the following example: Wide Angle Eyepiece ?9? Narrow Field Eyepiece v s't Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 NA. In the above example, the total energy arriving at the detector from a wide angle lens exceeds by far, the total energy arriving at the narrow field lens, even though the brightness may be the same. It is then necessary to always limit the angle of the detector to a value smaller than the minimum output angle of the microscope. It is preferred to limit that angle to that illuminated uniformly: -For this reason, a practical angle of 5?-6? has been selected. further recognizes that many microscopes may have non-uniformity of illumination, where apparent hot spots are observed in the center of the field. Consequently, the photo- meter head may be pivoted to measure the brightness at different angles of the field. Since this pivoting is extremely simple, the operator may merely pivot the head and take 3 or more readings, to establish brightness uniformity. STAT STAT This requirement for measuring brightness at a small field of view is important, when inspecting the brightness of a rear pro- jection screen. With most screens, the brightness is highly direc- tional. If one determines the brightness over 5?, he will obtain a higher reading than averaging over a 30? field of view. The directionality of brightness on a rear projection screen is certainly an important criteria. In most cases, one average reading is meaningless, since the actual brightness varies by more than 3:1 over that same area. Consequently, has designed the photometer to allow the observer to measure the maximum brightness with 5? subtended angle. He can also tilt the head to observe the apparent brightness at different directions. ?10? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT Another typical use of the Photometer may be to measure the brightness of a high intensity illuminator. Again, it is not sufficient to only take one average reading, since most high intensity illuminators are highly directional. Spectral Calibration A set of filters is provided in front of the photo detector to attenuate the input detector, so that the output of the photo detector corresponds exactly to the sensitivity of the eye. These filters are readily available and have been chosen specifically for the purpose. The filters are sealed within the detector assembly to assure that its characteristics are not changed by humidity, temperature, or contamination of the atmosphere. Prior to delivery of the unit, the unit will be tested with a Monochrometer test set-up; - a graph of the output voltage is provided versus known inputs from the ultra-violet to the infrared. This output will be compared to the known visual response of the "Standard Observer". The sensitivity of the photometer is thus checked directly against the pre-established eye data. Correspondence is better than 10% at any point within the spectrum. The test equipment generating the monochromatic spectra through the full range are calibrated and traceable to the National Bureau of Standards. Both a graph of analogue output, and a recording of the digital outputs will be supplied to assure conformance to the specifications. -11- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 ???? 'Now Digital Meter and Display Reliability and ruggedness of the digital panel meter STAT is the basis for the procurement STAT This is especially designed with integrated circuits, lowest number of parts, and extremely reliable GaAsP light emitting diode display. Power has been minimized to keep heat rise low so that reliability is improved. Quality and maximum usefulness has been assured by using instrument grade components. The important criteria is this meter is also minimum weight (12 ounces), and low power consumption. This saves weight not only in the meter, but also in the battery and battery charger. The meter does not require an inverter since it uses the battery voltage directly. The digital system (without polyurethane enclosure) with- stands 50 G's of impacts since it does not use any bulky neon tubes. The addition of shock absorbing padding and external energy absorbing case assure further vibration and shock absorption, thus realizing almost indestructible performance. The selected dot matrix LED display cannot present an erroneous number even if a diode should fail. Whereas a 7 segment display could lose a segment and change a 9 to a 3. The display provides a crisp brillant shaped character whin is easy to read. ?12? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 ba. Obit Display STAT The digital display is 3 1/2 digits, where readout is available up to 1999. This featureprovides an overlap of a factor of 2 between one scale and the next. This display has a decided advantage over only 3 digit display, since the 3 digit display is limited to 999, and cannot read 1,000. The following table illustrates the maximum range of each scale and the position of the decimal pOint: Specified Ranges Readout Up To Readout 10 19.99 X1 100 199.9 X1 1,000 1999. X1 10,000 19.99 X1,000 100,000 199.9 X1,000 Transporting_pase The transporting case has been selected as a standard molded fiber glass case, made by Skydyne Incorporated. This case has been designed specifically for light-weight, hand-portable equip- ment. These cases are made from molded reinforced shells, using special proprietary formula that make them particularly suitable in hand-portable transit and operational cases. Among these features are: ?13-- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Pak 1. High resistance to impact 2. High resistance to moisture corrosion and weather 3. Extremely high strength to weight ratio 4. Lightweight 5. High thermal shock resistance 6. Inert to most chemicals STAT These type of cases are designed to be used for military applications including meeting the requirements of MIL-T-21200 as well as MIL-T-945, MIL-C-4150 and MIL-T-4734. In order to assure further protection, the electronics and optical components are enclosed within polyurethane foam as shown in Figure 2. For example, the digital meter is encased within a molded polyurethane enclosure of at least 1/2" thickness in all directions. A cutout is provided within the control panel to allow easy observation of the display at an angle of 120? in all directions. Access to the digital meter is easily achieved by removing 4 quick- fastening screws holding the control panel. The batteries and battery charger are also enclosed separ- ately in their own polyurethane cutouts. Quick access is also avail- able through merely removing the control panel. The detecting head has its own separate polyurethane enclosure which closely retains the head. When the cover is closed, the optical head is surrounded by at least 1/2" of polyurethane foam, allowing for very good shock absorbing performance. ?14? