(SANITIZED) FROM [ ] (SANITIZED)

• Document Type: CREST
• Collection: NGA Records (Formerly NIMA)
• Document Number (FOIA) /ESDN (CREST): CIA-RDP78B04770A001500070020-8
• Release Decision: RIPPUB
• Original Classification: K
• Document Page Count: 1
• Document Creation Date: December 28, 2016
• Document Release Date: September 21, 2006
• Sequence Number: 20
• Publication Date: January 14, 1964
• Content Type: LETTER

Approved For Release 2006/09/21: CIA-RDP78B04770A00150
January 14, 19b4
re: easuring Techniques,
0
is
Bob, when I was in your oliice last Decc.,ocr, weLais-?
cussed briefly some measuring t,ecinniques. You men--
ticned you had s?eceived a proposal to use some
me,:hanical property of quartz for submicron measure-
ment of distance, I think it was, 'V'r'e didn't really
have a chance to finish our conversation and I can't
recall the details. .,As I remember, it sounded as though
it might have some problea._s associated 1:'ith obtaining
glass of sufficient unifor..-iity, but she idea was
perhaps promising enough to look into.
e.hile your thinking about that, you might consider
another possibility, as proposed a_dcvic^ to,
I think, to eve~cp a device to make sub--
micron measurements. They plan to use a light beam
of a Laser and since it 1-, coherent t :hey can count
light waves. They didn't Jo into details, ut they
think they can e count cf microns.
I'm sure oula `vo you t e details
if you as~ce m, G;:,. ~.__r:k you s.,; uld consider
it.
:ri the other hand, sine, ie already
rr ell into a program to n 1e_-3+_ ocunt
of 0.25 microns, is it 1'r'C_'"vh whil investinc: in
other - '
ir?V;s S;~i ;:.tiVG 1'; Ori:a
__ 3
F
an advantage of .puny c; :. ~~__ _c r1C?G- years of ~experienc e
in measuring and try cy _av : hi ply develo oa ; sctror.ics
which are ~stsblc and aepcr.'__abl , The elcctrcriics ore
(probably (a o of the bat ~:.l Perhaps ether t? erk should
eri;y be under taken only f it shoivs- of
c ,
considerably cheaper in it:, application production
rnachir. ? ' ^ airs ,he two signif -canoe features
of the syste.:_: i.e.non-aueiguity of
count any. no limitation of the traverse velocity.
These are some thoughts I had on the subject. I
can't answer the question I posed above, but I would
be glad to discuss it rV ith you next time w e ;et
)DP-Du
p
STAT
STAT
Approved For Release 2006/09/21: CIA-RDP78B04770A001500070020-8