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Warm-up STAT The warm-up time is small due to the use of photo diode detection, LED display and low power consumption, thus minimizing the increase of instrument temperature. Warm-up time is less than 5 minutes. No re-calibration is required after warm-up. Re-calibra- tion is recommended every 3 months. Temperature The system is not effected by ambient temperature changes between 50?F and 105?F, and humidities between 20% and 80%. The design allows for a much higher temperature range than that specified. Construction The equipment will be designed with the highest commercial standards of construction, has a highly effective STAT quality control department that controls and supervises all parts and material through the design, reviewing, in-process inspection and final system test. Safety The specified maximum followed automatically in no high voltages in the system. safety precautions are normally instruments. There are STAT The maximum voltage is the input 105-135 volts AC. All electronic systems use Only 5 volt DC, since no nixie tubes or photomultipliers are used. All metal parts will be electrically connected and ground, and leakage currents will be measured in accordance with ANSI Standard C-101-1971 for two wire non-grounded devices, and shall not exceed 0.5 milliamperes. A circuit breaker will be provided (with automatic reset) to provide added safety. -15- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 oaDeclassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Battery STAT The battery selected for this application is a standard rechargeable silver cadmium type having a voltage of 6 volts at 10 ampere hours. This is obtainable for Yardney Electric, or equivalent. The size is 4" x 5" x 1.6", weighing 2.2 pounds. The unit is com- pletely sealed eliminating the possibility of contamination. It is estimated that the total operating time exceeds 12 hours, which exceeds the specifications. The selection of this battery was based on reliability, availability, and performance after extended periods. It is anticipated that the battery will provide years of trouble-free service. Power Supply and Battery Charger The power supply provided with this system converts 115 VAC to 6 volts for normal operation from AC voltage; 105V to 135V - @ 50- 60 cps. The same power supply is also used to charge the battery by a switch on the control panel, which measures the output voltage by tapping a different point of the transformer. The charging system is supplied with current limiting circuits to limit the charging current so not to overheat the battery. The maximum charging time is 10 hours (from almost fully discharged to fully charged Weight The weight of the system is small as possible, but consist- ent with maximum ruggedness and reliability. The following is the weight estimate: %IS VOW ?16? Mkt ' Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Pia Case - 3.2 pounds Polyurethane - 0.8 pounds Padding Digital Meter - 0.8 pounds Batteries - 2.2 pounds 115VAC supply 1.5 pounds (and Battery Charger) Control Panel & Miscellaneous Power Cord and Cables Detecting Head - 0.8 pounds - 0.6 pounds - 0.6 pounds TOTAL - 10.5 pounds STAT Photo Diode and Associated Amplifier The diode-amplifier is enclosed within a shielded assembly to eliminate electronic noise and to assure electronic stability. The diode utilizes planar diffused guard ring construction with oxide passivation, combining excellent performance characteristics with high reliability. This construction technique eliminates the high noise and functional instability inherent in photo diodes. The diode is completely sealed, whose sensitivity is extremely high (approximately 70% quantum efficiency for certain portions of the input illumination). ?17-- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79800873A001600030001-4 =MP STAT The preamplifier consists of a low drift integrating circuit amplifier whose current drift is in the order of 10-9 amperes. Gain is varied within each range by the use of feedback resistors. Con- sequently, the amplifier output is used to develop 1 volt per scale of 1,000 counts; for example, the 10 ft. lambert scale provides 1 volt per 10 ft. lamberts, reading 10.00. Gain selection is achieved by using wire wound precision resistors having a very low thermal coefficient of expansion, and high stability with time and temperature. Accuracy The system design provides an accuracy of better than 2% of full range, over all ranges of photometric measurement. For example, if the range is 10 ft. lamberts, the accuracy is better than 0.2 ft. lamberts (even though the readout can be up to 19.99). To achieve this accuracy, without frequent calibration, the following major design features are supplied: 1. Spectrally compensating filters are supplied which are computer designed, and are guaranteed to have a match to the eye of better than 10%. 2. The linearity of the amplifier and its accuracy is achieved through high negative feedback, with precision resistors having low thermal coefficients, and high stability. The amplifier response is linear to 0.2%. ?18? ' Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79800873A001600030001-4 o& Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 3. The meter used is better than 0.1% accuracy using ultra-stable circuits. 4. The detector is a high stability silicon cell which has a linear range exceeding 7 orders or 10. 5. calibrates the photometer prior to shipment for both spectral and radiation measurement over the full range. The test equipments have their accuracy traceable to the National Bureau of Standards. Detecting Head STAT STAT The detecting head (shown in Figure 3) consists of a lens imaging system, iris aperture, detector and preamplifier. The head can be directly inserted over the eyepiece of a microscope. A self containing assembly centers the detectors within the barrel of the eyepiece. One end of the detecting head can be placed directly on a viewing screen, or a light table. This end is coated with a layer of elastomer to assure that the surface of the glass is not scratched when the photometer is placed on its surface. The optical assembly can be tilted a8 shown in Figure 3, and can be locked in position in a detent in the center, so that only measurement of the center of the field of view can be made. A scale is provided every five degrees to allow settability of the optics to within the range from -45? to +45?. ?19? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 ???? MEN The design head will follow a study by of the sponsor's equipment, to assure that it can be easily utilized. Changes in the detecting head adapter and method of attachment may be necessary to facilitate ease of employment. -20- S TAT STAT ' Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Ii -21- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 111111. I I al NMI Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 / I 1-4 I v`. 1=-"f?-, ??.:)(1-\ 5 E.T - A ' ? 7 ' Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 ? I' _ ' Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 F 4- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 becIssified i; Part - 'Sanitized Copy Approved for Release2012/08/16: CIA-RDP79B00873A001600030061-4 DETECTION HEAD r- ? i L. >?-?DETECTOR FIGURE 5 PHOTOMETER BLOCK DIAGRAM AMPLIFIER .1 15 VAC BATTERY Input CHARGER I ? I POWER SELECTOR BATTERY GAIN SELECTOR - I DISPLAY1 DIGITAL VOLTMETER 1 ANALOGUE NOISE REJECT ION FILTER INTERCONNECTION , POWER SUPPLY (IT Tin DT Pr Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 CABLE .41 STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 APPENDIX I REFERENCE CALCULATION FOR EXIT PUPIL TYPICAL MICROSCOPE Figure 4 illustrates a typical microscope. As shown, (u) is the half angle of the objective. Numerical aperture = gai n(sinu) where nis the index of refraction. Objective Magnification M = u . 0 - VIM Exit diameter of microscope (E) = 2u where fe is focal Mo length of the objective. We can substitute- = 254mm ; where, 254mm is the 10" standard focussing distance of the eye, and Me is the magnification of the eyepiece. Consequently, E = 2u x 254mm MM e o E = 508u ; where, u = numerical aperture, and M is total magnification. The above formula can be used to determine exit diameter in millimeters of a microscope. ?26:- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 MEN SECTION IV WORK STATEMENT The Work Statement is included in the Technical Discussion which is covered in Section III herein. ?27? S TAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 NS MI= MI= SECTION V DELIVERABLE ITEMS 1. Interim and Final Reports STAT will adhere to the provisions of SpecificaSTAT tion Number DB-1001, "Contractual Documentation to be Supplied by Contractors". Monthly and Final Reports will be provided in accord- ance with the modified time schedule proposed herein. Report format and content will be as defined in the referenced specification. In- stallation data requirement as set forth in paragraph 2.2.3 of DB- 1001, in consideration of the proposed 6 month period of performance for development and delivery of the Photometer, will be modified to provide that preliminary data shall be submitted to the Contracting Officer's Technical Representative at 1 1/2 month point and final data at the 4 month point. Since the Photometer is to be an easily carried, man-portable device, the installation data requirements are minimal and therefore, the alternate delivery schedule proposed will be more advantageous to the Government. 2. Equipment Specified manuals, operator and maintenance, will be delivered within 4 months of date of contract award. An Acceptance Test procedure will be submitted by at 4 months withSTAT sponsor approval solicited within 2 weeks thereafter. Upon receipt of sponsor approval of the test procedures, preliminary acceptance ?28? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 is? testing will be accomplished and upon completion, the prototype photometer will be delivered (5 months ARO). The Final Report will be provided within 30 days of equipment delivery. 'N. MEM ?29? S TAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 ,..Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT SECTION VI PROJECT SCHEDULE See Figure A for a Milestone/Time Chart of predicted program progress. Due to short period of performance, only overall costs are defined. For costs, please refer to the Summary of Costs in Section I or the detailed cost breakdown given in Section VIII. ?30-- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 SECTION VII PROGRAM SCHEDULE psi Figure A IMI? lel Pli /IF IMO Mo Milestones ? Drawings (Design) Detail (Drafting) ?-- Approval, Drawings & Artist Concept Preliminary Data /\ Final Data Instruction and //\\ Maintenance Manual Design Reviews .Z\ Manufacture and Assembly Quality Control I- - ? - - - --^, Testing Progress Reports /\ Z\ /\ ,/, " Acceptance Test ? . Procedure ATP Approval by Sponsor , --/\ Preliminary Test- ing at Contractor's -.7\ Facility by Sponsor I t Shipment 4Z. Final Report , ] Contract 1 2 3 4 Award Months -31- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 5 6 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Ise SECTION VIII FINANCIAL CONSIDERATIONS Attached hereto are detail cost proposals covering: a. Design and Production of Prototype Advanced Photometer b. Production of 5 Advanced Photometers C. Production of 10 Advanced Photometers Summary of these costs is as follows: (a) Design & Prototype Advanced Photometer (b) Production - Five Advanced Photometers (c) Production - Ten Advanced Photometers Per Unit Costs: 5 Unit Buy 10 Unit Buy ?3 2. ? STAT STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 R Next 2 Page(s) In Document Denied Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 i_Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 SECTION IX MANAGEMENT PLAN ORGANIZATION STRUCTURE STAT functionally undertakes contractual STAT ,..rformance by assignment of a Program Manager directly designated .1.3. responsible for the performance of the contractual commitment. :7 order to promote necessary personnel resources, the engineering, :echnical and other skills required are assigned directly to the -rogram Manager. This concept provides for a responsive and totally :oordinated team effort. PERSONNEL QUALIFICATION The resumes' of the key individuals to be assigned to the !..-17anced Photometer are included herein. All personnel are presently -railable for the program. The program will be managed by STAT STAT ASSIGNMENT OF PERSONNEL The following personnel will be assigned for the design manufacture of the system; their time will be made available Mr the fulfillment of the various tasks of the program, as required. ?36? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 _Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 I?101 STAT STAT - Project Manager - Mechanical & Optical Engineering - Electrical Engineering - Supervisor of Design & Drafting - Manufacturing - Quality Control In addition to the above personnel, Supervisory Personnel and staff consultants will be utilized for the performance of the design effort. The techniques and project teams developed in programs, such as those mentioned above, will be brought to bear on the pre- sently proposed equipment. -37- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 IMMO URN MANUFACTURING AND ASSEMBLY P ROG RAM ORGANIZATION PROJECT MANAGER STAT STAT REL IAB IL ITY/MA I NTA INAB IL I TY 1 STAT MECH. DESIGN & DRAFTING i 'ELECTRICAL ' ENG INEE RING MECHANICAL Se OP R G STAT -38- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 R Next 7 Page(s) In Document Denied Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 ela MI 010 ISA fie SIM Se *IP MI PIM MI Oil IWO Ml 1,114 Mi SECTION X COMPANY CAPABILITY A brief profile of along with a listing of company facilities follows. It is not contem- STAT STAT plated that any additional facilities or equipment will be required in development or subsequent production of the Photometer. Addition- ally, included are descriptive literature relating to products pre- viously delivered by which are related STAT to the Photometer. -39- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 NINO tal EEO ENE lai Iii 'ENN1 ENE ENE 141 NNE NEE ENE IMO 11a4 NEN. I& IN=N 1114, IMON a ? 11, June 1970 The company facilities are housed in a completely air conditioned and humidity controlled plant of 25,000 square feet, assigned as follows: Engineering 5,000 square feet Office and Administration 3,500 square feet Manufacturing; includes; 16,500 square feet Product Assurance, Purchasing Production Control, and Manu- facturing Engineering Included in the Engineering facilities are: Contents Completely equipped Optical Laboratory Interferometer Test Laboratory Photographic Laboratory and Darkroom Drafting Room (18 boards) Programmable Calculator with Storage Cam-Share Time Sharing Computer Terminal ? Page Machining Facility 1-4 Assembly Facility 5-6 Inspection Equipment 7 Electronic Test Equipment 8 Optical and Calibration 9-10 Laboratory Equipment Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 ?? EMI NEP IMI MACHINING FACILITIES - 6500 SQUARE FEET FULLY AIR CONDITIONED (All Machines are Fully Equipped) SHOP EQUIPMENT LATHES - Ca.acit to 20 1/2" Swin , 54" Between Centers STAT 2 Sebastian Engine Lathes - 14" Swing 1 Lodge and Shipley Lathe - 20 1/2" Swing 1 SAG #49 - Gap Bed Engine Lathe 18" Swing 1 Sheldon Precision Engine Lathe 10" Swing 2 Hardinge High Speed Precision Lathes with Tail Stock Turrets 1 Logan Engine Lathe 10" Swing MILLING MACHINES - Capacity to 48" X 48" X 144" 1 Kearney & Trecker Model 307-S12 Universal 1 Cincinnati Hypro-Planer-Miller 48" X 48" X 144" 1 Van Norman Ram Type #12 1 Van Norman Ram Type #22L 4 Bridgeport Vertical Millers 2 Bridgeport Vertical Millers with Optics 1 #12B Vertical Miller and Profiler - Pratt and Whitney 1 Nichols Tool Room Horizontal with Vertical Head 1 Groton 3U Pantograph Engraver IMII DRILLING MACHINES - Table Size Capacity 36" X 48" MEV IMMR ?=11 Pal NM' 1 (4) Spindle Avery No. 1 VMA Variable Speed Sensitive Drill Press with Super Sensitive Tapping Head 1 Walker-Turner (2) Spindle Drill Press ?1? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 ,...Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 !HT Drilling Machines (Continued) 1 Burgmaster Bench Model - (6) Spindle Auto-Indexing Turret and Tapping Machine 3 Delta Single Spindle Drill Presses 1 Caser F35 Model 915 Radial Drill Press 1 Delta Radial Drill Press 1 Walker-Turner Radial Drill Press 1 Layout and Drilling Machine STAT 1 Dumore Sensitive Drill Press JIG BORERS - Capacity to 11" X 24" 1 Moore Model Number 3 Precision Jig Borer 2 Linley Jig Borers INDEXING EQUIPMENT 1 Moore 10" Ultra-Precise Rotary Table (2 sec. total error) 1 Rotary table with locating pilots and 12" Auxiliary Table - Six second accuracy 2 Hartford Super Spacers 5", 10" 1 16" 1 12" 1 9" 2 Rotary Table Rotary Table Rotary Table 10" Pi-Dex Rotary Tables SURFACE GRINDING MACHINES - Capacity to 14" X 48" 1 G&L Surface Grinder Model Number 660 - 14" X 48" (.0001 Overall Accuracy) 1 Jones-Shipman 6" X 18" Surface Grinder ?2? STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 JI/A1 14.4 MEM MIN MIN gal 1441 OEM MEI 11?4 .51 4.4 414 .54 414 .54 441 "I 0?111 4E1E4 44 1 IOW " ???11 44 1 SAWING AND CUTOFF MACHINES 1 DoA11 Vertical Band Saw 16" 1 DoAll Vertical Band Saw 14" 1 Kalamazoo Band Cutoff Saw 1 Stone Abrasive 5" diameter Cutoff Machine 1 Power Hack Saw Sheet Metal Equipment PUNCH PRESSES - Capacity, 35 Ton Piercing - 70 Ton F2Errlina 1 Wales Strippit 415A With Duplicator Attachments 1 10 Ton, 24" Throat Whitney-Jensen Punch Press 1 75 Ton, Dake, Hydraulic Press 1 Wabash Heated Platen Hydraulic Press - 30 Ton 1 #12 Famco, Foot Press 1 Dake Mandress Press BRAKES - Capacity to 8' Length 1 96" - 36 Ton, Chicago Press Brake - Counterbalanced for Whistler Dies 1 60" - 12 Gage Whitney-Jensen Box Hand Brake 1 24" - Di-Acro Box Hand Brake 1 2" - Post Multi-Bender Model 5HDSB 1 #2 - Di-Acro Bender 1 Pexto Model 416E Slip Roll Former 1 1" X 12" Diameter Di-Acro Hand Roller SHEARING EQUIPMENT - Capacity to 6' Length_ 1/8" Thick Steel 1 6' Wysong Power Shear 14 Ga. 1 3' Pexto No. 187 Foot Shear 16 Ga. 1 12" Di-Acro Hand Shear Model #3, 16 Ga. 1 6" X 6" Di-Acro Hand Notcher ?3? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT Sad Mal WELDING EQUIPMENT - (Aluminum, Alloy and Stainless Steel) 1 300 Amp. P&H A.C. Heliarc Welder 1 Airco Welding and Cutting Outfit (Oxy-Acetylene) 1 Automatic Gas Welding Unit (Smith Aircraft) 1 Peer Spot Welder (Welding Personnel certified per MIL-T-5021C) MISCELLANEOUS 1 Groton #256 Cutter Grinder 1 Hammond (No Dust Grinder) Model ND-10 1 Hi-Speed Dumore Grinder 1 Stanley Pedestal Grinder-Model 286B 1 Delta Carbide Pedestal Tool Grinder 1 #27A Wyco Portable Grinder 1 All American Filing Machine 1 6" Hammond Belt Sander 1 Porter Cable Vibrating Sander 2 Polishing Bench Motors 1 Chromemaster Plating Unit 1 Temco Heat Treating Oven 1 Westinghouse Industrial Compressor 1 Model RA-2 Rollabrader Tumbling Barrel SHOP INSPECTION TOOLS Granite Surface Plates and Surface Plate Laycut and Inspection Tools for Shop Use, Maintained on Scheduled Calibration per MIL-I-45208 and MIL-C-45662 ?4? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 MEI Of WWI lel MI1 Nil PIM DIEM 1114 04D ION 001 MINN NMI env STAT ASSEMBLY FACILITIES - 7000 SQUARE FEET FULLY AIR CONDITIONED INCLUDES: SQUARE FEET General Mechanical Assembly Area 4600 Electrical Assembly Area 600 White Room (Federal Class 100) Assembly Area 200 Gray Lab (Constant Positive Pressure) Assembly Area 600 Project Labs Assembly Area 1000 MECHANICAL ASSEMBLY AREA: Portable Granite Surface Plates up to 6' X 8' for setup, alignment and pinning of assemblies 200 Lineal Feet of Assembly Bench Area Clausing Variable Speed Drill Press Mobile Delta Radial Drilling and Pinning Machine All American Vibrating Test Table - Capacity: 100 pounds g 10 g. 15" X 18" Grueneberg 27 Cubic Feet - Temperature Controlled Environ- mental Test Oven 50 and 400 cycle motor generator units All Peripheral Equipment required for precision mechanical assembly ELECTRICAL ASSEMBLY AREA: 100 Lineal feet of specially illuminated electrical assembly benches Completely Equipped Electronic Test Facility Complete Electronic Assembly Hand Tools (Supplied under Tool Cribe Control) All Peripheral Wiring Equipment Required PROJECT LABORATORIES: All equipped with assembly work stations, concentrated lighting, exhaust systems Declassified in in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT ASSEMBLY FACILITIES Continued "GRAY LABORATORY" Maintained under constant positive pressure Special lighting, exhaust systems, power 110-220 VAC Single and Three Phase Vinyl Wall Panels, Ceilings, Floors "WHITE ROOM" Federal Class Number 100 - Laminar Flow Laboratory Temperature maintained at 68? + .5? Humidity maintained at 50% ? 5% ?6? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 1?4 STAT INSPECTION EQUIPMENT Pratt & Whitney Supermicrometer Model B Gaertner Tool Makers Microscope Metro-Surf II, Surface Finish Indicator Wilson Superficial Rockwell Hardness Tester Van Keuren 6" and 12" Optical Flats with Reflex Viewers Brown & Sharpe 9" Hite Set With 9" Base Brown & Sharpe 36" Super Electronic Hite Check Do-All Electronic Trans-Check Federal Electro-Check Model 230P-123 Veeko-Probe Electro Sensing Device Taft-Pierce 12" Cylindrical Square & Transfer Stand Pratt & Whitney and Fonda 81 Pc. Gage Block Sets Solid Steel Squares to 24" Micrometers from 1" to 12" Steel and Granite Parallels from 1/2 X 1 X 6 to 1 1/2 X 3 X 18" Brown & Sharpe and Starrett Vernier Height Gages Vernier Calipers to 24" Vernier and Micrometer Depth Gages Mahr Bore Gages from .280" to 6" w/.000050 Indicator 4' X 6' and 4' X 8' Granite Surface Plates Matched Angle Plates and Vee Blocks for Precision Inspection Torque Tools - Torque Watch, Torque Screwdrivers, Dynamometers Thread and Gear Checking Wires Plug and Ring Thread Gages Cylindrical Plug Gages Mechanical Dial Indicators .001" and .0001" Laser Interferometer Lead Screw and Scale ChecSTAT 133 Co-ordinate Inspection Machine -7- Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 ma ma red ELECTRONIC TEST EQUIPMENT 10/ WWI EMI IMO MU MEM OSA MEV elm (On Scheduled Calibration_per MIL-R-45662) Tektronix Model 422 Oscilloscope Tektronix Model 453 Oscilloscope Tektronix Model 564 Oscilloscope Tektronix Model 531 Oscilloscope Tektronix Model 543 Oscilloscope Tektronix Plug In Units, Models CA; D; M; 3A6 and 3B4 Tektronix Scope Camera Model C-27 Consolidated Electro-Dynamics Recording Oscillograph, Type 5-124 Hewlett-Packard, Model 500B, Frequency Meter Hewlett-Packard, Model 521A, Counter Ballantine Precision Calibrator, Model 420 Ballantine V.T. Voltmeter, Model 3000 Ballantine Sensitive D.C. Volt/Ammeter, Model 365 General Radio Impedance Bridge, Type 1650A General Radio Decade Voltage Divider, Type 1454A General Radio Resistance Decade, Type 1432M General Radio Pulse Generator, Type 1217C Hewlett-Packard Variable Oscillators Federal Signal Generator 8 to 330 MC D.C. Power supplies to 2500 volts Simpson Volt-ohm-milliammeter, Type 261 R.C.A. D.C. Micro Ammeter, Vacuum Tube and R.C.A. V.T.V.M. Weston D.C. Micro Ammeters, Model 931 Miscellaneous Laboratory Equipment ?8? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 04 OD IMP IMO 4,o IMP MLA *MI STAT OPTICAL AND CALIBRATION LABORATORY EQUIPMENT Granite Surface Optical Table, 4 foot X 15 foot, vibra- tion mounted - 7 ton mass Macbeth-Ansco Electronic Densitometer, Model 12A Leitz Labolux Research Microscope with microdensitometer attachment Three Gaertner Precision Optical Benches, Model L-360NA Davidson Optromics Coordinate Autocollimator, Model D-638, measures angles to 1/2 second of arc and other collimators 15" focal length Hilger Watt TA-3 Electronic Autocollimator, Optical Square and alignment mirror Hilger Watt Microptic .1 second autocollimator Kollmorgan Dual Axis Autocollimator Sub-Second Positioner-Temperature compensSTAT angle measuring device - measures angles to 0.1 second of arc Two Axis Interferometer - 1 micron accuracy with grazing angle capabilities Leeds and Northrup Portable Temperature Potentiometer, Model 8693 Gurley Transit Edgerton Sensitometer Prichard Photometer, Spectra brightness meter, Photovolt Photometer, Model 520M Several standard Light Sources Light Meters: SEI Visual Photometer, Gossen Low Light Level and Color Temperature Nikon - 12" Profile Projector ?9? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT OPTICAL AND CALIBRATION LABORATORY EQUIPMENT (Continued) Cameras: Leica, Polaroid, Graphic, Fastax, 16,000 frames per second, Bolex 16mm, Polaroid Scope Camera, and solenoid Several Bausch and Lomb Optical Bench Microscopes One Two Axis Beck Measuring Microscope One.Gaertner Measuring Microscope full assortment of microscope eyepiece and objectives including filar micrometer Stereo Zoom Microscope A.O. Spencer Microtome Light Sources: Zirconium arc, xenon, helium, mercury, quartz, iodine and monochromatic sources Large Collection of Lenses: Includes condensers, achromats, mirror objectives, prisms, filters, photographic objectives, oculars poraboloids, tillyer ophtalmic trial set, optical flats up to 8" diameter 1/20 wave accuracy, - Van Keuren reflex housing and optical inspection interferometer calibrated density wedges Resolution Charts and Test Patterns for lens evaluation - to 800 lines per mm resolution Continuous Coherent Laser Light Sources, Mercury Hg 198 Sources Complete Photographic Darkroom; Slide Projectors, microfilm viewers and Omega Enlarger Kreonite sinks with built-in water temperature control and water filtering system - Leedal Autotemperature control photo processing unit Image Splitting Eyepiece -10? Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 !at OW awl ow eve QUICK RESPONSE PHOTOMETER with Self Calibrating and Check Out Model 356 Automatic On-Off Unit Model 356, PHOTOMETER, is a highly sensitive instrument for measuring light levels between the ranges of 10-8 to 10-1 foot lamberts or higher. The accuracy of the in- strument is 5 % within the total range. Ten ranges of measurements are provided: RANGE 1st 10.6 2nd 3 x 10-6 3rd 10 4th 3 x 10' 5th 10-4 6th 3 x 10-4 7th 104 8th 3 x 104 9th 10' 10th 3 x 10' FOOT LAMBERTS to 3 x 10-6 to 10-5 to 3 x 10' to 10-4 to 3 x 10-4 to 1 0-3 tos 3 x 10-3 to 10' to 3 x 10-2 to 10' The output of the unit may be applied to recorders, indicating meters, or integrating photometric systems. The field of view may be selected by changing objective lenses. (Maximum wide field: 1350.) (Minimum narrow field: 1/20) The light level being measured automatically selects the correct operating range with- out any other influence. Consequently, a high degree of accuracy is maintained. Bulletin No. 356 ..J STAT OPTICAL - MECHANICAL - ELECTRONIC - RESEARCH AND DEVELOPMENT - PRODUCTION - MANUFACTURING - SPECIAL CAMERAS - PHOTOMETRIC DEVICES - OPTICAL TACHOMETERS - RAPID FILM PROCESSORS - PROJECTORS - OPTICAL TRACKERS - STEREO VIEWERS - SATELLITE DETECTORS - MEASURING INTERFEROMETERS - STEREO COMPARATORS - NEGATIVE TO POSITIVE FILM VIEWERS - ANGULAR MEASURING DEVICES - FIBER OPTICS APPLICATIONS Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 FEATURES ? Automatic on-off shutter system for pro- tecting the sensing element from possi- ble damage due to the sunlight or other very bright objects. ? Automatic range selection system for maximum accuracy. ? Complete automatic provision available for readout into an integrating system or paper recorder. ? Internally located light source for cali- bration and checkout. ? Filter holder for spectrum analysis. ? Interchangeable photomultipliers with 5-4, S-5, or 5-8 Spectral response. INTEGRATING OR AUXILIARY EQUIPMENT, STA Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 JI INS I, /NM Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA2RDP79B00873A001600030001-4 - J El c IC PI STAT MODEL 671 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 "AUTO-PULSE" PHOTOELECTRIC MICROSCOPE Model 671 introduces the "Auto-Pulse" Photo- electric Microscope for the inspection of grids or scales "on-the-fly." Its purpose is to eliminate the time consuming operation of setting and measuring lines manually, whereby errors resulting from oper- ator fatigue are causes for inconsistent performance. As many as 60 lines per second can be inspected automatically, at a maximum continuous speed of 0.1 inch per second. COMPARISON OF MEASURING MICROSCOPES The "Auto-Pulse" microscope is designed to accurately measure the distance between "grid lines" on a scale, fiducials, or images on a photograph by reflection or transmission. Present systems use microscopes with reticles to observe the scale's image in which the oper- ator. aligns the scale's image to the reticle and reads the coordinates of a measuring machine. This is a time consuming and tiring process, and at optimum is de- pendent on the operator who must stop precisely and repeatedly at each line. An alternative to the above is to utilize a photoelectric microscope where the operator views an oscilloscope to observe the deviation of the grid line or point from the optical axis after which each line is then positio-ned to individually and measured. The basic disadvantage of starting and stopping is re- quired in this scheme. The greatest distinction of the "Auto-Pulse" microscope is that measurements are done "on-the-fly." Stopping at each line is not required. The instant the center of the image is passed through the optical axis, a pulse actuates the readout in which the or "Y" coordinates are automatically stored for display or printout. An ideal measuring system for use with the micro- scope is the laser interferometer, Model 437L-512, with automatic temperature pressure and humidity compensation. The microscope-interfer- ometer system can achieve accuracies of better than ?1/4 micron (0.00001") . The microscope may also be used on machines equipped with encoders, or digitized scales, with the added capabilities of remote-input and readout. FEATURES The Photoelectric Microscope possesses unique features, most important for the making of accurate measure- ments: I The coordinates of the exact center of the line or point are obtained. This has a distinct advantage over the measurement from an edge. It is not unusual to have lines of slightly unequal thickness, in which a large error will exist if the edge of the line is mea- sured instead of the center. The edge contrast or gradient does not enter into the accuracy of mea- surement as it exists with conventional measurement techniques. 2 The measurement is independent of line contrast or light level, since illumination only at the "center" is measured. Signal level adjustment control is in- corporated to achieve optimum detection. Opaque lines on glass, steel or clear lines on glass scales may be measured with equal accuracies. 3 The system contains a noise rejection gate whereby the microscope cannot trigger on spurious noise. Thus, if disturbances are present, they are prevented from actuating the mensuration system, unless their magnitude exceeds a level equivalent to that of the line or point being measured. 4 The system contains an automatic reset feature. It allows for the first pulse to establish "zero" onto a readout counter or "zero" reference. The second, third, etc. lines are read automatically without zero- ing. 5 The system design provides accurate measurements independent of direction of travel (left to right, or right to left) . The accuracy of the system is also independent of the speed of travel from zero to 0.1 inch/second. GENERAL DESCRIPTION The Photoelectric Microscope provides a pulse output as its optical axis crosses the center point of a grid line or other scale mark. The pulse is used to actuate the readout system for automatic display. Since the pulses are produced "on-the-fly," there are no interruptions in the measuring operation, and readout-or printout is completely automatic when used with an Laser Interferometer System. The microscope housing contains the entire optical system along with an internal light source and a view- ing eyepiece. Photo detectors and associated circuits are incorporated in the top portion of the microscope housing. The base of the microscope has provision to mount a corner cube reflector, when a laser interferom- eter is used for measurement. The power supply for the internal light source along with additional pulse forming circuits are mounted in a separate cabinet. ri S TAT I STAT STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 3 I Rh VERFD Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 fl PHOTO DET PHOTO DET 2 FOCUSING FOCUSING LENS ? SLIT LENS BEAM SPLITTER BEAM SPLITTER OBJECTIVE LENS AU RETICLE CONDENSER LENS SCALE Figure 1. OPTICAL SYSTEM EYEPIECE LIGHT SOURCE OPTICAL SYSTEM DESCRIPTION Figure 1. A high intensity light source and condensing lens provide the necessary illumination for the optical system. A beam splitter, No. 1, deflects the beam of light onto the object plane. The microscope is provided with interchangeable objective lenses to accommodate various field coverages. The imagery, once it has reached the objective lens, is focused through the beam splitter and the aperture onto a silvered prism. In turn, the silvered prism reflects one- half of the image area to photodetector No. 1 through a focusing lens and the other half of the image area, to photo detector No. 2, similarly through another focusing lens. In this manner, a signal is produced at each photo- detector corresponding to each side of each optical channel; that signal is proportional to the average brightness of the image. Beam splitter. No. 2 is placed in the optical path to partially reflect the image to the viewing eyepiece for observation. The aperture's slit is approximately .020 inches wide. The full line-width of the image at the aperture plane must be less than the width of the slit itself. At the same time, it must be wide enough to provide a signal of sufficient amplitude to override the noise rejection level of the electronic circuitry. The line-width at the aperture plane is the product of the line-width on the scale by the objective lens magnification factor. DESCRIPTION OF ELECTRONICS Figure 2 shows representative waveforms of the elec- tronic system. The output of each photo detector is applied to a difference-amplifier, which provides a com- posite signal equal to the difference of the two photo detector signals (PD #1 and PD # 2) . The signal is then fed to a Schmitt Trigger circuit. The composite signal is an "S" curve with a zero crossover at its center point which corresponds to the center of the grid line. The Schmitt Trigger circuit provides a pulse at the zero crossover through a gate circuit which is opened by the signal as it approaches its negative peak. This circuit prevents spurious noise pulses from triggering the system and provides a pulse only when the high level composite signal is present. The pulse generator and pulse shaper provide the re- quired output pulse necessary to activate the readout system. When the"Auto-Pulse"microscope is used with the Laser Interferometer, actuation of a reset-switch acces- sible on the front panel of the microscope power supply automatically provides a reset pulse for the interferom- eter readout system. At this point, the printer prints out 00.000000. As each line is scanned in succession, readout of interferometric measurement is printed out. The auto pulse may also be adapted to digitized scales or encoder- leadscrew type of measuring machines. It may also be used as an inspection tool in many other types of measuring instruments or as go-no-go gauge types of operation. OPTIONAL ACCESSORIES 1?Skip-Counter?An optional accessory can be provided to sample discrete lines of equal spacing. (Example: every 10th line or every 100th line, etc.) A counter provided with the instrument allows the selection of readout at any one of the number of lines as selected by a three digit thumbswitch, which can be set to read between 1 and 999; the advantage of this feature may be illustrated when a closely spaced grating is being inspected. The number of measure- ments may be too voluminous, and the readout speed may necessarily be too slow due to the limitations of the printer. Using the skip-counter, the operator may then sample the scale, and expect rapid measurements without sacrificing accuracy. 2?Auto-Collimating Accessory?The Photoelec- tric Microscope can be used to provide a pulse every time a mirror is positioned perpendicular to the optical axis of the microscope. This optional feature provides a collimating lens in lieu of the microscope objective. In addition, auxiliary optics and a slit are inserted in front of the source of illumination. Consequently, a collimated image of the illuminated slit is reflected by the mirror back onto the microscope slit for photoelectric detection. The sensitivity and repeatability of the instrument is better than four seconds of arc. The maximum range is six feet between the auto-collimator and the mirror. The full advantage of this option can be realized in the checkout of moving rotary tables, when either one ADVANCING GRID LINE"' READ PULSE TRIGGERED GATE CLOSES tigure 2. PHOTOELECTRIC MICROSCOPE ?WAVESHAPE Declassified in Part - Sanitized Copy Approved for Release 2912/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 mirror or a multiface mirror polygon is placed on the rotating member. In this application, a pulse is gener- ated when the facets of the mirror block are perpen- dicular to the axis of the microscope. 3?Power Supply Cabinet?The cabinet can be sup- plied as an accessory. SPECIFICATIONS Built-In Illuminator High brightness, 18 watt illuminator is supplied with condensing optics for high contrast. Heat deflectors and fixed housing minimize temperature rise of micro- scope housing. Optional fiber optics illuminator is supplied on special order. Slit Reticle .020" x .125" is normally supplied. Interchangeable slit widths from .030" to .005" are available on special order. Objective Lenses The objective lenses are interchangeable and can be focused for optimum performance. The following ob- jectives can be supplied: 50X (Use with .0001" to .0005" line widths) 20X (Use with .0003" to .001" line widths) 10X (Use with .0006" to .002" line widths) One Objective, 10X is supplied with the microscope. 5X (Use with .001" to .004" line widths) 3X (Use with .002" to .006" line widths) lx (Use with .005" to .020" line widths) Adjustment of Background Noise Rejection Circuits and Signal Levels Provisions are made to allow adjustment of noise rejec- tion cireuit to eliminate spurious outputs or background noise caused by dirt, dust and imperfections in the part to be measured. Electronic Chassis A standard 19" rack mounting, 7" x 14" deep. It con- tains regulated power supply for lamp, low voltage amplifiers for the electronic system, and plug-in solid state logic and amplifier circuits. Output Signals 1?Readout Command Pulse?Negative going from zero to ?15 volts, 10 microseconds duration. The leading edge occurs at the exact center of the measured line. 2?Reset Pulse?The first scale pulse may be se- lected to be a reset pulse (to zero a counter) by depress- ing the "reset" switch on the front panel on the Remote Reset Switch. 3?Pre-amplifier Output Signal?This is an elec- tronic signal supplied as the difference between the two detectors. It can be supplied to a scope or meter for visual setting of zero. Reset Switch Push-button pendant switch is supplied (15 feet long) , to allow resetting of the system. The first scale pulse after switch is energized, will reset the readout counter to zero. Maximum Speed of Travel 0.1 inch per second. Cable Length Standard length of cable between microscope and con- sole is 12 feet. Accuracy The accurac with micron of the shotoelectric microscope when used Laser Interferometer is -?3/4. microinc es . The errors introduced by the measuring machines and environment must be com- bined with the errors introduced by the photoelectric microscope to obtain total system errors. STAT n STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 R Next 1 Page(s) In Document Denied Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT ST TRANSISTORIZED OPTICAL FREQUENCY INDICATOR WITH "BEAM-OF-LIGHT" SENSOR Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 RE, Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT I I Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 ITRANSISTORIZED OPTICAL FREQUENCY INDICATOR FEATURES WITH "BEAM-OF-LIGHT" SENSOR .11 Measures shaft or disc rotation of all possible rotating machines I. Accurately senses intricate vibrations of test objects to meet new complex-wave environmental test requirements Senses frequency of vibration and relative amplitudes from 0 to 100 kc MI Multiple lines or tapes permit accurate low speed rpm tests ? Seven meter ranges from 10 cps to 100 kc III Simple set-up, absence of physical coupling, speeds testing, increases accuracy 111 Completely portable for field, production line or test lab ? Both sensor and frequency meter use flashlight cell power 11111 Optical sensor available separately for basic laboratory. use APPLICATIONS The Transistor- ized Optical Frequency Indicator is one of the most versatile measur- ,ng instruments yet devised for use in iaboratories research and development, industry and main- tenance operations. Because of the-complete absence of mechani- cal linkage between the tachom- eter probe 'and the device being measured for -rotational speed, or amplitude and speed of motion, torque or damping are never intro- duced into the readout. A few of the many applications of the in- strument are illustrated at right. Prec'se measurement of rotational speeds of motor-generators. -fr Declassified in Part - Sanitized Copy Approved for Release 2012/08/16 : CIA-RDP79B00873A001600030001-4 Production line checkout and inspection test on tape recorders, phono turn- tables, etc. Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 r-1 1.= r-7 STAT DESCRIPTION The Transistorized Optical Frequency Indicator is a portable, self-contained system for measuring rotationai .shaft speeds in rpm, or vibrational frequencies in cps. The system utilizes the Model 219A Transistorized Optical Probe, a "beam-of-light" detection sensor, to sense the contrast between a light line and dark area (or vice versa) on the object in motion. The observed contrast, in the form of pulse responses, is read out on the Model 220FM Frequency Meter on a seven range scale from 10 cps to 100 kc. No torque or damping is introduced since there is no mechanical linkage between the probe and the object under test, and an accuracy of 2% of full scale is easily achieved. STAT Analysis of servo motor speed and control. Complex waveform vibration and amplitude analysis. Typical waveform on oscilloscope, when used with the 219A Probe, showing com- ponents of mechanical vibration. Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 I I Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 ITRANSISTORIZED OPTICAL FREQUENCY INDICATOR WITH "BEAM-OF-LIGHT" SENSOR OPERATION With the probe connected to the meter, the optical head is positioned steadily and aimed directly at the object under test at a distance of about 3/8". The constant light source in the optical head, powered by flashlight batteries, is reflected back to the phototransistor in the head, in accordance with the contrast of white and dark lines painted or taped on the moving shaft or object. 'Minimum detectable line is about 0.01" wide, 1/2" long, but careful set-up and alignment will permit the use of a smaller detecting surface. High ambient light environment will not affect accuracy or sensor sensitivity. Regardless of waveshape derived in pulse response, accuracy of meter reading is ?1% d.uty cycle. Rotational speed or frequency is read directly on the meter. Probe output can also be fed directly into an oscilloscope for relative vibration amplitude measurements. SPECIFICATIONS Optical Frequency Indicator System Rotational Speed Range All Possible Rotating Machines (Note Frequency Response) Frequency Range 10 cps to 100 kc 7 Scale Ranges 0-100 cps; 100-300 cps; 300 cps to 1 kc; 1 kc to 3 kc; 3 kc to 10 kc; 10 kc to 30 kc; 30 kc to 100 kc. , Accuracy ?2% of full scale Transistorized Optical Probe Model 219A Input Dark line, light background, reflected light (or vice versa) Length 143/4" with gooseneck Width 13/8" diameter Weight 1 lb. with batteries Transistorized Frequency Meter Model 220FM Size x 53/4" x 31/2" Weight 5 lbs. Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 LI STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 tt,f4g4. 0 0 0 0 glattr4k PHOTOINTERPRETATION CENTER SERIES 05500 MODULAR PHOTOINTERPRETATION CENTER (PIC) 0 ? OF P I DATA BETWEEN EVENTS AND USERS." "DESIGNED TO ASSURE RAPID AND EFFECTIVE FLOW 1070-71 CATALOG ti Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 STAT Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 0 0 0 0 AUTOMATIC SOLUTIONS TO 0 0 0 ? Offset Aiming Point Coordinates El Target Acquisition 0 ? Photogrammetric Tasks II Chart Annotations ?and Photo Interpretation/Analysis tasks over the widest possible Range of Imagery, with accuracy to 8 parts per 100,000 per foot of film ... sub-micron resolution. Quick Delivery?Fully Tested Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 TYPICAL PACKAGE CONFIGURATIONS n Model 05500 Model 05000 ci Eli 01 Model 05010 A Basic Film Table with Traveling X-Y Carriage, B & L Zoom 70 or similar Microscopes?Mechanical Dial Read- out?a ready-to-use, manual drive, economical work station. ci ci Ch] ci Our best and most complete P I station. Factory 'installed modules include electronically coupled microscope carriage, automatic logic console with I/O keyboard, and control tapes for automatically solving linear and geo/ relative problems. ?A turn-key system ? Our Intermediate System?contains only those modules required for inter- face to all existing computers. May be ganged for multi-user or time-share installation. Computer Interface ser- vice provided upon request. NOTE: In addition to programs supplied with the 65610, Programming Services are avail- able for any special Metrics problems involv- ing Photogrammetry, Photo Interpretation, Car- tographic Control & Annotation, Infra Red, SLR, Radar, etc., plus translations into Ger- man, French, and certain other languages. Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 1 Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4 MODULES LIST FOR EXPANDING THE UTILITY OF THE BASIC 65500 SYSTEM- Model 05070 Motorized Film Drive Packages. Specify front spools only, or both front and rear spools. Model 05550 Dual Axis Electronic Encoders with Digital Display. Converts 65500 into 65600 when equipped with keyboards. Costs to interface with existing computer quoted upon request. Model 05570 Artwork Logic Control Module, En- coders & Keyboard to retrofit 65550 into 65610 system. (Equiva- lent to 8K-16 Bit Word Computer.) Model 05580 Teletype Keyboard. NOTE: All Modules may be installed by the user. Inter- facing to existing Computers requires to perform installation and check-out. SPECIFICATION: 041 ? 41 r41. lID FB LABORATORY... The 65500 Series of Photointer- pretation equipment is available in either standard commercial grade for fixed base use, or in Mil. Spec.grade for field use. OR FIELD Declassified in Part - Sanitized Copy Approved for Release 2012/08/16: CIA-RDP79B00873A001600030001-4